Active Probes

Features & Benefits

• Outstanding Electrical Performance
• High Probe Bandwidth
• Fast Probe Rise Time
• Excellent Signal Fidelity
• ≤0.8 pF Input Capacitance
• 40 kΩ Input Resistance
• –4 V to +4 V Input Dynamic Range
• –10 V to +10 VDC Input Offset Range
• ±30 V (DC + peak AC) Max Input Voltage (Nondestruct)
• Versatile Mechanical Performance
• Small Compact Probe Head for Probing Small Geometry Circuit Elements
• DUT Attachment Accessories Enable Connection to SMDs as Small as 0.5 mm Pitch
• Robust Design for Reliability

• Easy-to-Use
• Connects Directly to Oscilloscopes with the TekVPI™ Probe Interface
• Provides Automatic Units Scaling and Readout on the Oscilloscopes Display
• Easy Access to Oscilloscope Probe Menu Display for Probe Status/Diagnostic Information and to Control Probe DC Offset
• Remote GPIB/USB Probe Control through the Oscilloscope

Applications

• Verification, Debug, and Characterization of High-speed Designs
• Signal Integrity, Jitter, and Timing Analysis
• Manufacturing Engineering and Test
• Signals with Voltage Swings up to 8 V_pk-pk

Selecting the right probe for your application is key to attaining the best signal fidelity in your measurements. Active probes provide truer signal reproduction and fidelity for high-frequency measurements. With our ultra-low input capacitance and unique interface, the TAP2500 and TAP3500 Single-ended Active FET probes provide excellent high-speed electrical and mechanical performance required for today’s digital system designs.

Specifically designed for use and direct connection to oscilloscopes with the TekVPI™ probe interface, the TAP2500 and TAP3500 Active FET probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional problems:

• Lower DUT loading effects with ≤0.8 pF input capacitance and 40 kΩ input resistance
• Versatile DUT connectivity for attaching to small SMDs
• Preserves instrument bandwidth at the probe tip for up to 3.5 GHz oscilloscopes