Jitter, Noise, and Timing Analysis

Understanding timing jitter has become a mandatory part of high-speed communications system design. Many of today’s serial data standards require extensive jitter compliance tests.  Whether you need a quick clock jitter measurement or a thorough analysis of a BER performance problem, Tektronix' comprehensive test instrumentation portfolio enables you to meet your design goals and compliance requirements – fast.

  • DPOJET Jitter & Timing Analysis for Real-Time Oscilloscopes: DPOJET enables customers to debug and characterize timing, jitter, and noise in computer, mobile, and data communication system designs. Sources of jitter and noise can be determined through measurement results and interactive plots along with other debug features including error location analysis, stop on measurement failure, and data logging.
  • TekScope AnywhereTM Waveform Analysis:  Brings the power of the scope analysis environment to the PC.  Users now have the flexibility to perform timing, eye, and jitter analysis outside the lab.  Setups and waveform data from Tektronix DPO/MSO5000, DPO7000C, and DPO/MSO70000C/D/DX Series oscilloscopes can quickly be shared between team members and remote sites resulting in improved efficiency

Understanding the impact of reference clock jitter on data jitter - and techniques for measurement and analysis

Electronic Products & Technology magazine

BUJ Jitter Measurements Using Tektronix Instrumentation

The Basics of Serial Data Compliance and Validation Measurements

This primer is designed to help you understand the common aspects of serial data transmission and to explain the analog and digital measurement requirements that apply to these emerging serial technologies

Understanding and Characterizing Timing Jitter Primer

Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. This paper focuses primarily on jitter in electrical systems.

Clock Recovery’s Impact on Test and Measurement

This application note discusses the outside influences that can disturb the relationship between data and how it is clocked.

Jitter Fact Sheet

Whether you need a quick clock jitter measurement or a thorough analysis of a BER performance problem, Tektronix oscilloscopes and integrated software tools deliver. You can rapidly solve problems and meet your design goals and compliance requirements.

Characterize Phase-Locked Loop Systems Using Real Time Oscilloscopes

This application note introduces the operating principles of the PLL as well as describes how to accomplish typical PLL characterization tests using a real-time oscilloscope.

Controlled Jitter Generation for Jitter Tolerance and Jitter Transfer Testing

This application note explores how (and how not) to generate controlled jitter. It also reviews a few cases where you might use a jittered source, such as Jitter Tolerance testing, Jitter Transfer testing, Test Equipment Correlation, and in each case, which aspects of jitter generation might...

Dual-Dirac+ Scope Histograms and BERTScan Measurements

Introduction to Dual-Dirac.

Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester

Using Six Sigma for citical insight.


Knowledge Series Webinar: Management of Jitter & Noise for Lower BER on High Speed PHY's

Next generation standards like PCI Express 4.0 and 100Gb Ethernet are exploring the need to include noise analysis, in addition to timing analysis, as unit interval (UI) margins continue to shrink. View this webinar to learn more about the importance of comprehensive jitter & noise analysis in support of these new standards.

How to Address Your Toughest Serial Bus Design Challenges with EDA and Measurement Correlation

This Tektronix webinar will teach engineers how to use modeling tools to correlate simulations with high-speed physical layer measurements on Serial Bus Standards using the DPO/MSO70000 Series Oscilloscopes.

Advanced Jitter and Noise Analysis

new webinar that covers advances in the popular DPOJET timing & jitter analysis toolset

Anatomy of Jitter

This webinar describe the different categories and types of jitter; the origins and interrelationships and how they can be used to diagnois, characterize and debug system hardware. Plus, explain how these various jitter measurements are applicable to your specific application.

The Impact of Clock Recovery on Your Serial Data Measurements

This video discusses the basics of clock recovery impact on your measurements. Why it is needed, the effect on jitter, as well as calibration considerations.

Dual-Dirac Jitter Model

This video is a refresher of the Dual-Dirac Jitter Model, which is one of the tools available for predicting your system's performance and troubleshooting/improving the system or components of the system.

Avoiding Pitfalls in Jitter Measurements

This webinar discusses common pitfalls when making jitter measurements and how you can avoid them when making your measurements.

How to Choose the Right Platform for Jitter Measurements

Learn what to consider when selecting a platform for jitter measurements.

Beyond Receiver Interoperability Testing Webinar

This 45 minute, live webinar will focus on the latest tools and techniques for properly performing jitter tolerance and stressed receiver sensitivity testing - including characterization and margin testing of next generation receivers. .

Choosing the Right Platform for Jitter Measurements

How to Choose the Right Platform for Jitter Measurements.

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