Characteristics
General
|
Characteristic
|
Description
|
|
Analog Bandwidth (Ch 1, Ch 2)
|
>10 GHz
|
|
Max Input Voltage (Ch 1, Ch 2, AUX)
|
3 Vp-p per channel
|
|
Insertion Loss (Ch 1, Ch 2)
|
3 dB
|
|
Impedance
|
50 Ω
|
|
Switching Speed
|
400 ns (typical)
|
|
Input/Output Connectors
|
SMA 3.5 mm female
|
|
Power Supply
|
Through USB connection to a control host (BERTScope Analyzer
or Windows PC)
|
|
Software Control
|
Through USB connection to a control host
|
|
Inputs
|
|
Channel 1+
|
Single-ended / Differential (+)
Internally AC-coupled
|
|
Channel 2+
|
Single-ended / Differential (+)
Internally AC-coupled
|
|
AUX In
|
Internally converted to differential output
Internally
AC-coupled
|
|
Max Frequency
|
100 MHz
|
|
LFPS
|
Internal LFPS generator
|
|
Channel 1–
|
Differential (–)
Internally AC-coupled
|
|
Channel 2–
|
Differential (–)
Internally AC-coupled
|
|
Trigger In
|
CML
|
|
Nominal Voltage
|
V (Hi) 0 V
V (Lo) –400 mV
|
|
Switch Control
|
3.3 V TTL
|
|
AUX Control
|
3.3 V TTL
|
|
Outputs
|
|
Output –
|
Differential (–)
|
|
Output +
|
Single-ended / Differential (+)
|
|
Trigger Out
|
3.3 V TTL (internally converted from CML Trigger In)
|
Pattern Generator*1
Input/Output
Specifications
Figure 1. Amplitude range.
Figure 2. Allowable combinations of termination
and offset. Amplitude swings between 0.25 and 2 V allowed; should
fit inside shaded area of graph. For example, SCFL uses a 0 V termination,
and operates between approximately 0 and –0.9 V; as shown with dotted
arrow, it falls within the operating range.
Clock Outputs
|
Characteristic
|
Description
|
|
Frequency Range
|
|
BSA85C, CPG
|
0.1-8.5 GHz
|
|
BSA125C, CPG
|
0.1-12.5 GHz*2
|
|
BSA175C, CPG
|
0.5-17.5 GHz*2
|
|
BSA260C, CPG
|
1-26 GHz*2
|
|
Phase Noise
|
< –90 dBc/Hz at 10 kHz offset (typical)
|
|
Clock Output Divide Ratios
|
Option STR only
|
*1 Rise times are measured 20% to 80%
unless otherwise stated. Specifications are following a 20-minute
warm-up period. Specifications subject to change.
*2 Output at data rate ÷2 above 11.2 Gb/s.
Data
Outputs
|
Characteristic
|
Description
|
|
Date Rate Range
|
|
BSA85C
|
0.1-8.5 Gb/s
|
|
BSA125C, CPG
|
0.1-12.5 Gb/s
|
|
BSA175C, CPG
|
0.5-17.5 Gb/s
|
|
BSA260C, CPG
|
1-26 Gb/s
|
|
Format
|
NRZ
|
|
Polarity
|
Normal or Inverted
|
|
Variable Crossover
|
25 to 75%
|
|
Patterns
|
|
Hardware patterns
|
Industry-standard Pseudo-random (PRBS) of the following types:
2n – 1 where n = 7, 11, 15, 20, 23, 31
|
|
RAM patterns
|
|
BSA85C
BSA125C, CPG
BSA175C,
CPG
BSA260C, CPG
|
128 bits to 128 Mb total, allocated in 32 Mb portions to each
of two A/B pages. Single page max is 128 Mb
|
|
Library
|
Wide variety including SONET/SDH, Fibre Channel based such
as k28.5, CJTPAT; 2n patterns where n = 3, 4, 5, 6, 7,
9; Mark Density patterns for 2n where n = 7, 9, 23; and
many more
|
|
Error Insertion
|
|
Length
|
1, 2, 4, 8, 16, 32, 64 bit bursts
|
|
Frequency
|
Single or repetitive
|
Data, Clock Amplitudes and Offsets
|
Characteristic
|
Description
|
|
Configuration
|
Differential outputs, each side of pair individually settable
for termination, amplitude, offset
|
|
Interface
|
DC coupled, 50 Ω reverse terminated, APC-3.5 connector. Calibration
into 75 Ω selectable, other impedances by keypad entry. User-replaceable
Planar Crown® adapter allows change to other connector
types
|
|
Preset Logic Families
|
LVPECL, LVDS, LVTTL, CML, ECL, SCFL
|
|
Terminations
|
Variable, –2 to +2 V
Presets: +1.5, +1.3, +1, 0, –2 V,
AC coupled
|
|
Allowable Amplitudes, Terminations, and Offsets
|
See Figures 1 and 2
|
Data, Clock Waveform Performance
|
Model
|
Rise Time
|
Jitter
|
|
BSA85C
|
25 ps max, 23 ps typical (10-90%)
1 V amplitude, at 10.3125 Gb/s
|
<10 ps p-p (typical, for data rates ≥1 Gb/s)
<0.025 UI (typical, for data rates <1 Gb/s)
|
|
BSA125C, CPG
|
|
BSA175C, CPG
|
|
BSA260C, CPG
|
8 ps p-p (typical at 25.78 Gb/s data rate)
|
Clock/Data Delay
|
Characteristic
|
Description
|
|
Range
|
(Greater than 1 bit period in all cases)
|
|
Up to 1.1 GHz
|
30 ns
|
|
Above 1.1 GHz
|
3 ns
|
|
Resolution
|
100 fs
|
|
Self Calibration
|
At time of measurement, when temperature or bit rate are changed,
instrument will recommend a self calibration. Operation takes less
than 10 seconds
|
Pattern Generator Ancillary Connections
Front-panel Pattern Generator Connections
External Clock Input
|
Characteristic
|
Description
|
|
Allows use of an external clock source to clock
the BERTScope.
Models equipped with stress are able to add
impairments to incoming clock, including when external signal has
Spread Spectrum Clocking (SSC) in excess of 5000 ppm imposed on it.
|
|
Frequency Range
|
|
BSA85C
|
0.1 to 8.5 GHz
|
|
BSA125C, CPG
|
0.1 to 12.5 GHz
|
|
BSA175C, CPG
|
0.5 to 17.5 GHz
|
|
BSA260C, CPG
|
1 to 26 GHz
|
|
Nominal Power
|
900 mVp-p (+3 dBm)
|
|
Maximum Power
|
2.0 Vp-p (+10 dBm)
|
|
Return Loss
|
Better than –6 dB
|
|
Interface
|
50 Ω SMA female, DC coupled into selectable termination voltage
|
HF Jitter (Option STR Only)
|
Characteristic
|
Description
|
|
One of two jitter insertion inputs. Can be used
to insert SJ, RJ, BUJ if desired.
|
|
Frequency Range
|
DC to 1.0 GHz
|
|
Jitter Amplitude Range
|
Up to 0.5 UI max
|
|
Input Voltage Range
|
0-2 Vp-p (+10 dBm) for normal operation
6.3 Vp-p (+20 dBm) max nondestructive input
|
|
Data Rate Range
|
Supports data rate ranges from 1.5 to 8.5 Gb/s (BSA85C/CPG),
12.5 Gb/s (BSA125C/CPG), 17.5 Gb/s (BSA175C/CPG), or 22.4 Gb/s (BSA260C/CPG),
with limited performance to 622 Mb/s (BSA260C/CPG excluded)
|
|
Interface
|
SMA female, 50 Ω, DC coupled into 0 V
|
Sub-rate Clock Output
|
Characteristic
|
Description
|
|
BERTScope standard models have clock divided by
4.
BERTScope Option STR models have additional capabilities.
|
|
Frequency Range
|
0.125 to 3.125 GHz (12.5 GHz with Option STR)
|
|
Amplitude Range
|
1 Vp-p, nominal, centered around 0 V
|
|
Transition Time
|
<500 ps
|
|
Interface
|
SMA female, 50 Ω, DC coupled into 0 V
|
Trigger Output
|
Characteristic
|
Description
|
|
Provides a pulse trigger to external test equipment.
It has two modes:
1. Divided Clock Mode: Pulses at 1/256th
of the clock rate
2. Pattern Mode: Pulse at a programmable
position in the pattern (PRBS), or fixed location (RAM patterns)
Stress modulation added on models so equipped, when enabled.
|
|
Minimum Pulse Width
|
128 Clock Periods (Mode 1)
512 Clock Periods (Mode
2)
|
|
Transition Time
|
<500 ps
|
|
Jitter (p-p, data to trigger)
|
<10 ps, typical (BSA175C/CPG, BSA260C/CPG)
|
|
Output Levels
|
>300 mVp-p, center at 650 mV
|
|
Interface
|
50 Ω SMA female
|
Rear-panel Pattern Generator Connections
Pattern Start Input
|
Characteristic
|
Description
|
|
For users wanting to synchronize patterns of multiple
data streams from multiple instruments simultaneously.
|
|
Logic Levels
|
LVTTL (<0.5 V Low, >2.5 V High)
|
|
Threshold
|
+1.2 V typical
|
|
Max Nondistructible Input Range
|
–0.5 V to +5.0 V
|
|
Minimum Pulse Width
|
128 serial clock periods
|
|
Maximum Repetition Rate
|
512 serial clock periods
|
|
Interface
|
SMA female, >1 kΩ impedance into 0 V
|
Page Select Input
|
Characteristic
|
Description
|
|
In A-B Page Select mode, allows external control
of pattern. Software control over rising or falling edge trigger,
continuous Pattern B after completion of Pattern A, or run B only
once before reverting back to A.
|
|
Logic Levels
|
LVTTL (<0.5 V Low, >2.5 V High)
|
|
Threshold
|
+1.2 V typical
|
|
Max Nondistructible Input Range
|
–0.5 V to +5.0 V
|
|
Minimum Pulse Width
|
1 pattern length
|
|
Interface
|
SMA female, >1 kΩ impedance into 0 V
|
Sinusoidal Interference Output (Option
STR Only)
|
Characteristic
|
Description
|
|
SI output from internal generator. Can be used
to apply SI after external ISI channel.
|
|
Frequency Range
|
0.1-2.5 GHz
|
|
Output Voltage
|
0-3 Vp-p
|
|
Interface
|
0-3 Vp-p
|
Low-frequency Jitter Input (Option STR
Only)
|
Characteristic
|
Description
|
|
Allows use of external low-frequency jitter source
to modulate the stressed pattern generator output.
|
|
Frequency Range
|
DC to 100 MHz
|
|
Jitter Amplitude Range
|
Up to 1.1 ns, can be combined with other internal low-frequency
modulation
|
|
Input Voltage Range
|
0-2 Vp-p (+10 dBm) for normal operation 6.3 Vp-p (+20 dBm) max nondestructive input
|
|
Data Rate Range
|
Up to 8.5 Gb/s (BSA85C/CPG), 12.5 Gb/s (BSA125C/CPG), 17.5 Gb/s
(BSA175C/CPG), and 22 Gb/s (BSA260C/CPG)
|
|
Interface
|
SMA female 50 Ω, DC coupled into 0 V
|
Low-frequency Sinusoidal Jitter Output(Option
STR Only)
|
Characteristic
|
Description
|
|
To allow phasing of two BERTScopes together, in-phase
or anti-phase.
|
|
Frequency
|
As set for internal SJ from GUI
|
|
Amplitude
|
2 Vp-p, centered at 0 V
|
|
Interface
|
SMA female
|
Reference Input
|
Characteristic
|
Description
|
|
To lock the BERTScope to an external frequency
reference from of another piece of equipment.
|
|
Frequency
|
10, 100, 106.25, 133.33, 156.25, 166.67, or 200 MHz
|
|
Amplitude
|
0.325 to 1.25 Vp-p (–6 to +6 dBm)
|
|
Interface
|
50 Ω SMA female, AC coupled
|
Reference Output
|
Characteristic
|
Description
|
|
Provides a frequency reference for other instruments
to lock to.
|
|
Configuration
|
Single Ended (Ref-Out not used) (BSA125C, CPG)
Differential
|
|
Frequency
|
10, 100, 106.25, 133.33, 156.25, 166.67, or 200 MHz
|
|
Amplitude
|
1 Vp-p (+4 dBm) nominal, each output, (2 Vp-p differential)
|
|
Interface
|
50 Ω SMA female, AC coupled
|
Clock Path Details
BSA85C,
CPG
Functional block diagram of the clock path for
models with stress capability, BSA85C/CPG.
Available divide ratios from clock-related output, by bit
rate, using the internal clock, BSA85C***.
BSA125C, CPG, BSA175C, CPG, and BSA260C, CPG
Functional block diagram of the clock path for models with
stress capability, BSA85C/CPG, BSA125C/CPG, BSA175C/CPG, BSA260C/CPG.
* This output can also provide a full-rate jittered
clock.
** Stress may be added to an external clock on appropriate
models. Stress operating range is from 1.5 to 11.2 Gb/s. External
clock must have a duty cycle of 50% ±2%.
*** All listed ratios
available for an external clock input over entire bit rate range,
limitations for internal clock only. Minimum specified frequency of
the clock output is 100 MHz. Operation below this rate will be uncalibrated.
The BSA125, BSA175, and BSA260 models use an internal
Double Data Rate (DDR) architecture to operate at data rates ≥11.2 Gb/s.
When operating at 11.2 Gb/s or higher data rate, the clock output
will be 1/2 the data rate.
External clock can be specified
to be either full or half data rate. When full rate is selected, the
pattern generator will operate in DDR mode when the input clock frequency
is 11.2 GHz or higher.
These ratios apply to operation from
internal clock only. External clock will be output at 1/2 rate when
half rate is selected, or when full rate is selected and clock rate
is ≥11.2 GHz.
The minimum data rate specified for the main
clock output is 500 Mb/s. Output will be uncalibrated when operated
at divided rates lower than 500 Mb/s.
Available Multi-rate
and Sub-rate Divider Ratios for Main Clock Output, BSA125C, CPG, BSA175C,
CPG, and BSA260C, CPG Models
|
Data Rate (Gb/s)
|
Ratios for Main Clock Out
|
Ratios for Sub-rate Clock Out*3
|
|
500-750 Mb/s
|
1, 2, 4, 5, 6, 7, 8, 9, 10, 12, 14, 16, 18, 20, 24, 32, 36
|
1, 2, 4
|
|
0.75-1.5 Gb/s
|
1, 2, 4, 5, 6, 7, 8, 9, 10, 12, 14, 16, 18, 20, 24, 25, 28,
30, 32, 35, 36, 40, 42, 45, 48, 54, 56, 64, 72, 81
|
1, 2, 4, 8
|
|
1.5-3 Gb/s
|
1, 2, 4, 5, 6, 7, 8, 9, 10, 12, 14, 16, 18, 20, 24, 30, 32,
32, 35, 36, 36, 40, 42, 45, 48, 50, 54, 56, 60, 64, 70, 72, 80, 81,
84, 90, 98, 108, 112, 126, 128, 144, 162
|
1, 2, 4, 8, 16
|
|
3-6 Gb/s
|
1, 2, 4, 5, 6, 7, 8, 9, 10, 12, 14, 16, 18, 20, 24, 30, 32,
32, 35, 36, 36, 40, 42, 45, 48, 50, 54, 56, 60, 64, 70, 72, 80, 81,
84, 90, 98, 100, 108, 112, 120, 126, 128, 140, 144, 160, 162, 168,
180, 192, 196, 216, 224, 252, 256, 288, 324
|
1, 2, 4, 8, 16, 32
|
|
6-11.2 Gb/s
|
1, 2, 4, 5, 6, 7, 8, 9, 10, 12, 14, 16, 18, 20, 24, 30, 32,
32, 35, 36, 36, 40, 42, 45, 48, 50, 54, 56, 60, 64, 70, 72, 80, 81,
84, 90, 98, 108, 112, 126, 128, 140, 144, 144, 160, 162, 162, 168,
180, 192, 196, 200, 216, 224, 240, 252, 256, 280, 288, 320, 324, 360,
384, 392, 432, 448, 504, 512, 576, 648
|
1, 2, 4, 8, 16, 32, 64
|
|
11.2-12 Gb/s
|
2, 4, 8, 10, 12, 14, 16, 18, 20, 24, 28, 32, 36, 40, 48, 60,
64, 64, 70, 72, 72, 80, 84, 90, 96, 100, 108, 112, 120, 128, 140,
144, 160, 162, 168, 180, 196, 200, 216, 224, 240, 252, 256, 280, 288,
320, 324, 336, 360, 384, 392, 432, 448, 504, 512, 576, 648
|
2, 4, 8, 16, 32, 64
|
|
12-26 Gb/s
|
2, 4, 8, 10, 12, 14, 16, 18, 20, 24, 28, 32, 36, 40, 48, 60,
64, 64, 70, 72, 72, 80, 84, 90, 96, 100, 108, 112, 120, 128, 140,
144, 160, 162, 168, 180, 196, 216, 224, 252, 256, 280, 288, 288, 320,
324, 324, 336, 360, 384, 392, 400, 432, 448, 480, 504, 512, 560, 576,
640, 648, 720, 768, 784, 864, 896, 1008, 1024, 1152, 1296
|
2, 4, 8, 16, 32, 64, 128
|
*3 Sub-rate clock connector can also output
a full-rate stressed clock up to 11.2 Gb/s, or half-rate stressed
clock at rates ≥11.2 Gb/s.
Pattern Generator Stressed Eye
- Flexible, integrated stressed eye impairment addition to
the internal or an external clock
- Easy setup, with complexity
hidden from the user with no loss of flexibility
- Verify compliance
to multiple standards using the BERTScope and external ISI filters.
Standards such as:
- OIF CEI
- 6 Gb SATA
- PCI Express®
- XFI
- USB 3.0
- SONET
- SAS 2
- XAUI
- 10 and 100 Gb Ethernet
- DisplayPort
- Sinusoidal interference may be inserted
in-phase or in anti-phase, or sent externally to be summed after an
external ISI reference channel
- Sinusoidal jitter may be locked
between two BERTScopes in-phase or anti-phase, as required by OIF
CEI
Flexible External Jitter Interfaces
- Front Panel External High Frequency Jitter Input Connector
– Jitter from DC to 1.0 GHz up to 0.5 UI (max) may be added, of any
type that keeps within amplitude and frequency boundaries
- Rear Panel External SJ Low Frequency Jitter Input Connector – Jitter
from DC to 100 MHz up to 1 ns (max) may be added
- Rear Panel
SJ Output
- Sinusoidal Interference Output Rear Panel Connector
Note: Internal RJ, BUJ, and external high-frequency
jitter input limited to 0.5 UI, combined, further limited to 0.25 UI
each when both are enabled. Rear-panel low-frequency jitter input
can be used to impose additional jitter; sum of external low-frequency
jitter, internal low-frequency SJ to 10 MHz, PCIe LFRJ and PCIe LFSJ
(with Option XS) is limited to 1.1 ns. This limit does not apply to
Phase Modulation (PM) from Option XSSC.
Amplitude and ISI
Impairments
ISI
Add externally: For example,
long coax cable length, or Bessel-Thompson 4th Order Filter with –3 dB
point at 0.75 of bit rate, etc.
For applications requiring
circuit board dispersion, the BSA12500ISI differential ISI accessory
board may be used.
Sinusoidal Interference
- Supports full data rate range of BERTScope
- 100 MHz
to 2.5 GHz
- Adjustable in 100 kHz steps
- Adjustable
from 0 to 400 mV
- Common mode or differential
- Available
from rear-panel 50 Ω SMA connector, single ended with data amplitude
from 0 to 3 V adjustable from GUI, same frequency range and step size
as internal adjustment
Jitter Impairments
Bounded Uncorrelated Jitter
- Supports data
rates from 1.5 to 8.5 Gb/s (BSA85C/CPG), to 12.5 Gb/s (BSA125C/CPG),
17.5 Gb/s (BSA175C/CPG), and 22.4 Gb/s (BSA260C/CPG), with limited
performance to 622 Mb/s (BSA260C/CPG excluded)
- Internal PRBS-7
Generator
- Variable up to 0.5 UI
- 100 Mb/s to 2.0 Gb/s
- Band-limited by selected filters (see table below)
|
BUJ Rate
|
Filter
|
|
100 to 499
|
25 MHz
|
|
500 to 999
|
50 MHz
|
|
1,000 to 1,999
|
100 MHz
|
|
2,000
|
200 MHz
|
Random Jitter
- Supports
data rates from 1.5 to 8.5 Gb/s (BSA85C), to 12.5 Gb/s (BSA125C/CPG),
17.5 Gb/s (BSA175C/CPG), and 22.4 Gb/s (BSA260C/CPG), with limited
performance to 622 Mb/s (BSA260C/CPG excluded)
- Variable up
to 0.5 UI
- Band-limited 10 MHz to 1 GHz
- Crest factor
of 16 (Gaussian to at least 8 standard deviation or ~1×10–16 probability)
Sinusoidal Jitter
|
Data Rate
|
Internal SJ Frequency
|
Maximum Internal SJ Amplitude
|
|
Up to 8.5 (BSA85C), 12.5 (BSA125C), 17.5 (BSA175C),
or 22.4 (BSA260C) Gb/s
|
1 kHz to 10 MHz*4
|
1100 ps
|
|
10 MHz to 100 MHz
|
200 ps
|
|
22.4-26 Gb/s
|
1 kHz to 100 MHz
|
84 ps
|
*4 Can be combined with other low-frequency
modulation.
SJ adjustable from 0 to levels greater than or
equal to range in table. See Additional Stress Options (next) for
more SJ capabilities.
Additional Stress Options
Phase Modulation Range with Option XSSC.
Maximum SSC Modulation with Option XSSC.
Enhanced Spread Spectrum Clock Option (Option STR
and/or Option XSSC)
|
Characteristic
|
Description
|
|
Adds a modulator directly to the synthesizer clock
output – modulation affects main and sub-rate clock output (regardless
of the state of sub-rate output select), Data Output, and Trigger
Output.
|
|
Modes
|
SSC or Phase Modulation (sinusoidal)
|
|
Data Rate Range
|
Full range of BERTScope
|
|
SSC Wave Shape
|
Triangle or Sine
|
|
SSC Frequency Range
|
20 kHz to 40 kHz
|
|
SSC Modulation Range
|
12,500 ppm at 6 Gb/s
6,200 ppm at 12 Gb/s
6,000 ppm
at 12.5 Gb/s and above
See Maximum SSC Modulation graph for
range at lower clock rates
|
|
SSC Modulation Resolution
|
1 ppm
|
|
SSC Modulation Type
|
Down Spread, Center Spread, Up Spread
|
|
PM Frequency Range
|
10 Hz - 160 kHz
|
|
PM Frequency Resolution
|
1 Hz
|
PM Modulation Range – For modulation
frequency 10 Hz - 2 kHz
|
Data Rate
|
Maximum Modulation
|
|
>6 Gb/s
|
6000 UI
|
|
3 to 6 Gb/s
|
3000 UI
|
|
1.5 to 3 Gb/s
|
1500 UI
|
|
0.75 to 1.5 Gb/s
|
750 UI
|
|
375 to 750 Mb/s
|
375 UI
|
|
187 to 375 Mb/s
|
187.5 UI
|
|
100 to 187 Mb/s
|
93.75 UI
|
|
Reduced for modulation frequencies >2 kHz. See
Phase Modulation Range graph.
|
F/2 Jitter Generation Option (Option
F2, also requires Option STR)
|
Characteristic
|
Description
|
|
F/2 or sub-rate jitter is found in high data rate
systems which multiplex up 2 or more lower data rate streams. The
jitter results for lack of symmetry in the multiplexing clock, giving
all of the even bits different pulse width than the odd bits. Unlike
conventional DCD, F/2 jitter is independent of the logic state of
the bit. F/2 jitter is part of the stress recipe used in testing compliance
to some of the newer standards such as 802.3ap (10 Gb backplane Ethernet).
|
|
Supported Data Rates
|
8.0 and 10.3125 Gb/s
|
|
Modulation Range
|
0-5.0% UI
|
Extended Stress Generation Option (Option PCISTR)
|
Characteristic
|
Description
|
|
This option adds additional stress generators
required for compliance testing receivers to PCIe 2.0 specifications,
internal to the BERTScope.
|
|
Clock Frequency Range
|
Up to 11.2 Gb/s
|
|
LFRJ Modulation Range
|
0-1.1 ns*4
|
|
LFRJ Frequency Range
|
Band-limited to 10 kHz - 1.5 MHz, with roll off to PCIe 2.0
specifications
|
|
LFSJ Modulation Range
|
0-368 ps*4 at 5 Gb/s
|
|
LFSJ Frequency Range
|
1-100 kHz
|
*4 Can be combined with other low-frequency
modulation.
|
Characteristic
|
Description
|
|
The Extended Stress option also adds selectable
bandwidth-limiting to the normal, broadband RJ generator.
|
|
RJ Frequency, Normal Mode
|
Band-limited to 10 MHz - 1 GHz
|
|
RJ Frequency, PCIE Mode
|
Band-limited to 1.5-100 MHz with roll off to PCIe 2.0 specifications
|
Error Detector
Clock and Data
Inputs
Clock Input
|
Characteristic
|
Description
|
|
Configuration
|
Single ended
|
|
Frequency Range
|
|
BSA85C
|
0.1-8.5 GHz
|
|
BSA125C
|
0.1-12.5 GHz
|
|
BSA175C
|
0.5-17.5 GHz*5
|
|
BSA260C
|
1-26 GHz*5
|
*5 A full- or half-rate clock may be used
for data rates above 11.2 Gb/s.
Data and Clock Interfaces
|
Characteristic
|
Description
|
|
Connector
|
APC-3.5 Planar Crown®
|
|
Impedance
|
50 Ω
|
|
Threshold Voltage
|
–2 to +3.5 V
|
|
Threshold Presets
|
LVPECL, LVDS, LVTTL, CML, ECL, SCFL
|
|
Terminations
|
Variable, –2 V to +3 V
Presets: +1.5, +1.3, +1, 0,
–2 V, AC coupled
|
|
Max Nondistructible Input
|
–3 Vpeak, +4 Vpeak, applied to any connector
|
Clock/Data Delay
|
Characteristic
|
Description
|
|
Range
|
(Greater than 1 bit period in all cases)
|
|
Up to 1.1 GHz
|
30 ns
|
|
Above 1.1 GHz
|
3 ns
|
|
Resolution
|
100 fs
|
|
Self Calibration
|
Supported – At time of measurement, when temperature or bit
rate are changed, instrument will recommend a self calibration. Operation
takes less than 10 seconds
|
Data Inputs
|
Characteristic
|
Description
|
|
Date Rate Range
|
|
BSA85C
|
0.1-8.5 Gb/s
|
|
BSA125C
|
0.1-12.5 Gb/s
|
|
BSA175C
|
0.5-17.5 Gb/s
|
|
BSA260C
|
1-26 Gb/s
|
|
Configuration
|
Differential
|
|
Format
|
NRZ
|
|
Polarity
|
Normal or Inverted
|
|
Threshold Alignment
|
Can auto-align to differential crossing point
|
|
Sensitivity
|
|
Single ended
|
100 mVp-p (typical)
|
|
Differential
|
50 mVp-p (typical)
|
|
Maximum input signal swing
|
2 Vp-p
|
|
Intrinsic Transition Time
|
16 ps typical, 10/90%, single ended (equivalent to >20 GHz
detector bandwidth). Measured at input, ECL levels
|
|
Patterns
|
|
Hardware patterns
|
Industry-standard Pseudo-random (PRBS) of the following types:
2n – 1 where n = 7, 11, 15, 20, 23, 31
|
|
RAM patterns
|
|
User defined
|
128 bits to 128 Mb, 128-bit increments
|
|
Library
|
Wide variety including SONET/SDH, Fibre Channel based such
as k28.5, CJTPAT; 2n patterns where n = 3, 4, 5, 6, 7,
9; Mark Density patterns for 2n where n = 7, 9, 23; and
many more
|
|
RAM Pattern Capture
|
Capture incoming data up to 128 Mb in length. Edit captured
data, send to pattern generator, error detector, or both
|
|
Capture modes
|
|
Capture by length
|
1 to 1,048,576 words. 1-word default. Words 128 bit in length
|
|
Capture by triggers
|
Captures when “Detector Start” on rear panel goes high, to
maximum allowable length or until input goes low
|
|
Capture by length from trigger
|
Capture by length initiated from “Detector Start” input, to
pre-specified length
|
|
Synchronization
|
|
Auto-resync
|
User-specified number of 128 bit words containing 1 or more
errors per word initiates a re-sync attempt
|
|
Manual
|
User initiates re-sync
|
|
Pattern matching
|
|
Grab ‘n’ Go
|
Error detector captures specified pattern length and compares
next instances to find match (Fast method, but susceptible to ignoring
logical errors)
|
|
Shift-to-Sync
|
Error detector compares incoming pattern with reference RAM
pattern, looks for match, if none found shifts pattern by one bit
and compares again (Slower but most accurate method)
|
|
Error Detector Basic Measurements
|
BER, Bits Received, Re-syncs, Measured Pattern Generator and
Error Detector Clock Frequencies
|
Error Detector Ancillary Connections
Front-panel Error Detector Connections
Error
Correlation Marker Input (Error Analysis)
|
Characteristic
|
Description
|
|
Allows an external signal to provide a time-tagged
marker to be placed in the error data set.
|
|
Logic Family
|
LVTTL (<0.5 V Low, >2.5 V High)
|
|
Threshold
|
+1.2 V
|
|
Minimum Pulse Width
|
128 clock periods
|
|
Maximum Repetition Rate
|
512 serial clock periods
|
|
Maximum Frequency
|
<4000 markers/s recommended
|
|
Interface
|
BNC female, >1 kΩ impedance into 0 V
|
Blank Input
BERTScope Burst Analysis Timing – BERTScope word size is
128 bits. An example timing diagram is shown here for a PRBS payload.
Counting of bits will not start until a 128-bit word boundary occurs,
meaning that after the blanking pulse transitions, up to 127 bits
may pass before synchronization begins. For a PRBS, synchronization
typically takes 5 words, or 640 bits. Similarly, bit measurement will
continue for up to 127 bits after the blanking signal transitions
again. RAM-based patterns take longer to synchronize.
|
Characteristic
|
Description
|
|
Useful for recirculating loop fiber experiments
or during channel training sequences. Causes errors to be ignored
when active. Bit count, error count, and BER not counted. No re-sync
occurs when counting is re-enabled.
|
|
Logic Family
|
LVTTL (<0.5 V Low, >2.5 V High)
|
|
Threshold
|
+1.2 V
|
|
Minimum Pulse Width
|
128 clock periods
|
|
Maximum Repetition Rate
|
512 serial clock periods
|
|
Interface
|
BNC female, >1 kΩ impedance into 0 V
|
Error Output
|
Characteristic
|
Description
|
|
Provides a pulse when an error is detected. Useful
for triggering an alarm while doing long-term monitoring, etc.
|
|
Minimum Pulse Width
|
128 clock periods
|
|
Transition Time
|
<500 ps
|
|
Output Levels
|
1000 mV nominal (0 V to 1 V low-high)
|
|
Interface
|
SMA female
|
Trigger Output
|
Characteristic
|
Description
|
|
Provides a pulse trigger to external test equipment.
It has two modes:
1. Divided Clock Mode: Pulses at 1/256th
of the clock rate.
2. Pattern Mode: Pulse at a programmable
position in the pattern (PRBS), or fixed location (RAM patterns).
|
|
Minimum Pulse Width
|
128 clock periods (Mode 1)
512 clock periods (Mode
2)
|
|
Transition Time
|
<500 ps
|
|
Output Levels
|
>300 mV amplitude, 650 mV offset
|
|
Interface
|
50 Ω SMA female
|
Rear-panel Error Detector Connections
Detector Start Input*6
|
Characteristic
|
Description
|
|
Used to trigger the acquisition of incoming data
into the error detector reference pattern memory. High level starts
capture.
|
|
Amplitude
|
LVTTL (<0.5 V Low, >2.5 V High)
|
|
Threshold
|
+1.2 V
|
|
Minimum Pulse Width
|
128 serial clock periods
|
|
Maximum Repetition Rate
|
512 serial clock periods
|
|
Interface
|
SMA female, >1 kΩ impedance into 0 V
|
*6 Not present for BERTScope CPG models.
User Interfaces
Taking Usability to New Heights
UI Setup Screens
- Easy navigation
- Logical layout and operation
- Multiple
ways of moving between screens
- Relevant information right
where you need it
- Color coding to alert you to the presence
of nonstandard conditions
Editor Screen
Editor Screen
- Used for
pattern editing of standard and AB Page Select patterns, also mask
editing
- Views in Binary, Decimal, or Hexadecimal
- Support for variable assignments, repeat loops, seeding of PRBS patterns
- Capture and editing of incoming data – for example, to make
a repeating pattern out of real-world traffic
- Capture
is available by trigger, by length, or by length following a trigger
- Capture is by number or words, 1 word is 128 bits. For example,
a PRBS-7 (127 bits long) would be captured as 127 words, and would
have overall length of 16,256 bits
BERTScope
Built-in Parametric Measurements
All BERTScopes come with
eye diagrams and mask test capabilities as standard, along with error
analysis.
Eye Diagram
- 280×350 pixel waveform
display
- Deep acquisition
- Automatic Measurements
include:
- Rise Time
- Fall Time
- Unit
Interval (Data, and also Clock)
- Eye Amplitude
- Noise
Level of 1 or 0
- Eye Width
- Eye Height
- Eye
Jitter (p-p and RMS)
- 0 Level, 1 Level
- Extinction
Ratio
- Vertical Eye Closure Penalty (VECP)
- Dark Calibration
- Signal-to-Noise Ratio
- Vp-p, Vmax, Vmin, Crossing Levels
- Rising and Falling Crossing
Level (picoseconds)
- Overshoot 0 Level and 1 Level
- Average Voltage/Power
- Cross Amplitude, Noise Level 1 or
0, Voltage
- Optical Modulation Amplitude (OMA)
- Sample
Count
- Offset Voltage
- De-emphasis Ratio
Mask Testing
- Library of standard
masks (e.g. XFP, or edit custom masks)
- Addition of positive
or negative mask margin
- Import of measured BER Contour to
become process control mask
- At least 1000x the sample depth
of traditional sampling oscilloscope masks is ideal for ensuring the
absence of rare event phenomena
Optical Units
An external optical receiver may be added to the input of
the BERTScope detector. Through the user interface it is easy to input
and save the characteristics of the receiver. Once accomplished, relevant
units on physical layer displays are changed to optical power in dBm,
μW, or mW. Coupling may be AC or DC, and the software steps the user
through dark calibration.
For electrical signals, attenuation
values can be entered to properly scale eye diagrams and measurements
when external attenuators are used.
Variable-depth Eye
and Mask Testing
For eye diagrams and mask testing, the
depth of test may be varied in manual mode; the instrument will take
the specified number of waveforms then stop. The range is 2,000 to
1,000,000 bits (complete waveforms). Alternatively, the default mode
is Continuous, and the eye or mask test increases in depth over time.
Physical Layer Test Option
BER Contour Testing
- Executed with same acquisition circuitry as eye diagram
measurements for maximum correlation
- As-needed delay calibration
for accurate points
- Automatic scaling, one-button measurement
- Extrapolates contours from measured data, increasing measurement
depth with run time and repeatedly updating curve fits
- Easy
export of fitted data in CSV format
- Contours available from
10–6 to 10–16 in decade steps
Basic Jitter Measurements
- Testing to T11.2
MJSQ BERTScan methodology (also called ‘Bathtub Jitter’)
- Deep measurements for quick and accurate extrapolation of Total Jitter
at user-specified level, or direct measurement
- Separation
of Random and Deterministic components, as defined in MJSQ
- As-needed delay calibration for accurate points
- Easy export
of points in CSV format
- Easy one-button measurement
- User-specified amplitude threshold level, or automatic selection
- Selectable starting BER to increase accuracy when using long
patterns, as defined in MJSQ
Q-factor Measurement
- One-button measurement of a vertical cross section
through the middle of the eye
- Easy visualization of system
noise effects
- Export of data in CSV format
Compliance Contour
- Validation of transmitter
eye performance to standards such as XFP/XFI and OIF CEI
- Overlay compliance masks onto measured BER contours and easily see
whether devices pass the BER performance level specified
Live Data Analysis Option
The Live Data option is designed
to measure parametric performance of traffic that is either unknown
or non-repeating. This can include traffic with idle bits inserted
such as in systems with clock rate matching. It is also suitable for
probing line cards, etc.
The option uses one of the two front-end
decision circuits to decide whether each bit is a one or zero by placing
it in the center of the eye. The other is then used to probe the periphery
of the eye to judge parametric performance. This method is powerful
for physical layer problems, but will not identify logical problems
due to protocol issues, where a zero was sent when it was intended
to be a one.
Live data measurements can be made using BER Contour,
Jitter Peak, Jitter Map, and Q-factor. Eye diagram measurements can
be made on live data without the use of this option, providing a synchronous
clock is available.
The Live Data Analysis option requires
the Physical Layer Test option and must be used with a full-rate clock.
PatternVu Equalization Processing Option
PatternVu*7 adds several powerful processing functions to the BERTScope:
CleanEye
is an eye diagram display mode, which
averages waveform data to present an eye diagram with the non-data-dependent
jitter removed. This allows the user to view and measure data-dependent
jitter such as Inter-Symbol Inference, giving an intuitive idea of
the compensatable jitter present, for example. It is effective on
any repeating pattern up to 32,768 bits long.
Single Value
Waveform Export is a utility which converts the CleanEye output
to an export file in Comma Separated Vector (CSV) format. The output
file, of up to 105 bit points, can then be imported into
Microsoft Excel or software analysis and simulation tools such as
Stateye or MATLAB®. This allows offline filtering of real
captured data and the implementation of standards-based processing
such as Transmitter Waveform Dispersion Penalty (TWDP) required by
802.3aq, the recent Long Reach MultiMode (LRM) 10 Gb Ethernet standard.
The
FIR Filter
equalization processor allows
the emulation of the communication channel to view and measure the
eye as the detector in the receiver would, by applying a software
linear filter to the data before it is displayed. For example, the
FIR Filter can be used to emulate the lossy effects of a backplane
channel, or alternatively, emulate the receiver’s equalization filter,
facilitating the design and characterization of receiver-side equalization.
The filter characteristics are controlled by entering the individual
weighting coefficients of a series of taps in the FIR filter. Up to
32 taps with tap spacing from 0.1 to 1.0 unit intervals (UI) can be
programmed to allow fine resolution of the filter shape. The FIR Filter
can be applied to repeating patterns up to 32,768 bits long.
Single Edge Jitter Measurement
allows truly deep
BER-based jitter measurements to be applied to individual data edges
at data rates above 3 Gb/s. The Single Edge Jitter Peak measurement
function enables computation of jitter on a user-selectable single
edge in the pattern, for repeating patterns up to 32,768 bits long.
The resulting jitter measurement excludes data-dependent effects,
showing only the uncorrelated jitter components such as Random Jitter
(RJ), Bounded Uncorrelated Jitter (BUJ), and Periodic Jitter (PJ).
Flexible Measurements
enables users to specify
exactly the portion of the CleanEye waveform to use for accurate measurement
of amplitude, rise and fall time, and de-emphasis ratio. Preprogrammed
formulas for standards such as PCI Express and USB 3.0 are included.
*7 PatternVu operates at data rates of 900 Mb/s and
higher.
Error Analysis
Error analysis is a powerful
series of views that associate error occurrences so that underlying
patterns can be easily seen. It is easy to focus in on a particular
part of an eye diagram, move the sampling point of the BERTScope there,
and then probe the pattern sensitivity occurring at that precise location.
For example, it is straightforward to examine which patterns are responsible
for late or early edges.
Many views come standard with the
BERTScope Family.
Analysis Views
Error Statistics view showing link performance in terms
of bit and burst occurrences.
Strip Chart view showing bit and burst error performance
over time. This can useful while temperature cycling as part of troubleshooting,
for example.
The Pattern Sensitivity
view is a powerful way of examining whether error events are pattern
related. It shows which pattern sequences are the most problematic,
and operates on PRBS and user-defined patterns.
-
Error Statistics: A tabular display of bit and
burst error counts and rates
-
Strip Chart: A strip
chart graph of bit and burst error rates
-
Burst Length: A histogram of the number of occurrences of errors of different
lengths
-
Error Free Interval: A histogram of the number
of occurrences of different error-free intervals
-
Correlation: A histogram showing how error locations correlate to user-set block
sizes or external marker signal inputs
-
Pattern Sensitivity: A histogram of the number of errors at each position of the bit
sequence used as the test pattern
-
Block Errors: A
histogram showing the number of occurrences of data intervals (of
a user-set block size) with varying numbers of errors in them
Error Location Capture
|
Characteristic
|
Description
|
|
Live Analysis
|
Continuous
|
|
Error Logging Capacity
|
Max. 2 GB file size
|
|
Error Events/Second
|
10,000
|
|
Maximum Burst Length
|
32 kb
|
Error Analysis Options
Forward
Error Correction Emulation
Because of the patented error
location ability of the BERTScope, it knows exactly where each error
occurs during a test. By emulating the memory blocks typical of block
error correcting codes such as Reed-Solomon architectures, bit error
rate data from uncorrected data channels can be passed through hypothetical
error correctors to find out what a proposed FEC approach would yield.
Users can set up error correction strengths, interleave depths, and
erasure capabilities to match popular hardware correction architectures.
2-D Error Mapping
This analysis creates a two-dimensional
image of error locations from errors found during the test. Error
mapping based on packet size or multiplexer width can show if errors
are more prone to particular locations in the packet or particular
bits in the parallel bus connected to the multiplexer. This visual
tool allows for human eye correlation, which can often illuminate
error correlations that are otherwise very difficult to find – even
with all the other error analysis techniques.
Jitter Tolerance
Template Option
Many standards call for SJ to be stepped through
a template with different SJ amplitudes at particular modulation frequencies.
This is easy with the built-in Jitter Tolerance function which automatically
steps through a template that you designed, or one of the many standard
templates in the library.
Standard Library of Templates
- 10GBASE LX4 802.3ae 3.125 Gb/s
- 10 GbE 802.3ae
10.3125 Gb/s
- 40 GbE 802.3ba LR4 10.3125 Gb/s
- 100
GbE 802.3ba LR4/ER4 25.78125 Gb/s
- CEI 11G Datacom Rx Ingress
(D) 11 Gb/s
- CGE Telecom Rx Egress (Re) 11 Gb/s*8
- CEI 11G Telecom Rx Ingress (Ri) 11 Gb/s*8
- CEI 11G Total Wander 11.1 Gb/s
- CEI 11G Total Wander
9.95 Gb/s
- CEI 6G Total Wander 4.976 Gb/s
- CEI 6G
Total Wander 6.375 Gb/s
- CEI 25G Total Wander 25.78125 Gb/s
- FBB DIMM1 3.2 Gb/s
- FBB DIMM1 4.0 Gb/s
- FBB
DIMM1 4.8 Gb/s
- FBB DIMM2 3.2 Gb/s
- FBB DIMM2 4.0 Gb/s
- FBB DIMM2 4.8 Gb/s
- Fibre Channel 1.0625 Gb/s
- Fibre Channel 2.125 Gb/s
- Fibre Channel 4.25 Gb/s
- Fibre Channel 8G 8.5 Gb/s
- Fibre Channel 16G 14.025 Gb/s
- OTN OTU-1 2.666G*8
- OTN OTU-2 10.709 Gb/s
- OTN(10BASE-R) 11.1 Gb/s
- SAS (SCSI) 1.5 Gb/s
- SAS (SCSI) 3 Gb/s
- SDH 0.172 STM-1 155M*8
- SDH 0.172 STM-16 2.4832 Gb/s*8
- SDH 0.172
STM-4 622 Mb/s*8
- SDH 0.172 STM-64 9.956 Gb/s*8
- SDH STM-16 2.48832 Gb/s*8
- SDH STM-64 9.9532 Gb/s*8
- SONET OC-48 2.48832 Gb/s*8
- SONET OC12 622 Mb/s*8
- SONET
OC192 9.9532 Gb/s*8
- SONET OC192 9.95 Gb/s*8
- SONET OC3 155 Mb/s*8
- SONET
OC48 2.4832 Gb/s*8
- USB 3.0 5 Gb/s
- XAUI
3.125 Gb/s
- XFI ASIC Rx In Datacom (D) 10.3125 Gb/s
- XFI ASIC Rx In Datacom (D) 10.519 Gb/s
- XFI ASIC Rx In Telecom
(D) 10.70 Gb/s
- XFI ASIC Rx In Telecom (D) 9.95328 Gb/s*8
- XFI Host Rx In Datacom (C) 10.3125 Gb/s
- XFI Host Rx In Datacom (C) 10.519 Gb/s
- XFI Host Rx In Telecom
(C) 10.70 Gb/s*8
- XFI Host Rx In Telecom (C) 9.95328 Gb/s*8
- XFI Module Tx In Datacom (B') 10.3125 Gb/s
- XFI Module Tx In Datacom (B') 10.519 Gb/s
- XFI Module
Tx In Telecom (B') 10.70 Gb/s*8
- XFI Module Tx
In Telecom (B') 9.95328 Gb/s*8
Some
of the areas of adjustment include:
- BER confidence
level
- Test duration per point
- BER threshold
- Test device relaxation time
- Imposition of percentage
margin onto template
- Test precision
- Control over
A/B Pattern switch behavior
Also included is the ability
to test beyond the template to device failure at each chosen point,
and the ability to export data either as screen images or CSV files.
*8 Requires Option XSSC.
Jitter Map Option
Automated Jitter Decomposition with Long Pattern Jitter Triangulation
Jitter Map*9 extends BER-based jitter decomposition
beyond Dual Dirac measurement of Total Jitter (TJ), Random Jitter
(RJ), and Deterministic Jitter (DJ) to a comprehensive set of subcomponents.
It can also measure and decompose jitter on extremely long patterns,
such as PRBS-31, providing that it can first run on a shorter synchronized
data pattern.
Features include:
- DJ breakdown
into Bounded Uncorrelated Jitter (BUJ), Data Dependent Jitter (DDJ),
Inter-Symbol Interference (ISI), Duty Cycle Distortion (DCD), and
Sub-Rate Jitter (SRJ)*10 including F/2 (or F2) Jitter
- BER based for direct (non-extrapolated) Total Jitter (TJ) measurement
to 10–12 BER and beyond
- Separation of correlated
and uncorrelated jitter components eliminates mistaking long pattern
DDJ for RJ
- Visualization of RJ RMS measured on individual
edges of the data pattern
- J2 and J9 jitter measurements for
100 GbE applications
- Additional levels of breakdown not available
from other instruments such as: Emphasis Jitter (EJ), Uncorrelated
Jitter (UJ), Data Dependent Pulse Width Shrinkage (DDPWS), and Non-ISI
- Intuitive, easy-to-navigate jitter tree
*9 Jitter Map operates at data rates of 900 Mb/s and higher.
*10 SRJ and F/2 Jitter operate up to 8.5 Gb/s (BSA85C),
11.2 Gb/s (BSA125C, BSA175C, BSA260C).
Stressed Live Data
Option
The BERTScope Stressed Live Data software option enables
engineers to add various types of stress to real data traffic in order
to stress devices with bit sequences representative of the environment
they will encounter once deployed. Using live traffic with added stress
tests the boundaries of device performance and lends added confidence
to designs before they are shipped.
- Pull range of calibrated
stress available on the BERTScope, including Sinusoidal Jitter (SJ),
Random Jitter (RJ), Bounded Uncorrelated Jitter (BUJ), Sinusoidal
Interference (SI), F/2 Jitter, and Spread Spectrum Clocking (SSC)
- Data rate support up to the maximum of the BERTScope
- Full-rate clock required up to 11.2 Gb/s, half-rate clock required
above 11.2 Gb/s
Symbol Filtering Option
Symbol
filtering enables asynchronous BER testing, including Jitter Tolerance
testing, on incoming data streams that have a nondeterministic number
of clock compensation symbols inserted into the bit stream, as is
common in 8b/10b encoded systems when placed in loopback for receiver
testing.
- Supports asynchronous receiver testing for USB
3.0, SATA, and PCI Express
- User-specified symbols are automatically
filtered from the incoming data to maintain synchronization
- The error detector maintains a count of filtered bits for accurate
BER measurement
- Operates at data rates up to 11.2 Gb/s
General
PC Related
|
Characteristic
|
Description
|
|
Display
|
TFT touch screen 640×480 VGA
|
|
Touch Sensor
|
Analog resistive
|
|
Processor
|
Pentium® P4 1.5 GHz or greater
|
|
Hard Disk
|
40 GB or greater
|
|
DRAM
|
1 GB
|
|
Operating System
|
Windows XP Professional
|
|
Remote Control Interfaces
|
IEEE-488 (GPIB) or TCP/IP
|
Supported Interfaces
- DVI/VGA display
- USB 2.0 (4 total, 2 front, 2 rear on BSA175;
1 front, 1 rear on other BERTScope models)
- 100BASE-T Ethernet
LAN
- IEEE-488 (GPIB)
- Parallel printer
- Serial
RS-232
- PS-2 mouse/keyboard combined connector
Physical
|
Dimension
|
mm
|
in.
|
|
Height
|
220
|
8.75
|
|
Width
|
394
|
15.5
|
|
Depth
|
520
|
20.375
|
|
Weight
|
kg
|
lb.
|
|
Instrument Only
|
25
|
55
|
|
Shipping
|
34.5
|
76
|
|
Other
|
|
Power
|
<450 W
|
|
Voltage
|
90 to 240 V AC, 50 to 60 Hz
|
Environmental
|
Characteristic
|
Description
|
|
Warm-up Time
|
20 minutes
|
|
Operating Temperature Range
|
10 to 40 °C
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Humidity
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Noncondensing at 40 °C, 15 to 95%
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Certifications
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EU EMC Directive (CE-Marked)
UL: Underwriters Labs
(US) Certification CSA (Canada)
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Support
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Characteristic
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Description
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Period
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1 year (extendable to 3 years with orderable option)
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Calibration Interval
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1 year
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