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Spectrum Analyzer and Signal Analyzers
Delivering confidence to confront the most challenging microwave and RF designs.
Each Tektronix Spectrum Analyzer is equipped with the DPX™ Live RF spectrum display to effectively characterize time-variant signals and solve unexpected problems. DPX™ Live RF spectrum display is standard on all (Real-Time) Tektronix Spectrum Analyzers ranging from handheld to high performance benchtop instruments.
If you need both oscilloscope and spectrum analyzer functionality, the new MDO4000 Series Mixed Domain Oscilloscope offers a new approach to test. As the world's only oscilloscope with a built-in spectrum analyzer, you can capture time-correlated analog, digital and RF signals for a complete system view of your device.
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Fast, Low Level Spurious Search with Tektronix Real-Time Signal AnalyzersLearn how to get faster, low-level spurious search results.
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Fundamentals of Signal Integrity PrimerThis primer is to provide some insight into signal integrity-related problems in digital systems, and to describe their causes, characteristics, effects, and solutions. |
Advanced Radar Analysis: Tools for Measuring Modern Radar Application NoteWith today’s rapid advances in radar technology, developing and manufacturing highly specialized and innovative electronic products to detect radar signals takes leading-edge technology and tools. Tektronix innovative test equipment reduces testinguncertainty during the design process and delivers confidence in the integrity of increasingly complex designs. Tektronix Arbitrary Waveform Generators, Real-time Spectrum Analyzers and High-Bandwidth Oscilloscopes offer the capabilities you need to manage the requirements of modern radar applications. |
Fundamentals of Radar MeasurementsThis primer addresses the needs for pulse generation and measurements, the automated measurements that are available, explanation of just how the automated measurements are made, and how pulses are generated. |
Real-Time Spectrum Analysis for EMI DiagnosticsObserve the different stages of design and test with respect to test equipment and EMI measurement techniques. |
Advantages of Real-time Spectrum Analyzers in High Energy Physics ApplicationsIn High Energy Physics (HEP) applications, the fundamental challenges facing operators and researchers are sustained maximum beam power and consistent beam stability in particle accelerators. To accomplish these objectives, operators need to be able to collect information on the spectral behavior of particle beams at the time of beam ramp up as well as during various experiments. |
Characterizing Phase Locked Loops Using Tektronix Real-Time Spectrum AnalyzersThis application note presents an overview of Phase Locked Loop operation including both linear and non-linear effects. It also shows measurements of these effects in both the time and frequency domains using Tektronix Real-Time Spectrum Analyzers. |
DPX Acquisition Technology for Spectrum Analyzers FundamentalsThis primer describes the DPX® spectrum display and how it addresses situations involving brief, intermittent, complex and/or coincident signals. |
Fundamentals of Real-Time Spectrum AnalysisThis primer describes how Real-Time Spectrum Analysis works and provides a basic understanding of how it can be used to solve many measurement problems associated with capturing and analyzing modern RF signals. |
Improving IED Countermeasure Technology - Using RF Capture and Playback SystemsBy combining the Tektronix spectrum analyzer and X-COM Systems long duration RF signal storage system, a unique tool results for the recording, analyzing, and creating of new waveforms and complex RF environments to help tackle IED countermeasure technologies. |
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Fundamentals of Radar Measurements WebinarThis seminar focuses on the Automatic Measurement - theory of operation - using Tektronix signal analysis and generation tools. This presentation starts with an overview of common tools used for the testing of radars and important measurement parameters impacting measurement results. It then focuses on the Theory of Operation for the Automatic Pulse Measurements that are available on the latest Tektronix Oscilloscopes and Spectrum Analyzer products. In conclusion it discusses the challenges and solutions for Signal Generation. |
Challenges and Solutions for Testing Frequency Hopping Radios WebinarThis webinar provides an overview for the design and test topics of radios with frequency hopping techniques which have been gaining popularity in today’s crowded RF spectrum world. This includes typical test challenges for frequency hopping radio designs and how Tektronix solutions improve insight into your designs and speed time-to-market. |
Fast, Low Level Spurious Search with Tektronix Real Time Signal AnalyzersHistorically, long test times have been required to perform low-level spur searches on high-performance RF and microwave transmitters. In this webinar, learn how the unique wideband architecture of the Tektronix Real Time Signal Analyzers provides a breakthrough approach for this critical test, resulting in faster time to results and a significantly reduced test budget.
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EMI Diagnostics Using the RSA6100A WebinarThis webinar looks at the history of Electromagnetic Interference and regulatory compliance, and discover how the historically developed methods of measurements have limitations in today's complex signal environment. It also examines the filters, detectors and averaging methods used to make EMI measurements, with a discussion of why they are defined the way they are. Advantages and limitations of the RSA6100A implementation are also discussed. Finally, it shows the RSA6100A in a common diagnostics application and see how the new capabilities of RTSAs can be used to reduce troubleshooting time in EMC diagnostics. |
Greening of Wireless WebinarMesuro and Tektronix introduce a new open loop active load pull technique for the design of complex, highly efficient power amplifiers, necessary for reducing the power consumption of tomorrow’s mobile infrastructure. The method utilizing microwave sampling scope technology to simultaneously capture waveform data ranging from DC to several tens of GHz is demonstrated. |
High Power Nonlinear Measurements WebinarAccurate non-linear device characterization is the key to designing amplifiers at theoretical operating efficiencies. As traditional models have been limited by measurement systems that cannot operate at high power/gamma ratios, measurements using open-loop active harmonic load pull enable complete measurements and emulate the power and impedances the devices will see in the real world. This webinar discusses this new measurement technology. |
PHY and Protocol Testing Guidance for the Latest MIPI StandardsAttend this 40 minute webinar followed by an interactive chat session with Tektronix' Chris Loberg, to review the most recent advancements in the MIPI family of interface standards. Returning from the recent MIPI Alliance meeting in June, Chris will also provide you with testing guidance on how to approach debug, verify and characterization steps using Tektronix test equipment for your MIPI-enable device designs. |
Radar Testing Simplified WebinarLearn about the latest advanced measurements for chirped radar, hopped radar and very wideband radars. Duration: 28 minutes Speaker: Darren McCarthy, Tektronix RF Technical Marketing Manager |
Spectrum Management Overview WebinarIn our new webinar on RF spectrum management, we discuss real-time spectrum analysis tools, and how they have become the game-changer in spectrum management. Duration: 32 minutes. |
RSA3000 Spectrogram Overview VideoThis video shows how the spectrogram view on the RSA3000 enables you to seamlessly capture and display long time records of RF signals that change over time. |
Spectrum Analyzer and Signal Analyzers Related Information
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RF/Microwave Webinars
Tektronix delivers the signal generation and analysis capabilities required to overcome the most challenging microwave and RF design challenges with confidence.
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