Next generation digital interface standards (serial, memory, display etc.) are pushing the limits of today’s compliance and debug tools posing several high speed Tx and Rx design challenges including -

  • Limited signal access due to smaller device geometries
  • Bus behavior with new power-saving schemes
  • Validating new signal encoding and equalization capability in signaling interfaces
  • So many electrical validation tests, so little time!

Tektronix provides automated measurement suites that speed up PHY validation cycles and ensure consistency. Speed up debugging with tools like Protocol Decoding and Visual Trigger when compliance measurements fail. Identify jitter & noise from sources such as crosstalk or other multi-lane noise coupling.


DDR Displayport
Ethernet Test HDMI
PCI Express SATA / SAS
USB Thunderbolt
MOST Jitter Measurement and Timing Analysis
Signal Integrity Serial Data Link Analysis


High Speed Serial Communications

Featured Content

Understanding and Characterizing Timing Jitter Primer

This 24-page primer offers straightforward, practical techniques for making timing jitter measurements without the need for complex statistical calculations.

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Anatomy of an Eye Diagram

This application note discusses different ways that information from an eye diagram can be sliced to gain more insight. It also discusses some basic ways that transmitters, channels, and receivers are tested.

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e-Guide to High Speed Interface Standards

This FREE e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. You get quick access to technical resources that will help you understand design challenges and pick the right solution for your test needs.

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