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DSA8300 Digital Sampling Oscilloscope
The Ultimate in Signal Fidelity for Challenging High-Speed Characterization Tests
With an industry-leading intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155Mb/sec to 100G.
Models in the DSA8300 Digital Sampling Oscilloscope Series:
| Model | Analog Bandwidth | Sample Rate | Record Length | Analog Channels | List Price | Shop Online or Get a Quote |
|---|---|---|---|---|---|---|
|
DSA8300 Read Reviews Write Review |
DC - 80 GHz | Up to 300 kS/s | 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) | Determined by the sampling modules used, up to 8 channels | $28,700 | Configure & Quote |
Features | Benefits |
Electrical module signal measurement accuracy:
| <100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterization of high bit-rate signals (5th harmonic to data rates of 28 Gb/sec and 3rd harmonic to data rates >45 Gb/sec). |
Industry’s lowest system noise at all bandwidths:
| Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure. |
| Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe. | High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels. |
| Optical modules support optical compliance test of both 40 Gb/s and 100 Gb/s (4x25) Ethernet. | Provides cost-effective and versatile optical test system for 40 Gb and 100 Gb (4x25), IEEE 802.ba Ethernet standard. |
| Superior acquisition throughput with up to 300 kS/s maximum sample rate. | Reduced manufacturing or device characterization test-time by 4X with superior system throughput. |
| Ability to place the samplers adjacent to the device under test (DUT). | Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed. |
| Independent calibrated channel de-skew. | Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing. |
| Data Sheet | Probe | Description | Shop Online or Get a Quote |
|---|---|---|---|
| DVT30-1MM GigaProbe |
30 GHz TDR probe available from GigaProbes. |
Add to Quote | |
| View Datasheet | P8018 |
HANDHELD TDR PROBE, PASSIVE; 20 GHZ, SINGLE-ENDED, 50 OHM, SMA CONNECTOR WITH 20 GHZ SMA CABLE; DESIGNED TO WORK WITH 80A02 EOS/ESD PROTECTION MODULE; STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT |
Configure & Quote |
| View Datasheet | P80318 |
Probe kit,18GHz 100 Ohm Differential Hand Probe |
Configure & Quote |
| Data Sheet | Probe | Description | Shop Online or Get a Quote |
|---|---|---|---|
| View Datasheet | P6150 | Passive Probe: 10X/1X, 9GHz, 12.5V low capacitance | Configure & Quote |
| Data Sheet | Probe | Description | Shop Online or Get a Quote |
|---|---|---|---|
| View Datasheet | P7350 |
DIFFERENTIAL PROBE, 5 GHZ |
Configure & Quote |
| Data Sheet | Software Package / Software Option | Description | Shop Online or Get a Quote |
|---|---|---|---|
| View Datasheet | 80SICMX | ICONNECT AND MEASUREXTRACTOR SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE | Configure & Quote |
| View Datasheet | 80SICON | ICONNECT SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE | Configure & Quote |
| View Datasheet | 80SJNB, 80SJARB |
Jitter, Noise, and BER Analysis Software. |
Contact Account Manager |
| View Datasheet | 80SSPAR | ICONNECT S-PARAMETERS AND Z-LINE SOFTWARE | Configure & Quote |
| Data Sheet | Module | Description |
|---|---|---|
| View Datasheet | 80A02 |
EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT
|
| View Datasheet | 80A03 | TEKCONNECT PROBE INTERFACE MODULE |
| View Datasheet | 80A05 |
ELECTRICAL CLOCK RECOVERY MODULE |
| View Datasheet | 80C07B | OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH |
| View Datasheet | 80C08D |
Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode |
| View Datasheet | 80C10C |
Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3) |
| View Datasheet | 80C11B |
Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode |
| View Datasheet | 80C12B |
12 GHz, Broad WaveLength, Amplified Optical Sampling Module |
| View Datasheet | 80C14 |
14+ GHz, Broad WaveLength, Amplified Optical Sampling Module |
| View Datasheet | 80E01 | 50GHZ; 1 CHANNEL, ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| View Datasheet | 80E03 |
SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| View Datasheet | 80E04 | SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| View Datasheet | 80E07B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1) |
| View Datasheet | 80E08B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) |
| View Datasheet | 80E09B | 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1) |
| View Datasheet | 80E10B | 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) |
| View Datasheet | 80E11 | 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) |
| View Datasheet | 80E11X1 | 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) |
| 80N01 | 2 METER ELECTRICAL MODULE EXTENDER CABLE (NOT FOR 80E07-10). | |
| View Datasheet | 82A04B | 8000 Series, Phase Reference Module (includes D1) |
| Title |
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Power Measurements: So many tests+ so little time.This poster outlines the different power measurements including switching device measurements, magnetics measurements, power quality measurements, and pre-compliance measurements and reporting. |
Highly Reliable Testing of 10-Gb/s Systems (STM-64/OC-192)The growth of the Internet, e-commerce, virtual private networks, IP telephony, and other data-centric applications, is prompting a demand for increased bandwidth. To keep up, network providers are being forced to move quickly from 2.5-Gb/s to 10-Gb/s system deployment. |
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2012 Test and Measurement SolutionsThis 44-page catalog covers key product information, applications, and quick-reference selection charts on our complete range of Oscilloscopes, Logic Analyzers, Signal Generators, Real-Time Spectrum Analyzers and software solutions. |
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Low Frequency Active Harmonic Load-Pull MeasurementsUnleashing Active Load Pull and Waveform Engineering at UHF Frequencies |
Automating DisplayPort Compliance MeasurementsThis webinar will provide engineers with an update on DisplayPort Serial Bus technology and recommended measurement approaches for compliance testing. |
PHY Layer Testing for MIPI DPHY & MPHY Bus ComplianceLearn how to setup and perform verification and debug tests on the electrical PHY Layer for DPHY and MPHY serial interconnects as specified by the MIPI Alliance for mobile device designs. |
Verification and Compliance Testing of 10Gb/sec Thunderbolt DesignsLearn about the Thunderbotl technology, tests and challenges, and how Tektronix supports this emerging technology |
Jitter and Noise Measurements in Presence of CrosstalkTesting High Speed Serial Buses for evidence of jitter is critical for higher yields and stable design. |
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HDMI/DVI Method Of Implementation (MOI)Procedures Guide for HDMI Sink Instruments Differential Impedance Measurements using the Tektronix TDS/DSA8200 and Sampling Module 80E04 |
DSA8300 Digital Sampling Oscilloscope Related Information
PHY Layer Testing for 100G
In this application note, learn how to prepare for compliance measurements on 100G standards including IEEE802.3ba and the tests that help diagnose noncompliant components and systems.
Learn how to test 16 GB Fibre Channel
Study the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces.
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