SATA/SAS Application Software

Features & Benefits

• 100% SATA Gen1, Gen2, and Gen3 6 Gb/s Physical Layer Test Coverage for Hosts and Devices according to UTD 1.4
• Performs all SATA Interoperability Program Approved Transmitter and Receiver Measurements
• SATA Receiver Margin Testing
• SAS-3 Physical Layer Transmitter Conformance Testing
• Significant Reduction in Testing Time through Automation
• Single and Simple Windows^® User Interface for Multi-instrument Testing
• Repeatable and Accurate Results
• Automatic Report and Scorecard Generation
• Direct Synthesis and Device State Control Eliminates the Need for Multiple Sources
• Powered by NI TestStand™
• Seamlessly Integrate with High-level NI TestStand™ Automation Layer

Applications

• Device and Host Conformance to SATA Gen1, Gen2, Gen3, SAS-2 (6 Gb/s), and SAS-3 (12 Gb/s) Specifications
• PHY/TSG/OOB Transmitter Conformance Measurements
• RSG Receiver Conformance Measurements
• RMT (Receiver Margin Testing)
• Device and Host Validation
• Manufacturing Test and Factory Automation

TekExpress™ Automated Conformance Test Software

TekExpress (TEKEXP) automated conformance test software is a Windows-based application that runs on any Windows*¹ computer operating system including Tektronix Windows-based instruments. TekExpress software ordered with SATA-specific options provides a completely automated, simple, and efficient way to test SATA Gen1, Gen2, and Gen3 6 Gb/s hosts and devices according to the requirements of the SATA-IW (Serial ATA Interoperability Working Group) as defined in accepted Methods of Implementation (MOI).

TekExpress software ordered with SAS-specific options provides an automated, simple, and efficient way to test SAS-2 (6 Gb/s) hosts and devices according to the requirements of the SCSI Trade Association (STA), as documented in the University of New Hampshire's Interoperability Laboratory (UNH-IOL) test specification.

*¹ See host system requirements in Ordering Information section.

100% Automated – Save Time and Resources

There’s no longer a need to be an expert on all the required instrument user interfaces. Remembering how to use the instrumentation is often time consuming and typically requires a senior engineer who monitors the test spec development. Even if you remember how to use all the instruments, it’s common for even the most experienced operator to forget steps in the procedure, like calibration, or setting up parameters correctly, like clock recovery, only to have to restart the test. The TekExpress software takes the human element out of the equation and yields accurate and repeatable measurements every time. No need to spend hours in the lab testing a single device or configuring a single test instrument. Provided that automated DUT test state control (Loopback/BIST-L or BIST-T) is supported, a user can simply press the Run button in the TekExpress test automation system, and let the system run to completion without user intervention.

Setting up the Bench

Show Schematic.

When setting up a test, nothing can be simpler than hooking up the test system by looking at a schematic. View the schematic of the selected test with a push of a button.

One-button Testing

Once the test bench is set up, the DUT is properly connected, and state control methods are established, simply press the Run button to perform the selected test suite.

Basic and Expert User Interface

Basic Operation.


Expert Operation.

TekExpress software provides two levels of operation through its Graphical User Interface (GUI), Advanced and Basic. This allows the expert user to make and save changes on a test configuration and then hide these controls for repetitive testing by less experienced users. This provides flexibility in test configuration and at the same time ensures configuration settings are not inadvertently changed.

Online Help and Show MOI

Show MOI.

Online help is available through the Help menu and direct access to the approved SATA MOI (Method of Implementation) and UNH-IOL Physical Layer Test Suite through the Show MOI button. This allows users to understand the theory behind the measurements and better understand test results.

Pass/Fail Report and Scorecard

View Scorecard.

The Report tab provides an HTML view of test results along with Pass/Fail status. Once testing is complete, an extensive scorecard (MS Excel format) is automatically generated. If your scorecard has a 100% passing score, your device can then be considered physical-layer conformant.

 

 

 

 

 

100% SATA Gen1, Gen2, and Gen3 6 Gb/s Physical Layer Test Coverage to Unified Test Document (UTD) Version 1.4

Conformance requirements for SATA hosts and devices include Transmitter Signaling Group (TSG), Physical Layer (PHY), Out-of-Bound (OOB), and Receiver Signaling Group (RSG). The TekExpress SATA software is an easy-to-use software package that automates 100% of the required SATA physical layer using the Tektronix multi-instrument test bench. The SATA test bench includes a real-time oscilloscope (DPO/DSA70000C/D or MSO70000C Series), a high-performance signal generator (AWG7000C Series), a frame error analyzer, and an optional RF switch. While other manufacturers automate portions of the transmitter and receiver test requirements, the Tektronix high-speed serial test bench with TekExpress SATA software is the only solution that provides 100% physical layer test coverage for SATA, which is the most comprehensive conformance certification program in the electronics industry. The Tektronix SATA test bench is used at bi-annual workshops sponsored by SATA-IO for ‘Gold Suite’ testing. Required test procedures (MOI) can be found at http://www.serialata.org/developers/interoperability.asp. Now, using TekExpress SATA automated conformance test software, you can perform 100% of the physical layer tests performed in the ‘Gold Suite’ at SATA-IO Interop Workshops in your own lab.

SAS-2 Physical Layer Transmitter Conformance Testing

Comprehensive SSC Analysis Tools.

Basic Spread Spectrum Clock modulation parameters such as frequency and spread, as mandated by the SAS specification, provide insight into potential interoperability problems. Noisy SSC, which can come from coupled power supply switching noise or mis-programmed clock circuits, has been the primary sources of system interoperability issues. The dFdT (rate of change of modulation frequency versus time) measurement allows in-depth analysis of Spread Spectrum Clocking issues.

Transmitter Spectral Profile for Common Mode Analysis.

SAS device characteristics are required to transmit common mode voltage and spectral power below specified levels for reliable system interoperability. The relative amplitude of the first and second signal harmonics offers insight into pulse symmetry and AC common mode components in the signal. TekExpress software saves you time by fully automating both time- and frequency-domain based common mode measurements.

TSG/PHY/OOB and SAS-WDP Automation

For transmitter testing, TekExpress (Opt. SATA-TSG, SAS-TSG, and SAS-TSGW) performs all the tests required by the specification. SATA and SAS transmitter conformance measurements involve a multitude of complex measurements, including a unique vertical amplitude measurement. SAS-TSG now offers a MATLAB measurement extension which allows users to call any general-purpose (user-defined) MATLAB measurement, and TekExpress provides the hooks to retrieve those results and bring them back into TekExpress for the final report.

SAS-2 Waveform Dispersion Penalty (WDP measurement).

The SAS-TSGW test suite automates the required SAS-2 Waveform Dispersion Penalty (WDP) measurement. This key measurement applies a worst-case channel and then processes the far-end response through a reference equalizer. The WDP result provides a measurement of non-compensable ISI and provides more insight into potential BER issues related to channel effects.

Direct Synthesis and Device State Control in a Single Instrument

An AWG7000C Series arbitrary waveform generator with Option 01 (64M waveform length) and Option 06 (24 GS/s interleaving) is a key component of the TekExpress Serial ATA Conformance Test Solution. It provides state control for the device or host under test as well as direct synthesis of the waveform patterns (impaired and unimpaired) needed for testing.

In SATA, state control is required to initiate a BIST-L (Built-In Self Test – Loopback) sequence to the device under test from its receiver port. This is used for all measurement test suites: transmitter and receiver. Other solutions attempt to initiate the BIST-L with an off-the-shelf host system or a digital generator and then try to apply the appropriate pattern for testing. This often requires the user to disconnect the BIST-L source from the device and then reconnect to a second source causing many devices to fall out of BIST-L mode. This leads to frequent rework and wasted time.

For signal impairment, alternative solutions require a multitude of sources to create the proper signal impairment (jitter and amplitude loss) for receiver testing. These include a pattern generator, a noise source, and a sinusoidal jitter source. This configuration is difficult to set up and even more difficult to duplicate reliably at different sites. With the AWG7000C Series, the signal impairment is synthesized digitally with a single setup file so it can be reproduced reliably. Further, it can also transition seamlessly from BIST-L initiation to a digitally impaired signal, a unique capability of a high-speed arbitrary waveform generator. TekExpress SATA-RSG and SAS-RSG both allow operation from static, pre-configured waveforms, but for automated waveform generation the AWG will require Option SDX100 (SerialXpress) to be installed.

SAS-3 Automated Conformance Test Software

SAS 12 Gb/s Transmitter Measurement Suite.

SAS-3 adds new measurements and specification limits for next-generation SAS devices. The data rate increase from 6 Gb/s to 12 Gb/s has led to the introduction of more advanced methods of compensating for channel loss with transmitter and receiver equalization. With the higher data rate and multi-lane topology SAS-3 designers are presented with a number of test and measurement challenges, including fixture effects and the need to isolate crosstalk. Coupling of energy from adjacent signaling lanes adds noise and jitter that can affect system interoperability. Effective debug requires jitter analysis tools that can properly separate and classify the jitter components of a signal, including those stemming from crosstalk. Option SAS3 and DPOJET software provide the in-depth analysis for characterizing Bounded Uncorrelated Jitter (BUJ) that results from cross-channel coupling of adjacent lanes.

Because of reduced margins due to test fixture losses it’s often necessary to perform test fixture de-embedding. De-embed filters can be easily created using Serial Data Link Analysis (SDLA) software and then easily applied while making SAS-3 measurements. In addition to jitter, option SAS3 also provides voltage, spread spectrum clocking (SSC), and other AC parametric measurements.

Option SAS3 also includes a new measurement, SAS3_EYEOPENING, for accurate analysis of ISI and crosstalk effects and relative vertical eye opening after reference equalization. Similar to WDP for testing SAS 6 Gb/s devices, this measurement provides a figure of merit for evaluating non-compensable ISI and crosstalk while including both reference Tx and Rx equalization effects. SAS3_EYEOPENING as implemented in option SAS3 directly reports the ratio of Vertical Eye Opening to Reference Pulse Response Cursor Ratio. This measurement is also used for calibration of ISI channel effects for SAS 12 Gb/s receiver testing.

Receiver Margin Testing

Jitter Tolerance Curve.

• RSG-01 – Gen1 (1.5 Gb/s) Receiver Jitter Test
• RSG-02 – Gen2 (3.0 Gb/s) Receiver Jitter Test
• RSG-03 – Gen3 (6.0 Gb/s) Receiver Jitter Test
• RSG-05 – Asynchronous Receiver Stress Test
• RSG-06 – Asynchronous Receiver Stress Test with SSC
• RMT-01 – Gen1 (1.5 Gb/s) Receiver Margin Test
• RMT-02 – Gen2 (3.0 Gb/s) Receiver Margin Test
• RMT-03 – Gen3 (6.0 Gb/s) Receiver Margin Test

 

Option SATA-RSG and SAS-RSG offer full Receiver Margin Testing (RMT) capability. While the SATA RSG (Receive Signaling Group) test is a Pass/Fail test on whether the receiver can tolerate a laboratory-grade impaired framed composite test signal, designers will want to know ‘how much margin do I have?’ TekExpress SATA software provides both a Pass/Fail RSG test and Receiver Margin Testing (RMT). When the RMT test is selected, jitter is synthesized at different frequencies and amplitudes increasingly until errors are detected on the frame error analyzer. A jitter tolerance curve is then created that shows where the device fails. This information is useful in validating the design of the receiver.

Powered by NI TestStand™

The TekExpress automated conformance test software uses NI (National Instruments) TestStand to manage and execute its test sequences. A Windows user interface is provided in the TekExpress software for simple and complete operation of conformance measurements. However, if your validation and debug needs go beyond the features offered by the TekExpress software, a full version of NI TestStand can be used to develop higher-level automation sequences to control the TekExpress software.

NI TestStand is the de facto industry-standard test management environment for automating test and validation systems. NI TestStand is used to develop, manage, and execute test sequences, to integrate test modules written in any test programming language through an open and flexible architecture. Customers who own NI TestStand and purchase the TekExpress software will be able to write scripts using NI TestStand that call the TekExpress software with a limited command set. The limited command set allows the NI TestStand user to recall and save TekExpress software setups, start execution, query current execution status, and receive measurement results.

For device validation, it’s often desirable to make multiple runs of a single device using different operating conditions such as temperature and power supply voltages. This is sometimes referred to as ‘four corners testing,’ (testing to low-high temperature and low-high supply voltages). For four corners testing, NI TestStand supports drivers for a wide range of temperature chambers and power supplies. NI TestStand can be used to control the temperature chamber and then call the TekExpress software for a conformance test using the limited command set. For adjusting power supply voltages, the power supply control sequence file within the TekExpress software can be modified using a standard NI TestStand sequence file. Thus, if your company already uses TestStand for automation, your test engineers can incorporate commands to run the TekExpress conformance test software directly into their test sequences.