Features & Benefits
DPOJET Advanced
- Jitter and Timing Analysis for Clocks and Data Signals
- Real-time Eye-diagram (RT-Eye®) Analysis*1
- Selectable High- and Low-pass Measurement Filters
- Nine Plot Types to View and Analyze Jitter: Eye Diagram, CDF Bathtub, Spectrum, Histogram, Trend, Data, Phase Noise, and Transfer Function
- Accurate Jitter Decomposition and TJ(BER) Estimation*2 with Selectable Jitter Models Support Popular Standards; Fibre Channel or PCI Express Delta-Delta (Dual Dirac) and Convolved Results
- Full Pass/Fail Limits and Mask Testing with Comprehensive Standards Support Library; plus User Limit and Mask Files allow Support of Custom Test Configurations and New or Developing Standards
- DPOJET Advanced is Standard on DSA70000 Series, Optional on DPO/MSO70000, DPO7000, and MSO/DPO5000 Series Oscilloscopes
DPOJET Essentials or Advanced
- Period, Frequency, and Time Interval Error Analysis
- Timing Parametrics such as Rise/Fall Times, Pulse Width, and Duty Cycle
- Many Graphical Tools such as Histograms, Time Trends, and Spectrums
- Programmable Software Clock Recovery including Software PLL*3
- User-selectable Golden PLL Support for Popular Standards
- Selectable High- and Low-limit Measurement Bounds Test
- Comprehensive Statistics Logging, Reporting, and Remote Automation
- Capture and Save Worst-case Signals for Detailed Analysis
- TekWizard™ Interface for One-button and Guided Jitter Summaries
- DPOJET Essentials is Standard on All DPO/DSA/MSO70000, DPO7000, and MSO/DPO5000 Series Oscilloscopes
Applications
- Characterize Performance of High-speed Serial and Parallel Bus Designs
- Characterize Clock and Data Jitter and Signal Integrity
- Characterize PLL Dynamic Performance
- Characterize Modulation of Spread Spectrum Clock Circuits
- Characterize Jitter Generation, Transfer, and Tolerance
- Perform PHY Testing of PCI Express, Serial ATA, SAS, Fibre Channel, MIPI® D-PHY, MIPI® M-PHY, DisplayPort, DDR, DDR2, DDR3, LPDDR, LPDDR2, USB 3.0, and other Electrical and Optical Systems
*1 Patented USPTO #6,836,738.
*2 Patented USPTO #6,832,172, #6,853,933, #7,254,168.
*3 Patented USPTO #6,812,688.
Real-time Jitter and Eye-diagram Analysis
DPOJET is the premiere eye-diagram, jitter, and timing analysis package available for real-time oscilloscopes. Operating in the Tektronix DPO/DSA/MSO70000, DPO7000, and MSO/DPO5000 Series oscilloscopes, DPOJET provides engineers the highest sensitivity and accuracy available in real-time instruments. With comprehensive jitter and eye-diagram analysis and decomposition algorithms DPOJET simplifies discovering signal integrity concerns and jitter and their related sources in today's high-speed serial, digital, and communication system designs.
Analog and digital designers in the computer, semiconductor, and communications industries are facing new challenges as processor clock speeds race beyond 3 GHz and back-plane bus and serial link data rates exceed 8 GT/s. These increasing speeds mean reduced circuit tolerance, or margin, for jitter and related signal integrity problems. By using tools that help you rapidly characterize and discover sources of jitter and signal integrity concerns, you can bring new designs to market faster, with more confidence that they operate reliably in today's ultra high-speed environment.
Partial List of Measurements
Measurement | Description |
|---|
Period/Frequency Measurements | Frequency, Period, N-Period, Cycle-Cycle Period, Positive Width, Negative Width, Positive Duty Cycle, Negative Duty Cycle, Positive Cycle-Cycle Duty, Negative Cycle-Cycle Duty |
Time Measurements | Rise Time, Fall Time, High Time, Low Time, Setup, Hold, Skew |
Amplitude Measurements | High, Low, High-Low, Common Mode, T/nT Ratio, Differential Crossover |
Eye-diagram Measurements | Eye Height, Eye Width, Width at BER, Mask Hits |
Jitter Measurements | TIE, RJ, DJ, TJ(BER), PJ, DCD, DDJ, RJ(δ-δ), DJ(δ-δ), Phase Noise |
Clock Recovery Methods | Constant Clock Mean, Constant Clock Median, PLL, External, PLL External |
Plots | Histogram, Time Trend, Data Trend, Spectrum, Phase Noise, Transfer Curve, Eye Diagram with Waveform Database, Eye-diagram Statistics (CDF Bathtub) |
Limit and Mask Testing | Pass/Fail Measurement Test Limits, Load and Test to Standard Masks |
Measurement Source | CH1 - CH4, MATH1 - MATH4, REF1 - REF4 |
Data Logging | Measurements, Statistics, Worst-case Waveform, and Snapshots |
Report Generation | Export HTML Formatted Reports with Summary, Statistics, Plots, and Pass/Fail |
DPOJET Jitter and Eye-diagram Analysis Tools extend the capability of Tektronix real-time oscilloscopes, performing complex measurements and analysis of clock, serial, and parallel data signals captured in Single-shot Acquisition mode or in Continuous-run Acquisition mode. Providing jitter and timing measurements with pass/fail parameter testing, and eye diagrams with mask testing for today’s most common industry standards, DPOJET is specifically designed to meet the advanced measurement needs of today's high-speed digital designers in the computer and communications industries.
DPOJET provides the ability to make measurements of single-ended and differential signals, measurements between two separate inputs, and measurements on multiple inputs simultaneously; with each input and each measurement independently configurable for maximum flexibility.
DPOJET supports displaying measurement results and plots on the internal display, on an external monitor, or both locations, thus making full use of the oscilloscope dual display ports.
DPOJET analysis plots, like Spectrum and Trend, go beyond simple measurements and results display. Trend analysis quickly shows engineers how timing parameters change over time, like frequency drift, PLL startup transients, or a circuit’s response to power supply changes. Spectrum analysis quickly shows the precise frequency and amplitude of jitter and modulation sources for easy, rapid identification. Finding sources like adjacent oscillators and clocks, power supply noise, or signal crosstalk is no longer a tedious chore. Unique in the industry, DPOJET also provides Phase Noise plots to show jitter in root/Hertz and Transfer Function plots that allow direct comparison of jitter spectrums between two signals of differing frequencies, providing the perfect tool for determining jitter in PLL circuits like clock multipliers.
DPOJET provides complete jitter and eye-diagram analysis tools. With premiere measurement flexibility, oscilloscope model support, limit testing, results logging and reporting, and integrated remote programmability, DPOJET fully supports applications from device and system debug and characterization to short-run functional test and production.

Figure 1 – Spectrum, Eye Diagram, and BER curve of SATA-2 3.0 Gb/s MFTP.