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DSA8300 Digital Sampling Oscilloscope
The Ultimate in Signal Fidelity for Challenging High-Speed Characterization Tests
With industry leading native jitter of less than 450 fs RMS, the highest TDR bandwidth, the fastest S-Parameter measurements and comprehensive support for Optical Communications Standards, the DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform.
Models in the DSA8300 Series:
| Model | Analog Bandwidth | Sample Rate | Record Length | Analog Channels | List Price | Shop Online or Get a Quote |
|---|---|---|---|---|---|---|
|
DSA8300 Read Reviews Write Review |
DC - 70 GHz | Up to 300 kS/s | 50 point - 3.2M point | Determined by the samplingmodules used, up to 8 channels | $28,100 | Configure |
Features | Benefits |
| Up to 4 true differential channels with industry's lowest noise floor (450 fs) and highest vertical (16 bit) resolution | Accurately characterize silicon and backplane/connector designs with confidence using true differential TDR stimulus in a measurement system capable of high resolution and low noise for good signal visibility. |
| Accurate TDR with High bandwidth (50 GHz) Time Domain Reflectometry using Remote Sampling Heads | Resolve impedance discontinuities down to 1mm with a 12ps incident step using remote sampling heads which minimizes the effects of probes, cables, and fixtures by bringing the TDR head close to the device under test |
| Optical modules provide the bandwidth, sensitivity, noise performance, and return loss (signal fidelity) for all standard rates from 155 Mb/s to 100 Gb/s. | Accurate, repeatable characterization of ITU and Ethernet designs 155 Mb/s to 40 to 100 Gb/s; and beyond |
| Software package options for Serial Data Network, Serial Data Link, and Jitter/Noise Analysis | Reduce cost of test by combining time and frequency domain analysis with a single instrument. Accurately analyze signal paths to predict signal crosstalk and jitter to ensure reliable system operation. Determine precise causes of eye closure with jitter, noise, and BER analysis |
| Fully Integrated Pattern Synchronization Triggering | Integrated high speed trigger functionality for the most demanding digital/logic patterns ensure accurate capture |
| Tightly integrated clock recovery functionality for accurate eye diagram analysis | Supports both fully integrated clock recovery or clock recovery trigger pickoff which, when used with Tektronix or 3rd party clock recovery instruments, provides a calibrated solution supporting 155 Mb/s to 100 Gb/s signaling. |
| Data Sheet | Probe | Description | Shop Online or Get a Quote |
|---|---|---|---|
| DVT30-1MM GigaProbe |
30 GHz TDR probe available from GigaProbes. |
||
| View Datasheet | P8018 |
HANDHELD TDR PROBE, PASSIVE; 20 GHZ, SINGLE-ENDED, 50 OHM, SMA CONNECTOR WITH 20 GHZ SMA CABLE; DESIGNED TO WORK WITH 80A02 EOS/ESD PROTECTION MODULE; STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT |
Configure |
| View Datasheet | P80318 |
Probe kit,18GHz 100 Ohm Differential Hand Probe |
Configure |
| Data Sheet | Probe | Description | Shop Online or Get a Quote |
|---|---|---|---|
| View Datasheet | P6150 |
PROBE,PASSIVE; 9GHZ,10X,50 OHM,1M,SMA CONN - STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT |
Configure |
| Data Sheet | Probe | Description | Shop Online or Get a Quote |
|---|---|---|---|
| View Datasheet | P7350 |
DIFFERENTIAL PROBE, 5 GHZ |
Configure |
| View Datasheet | P7380SMA |
8 GHZ DIFFERENTIAL SIGNAL ACQUISITION SYSTEM WITH SMA INPUTS,CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
Configure |
| Data Sheet | Software Package / Software Option | Description | Shop Online or Get a Quote |
|---|---|---|---|
| View Datasheet | 80SICMX | ICONNECT AND MEASUREXTRACTOR SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE | Configure |
| View Datasheet | 80SICON | ICONNECT SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE | Configure |
| View Datasheet | 80SJNB, 80SJARB |
Jitter, Noise, and BER Analysis Software. |
Contact Account Manager |
| View Datasheet | 80SSPAR | ICONNECT S-PARAMETERS AND Z-LINE SOFTWARE | Configure |
| Data Sheet | Module | Description |
|---|---|---|
| View Data Sheet | 80A02 | EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT |
| View Data Sheet | 80A03 | TEKCONNECT PROBE INTERFACE MODULE |
| View Data Sheet | 80A05 | ELECTRICAL CLOCK RECOVERY MODULE |
| View Data Sheet | 80A06 | Pattern Sync TRIGGER MODULE |
| View Data Sheet | 80C07B | OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH |
| View Data Sheet | 80C08C | OPTICAL SAMPLING MODULE; 9.953/10.31 GB/S 10 GBE,10.51875 GB/S 10GFC,10.664 GB/S G.975,10.71 GB/S G.709,11.1 GB/S 10 GBE FEC;10 GHZ OPTICAL BANDWITH |
| View Data Sheet | 80C10B | OPTICAL MODULE; 39.813/43.018 GBPS/80 GHZ |
| View Data Sheet | 80C11 | OPTICAL SAMPLING MODULE; 9.953/10.31/10.52/10.66/10.71/11.1 GB/S;28 GHZ OPTICAL BANDWIDTH |
| View Data Sheet | 80C12B | 12 GHz, Broad WaveLength, Amplified Optical Sampling Module |
| View Data Sheet | 80C14 | 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module |
| View Data Sheet | 80C25GBE | Optical Sampling module with 27.5 GHz and 25.8 GHz,Optical Reference Receiver settings |
| View Data Sheet | 80E01 | 50GHZ; 1 CHANNEL, ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| View Data Sheet | 80E03 | SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| View Data Sheet | 80E04 | SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| View Data Sheet | 80E06 | ELECTRICAL; MODULE; OVER 70GHZ; 1 CHANNEL, ELECTRICAL SAMPLING MODULE; CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| View Data Sheet | 80E07 | REMOTE SAMPLING MODULE; DUAL CHANNEL, 30 GHZ ELECTRICAL - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| View Data Sheet | 80E08 | REMOTE SAMPLING MODULE; DUAL CHANNEL, 30 GHZ ELECTRICAL WITH TRUE DIFFERENTIAL TDR - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| View Data Sheet | 80E09 | REMOTE SAMPLING MODULE; DUAL CHANNEL, 60 GHZ ELECTRICAL - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| View Data Sheet | 80E10 | REMOTE SAMPLING MODULE; DUAL CHANNEL, 50 GHZ ELECTRICAL WITH TRUE DIFFERENTIAL TDR - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| Application | |
|---|---|
Extinction Ratio (ER) Calibrated White PaperThis white paper explains some of the benefits of highly accurate ER measurements in both 10 GbE (Ethernet), with its relatively low ER requirement, and in SONET/SDH, and the methodology that supports consistent, accurate ER result. |
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Equalization and Serial Data Link Analysis Methods (SDLA) with 80SJNB Advanced Application NoteDescribes the Equalization concept and SDLA methods using the 80SJNB. |
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TDR and S-parameter Measurements - How Much Performance Do You Need?How TDR-based measurement tools can provide you a quicker way to making s-parameter measurements over the traditional VNA. |
Time Domain Reflectometry (TDR) |
TDR Impedance Measurements: A Foundation for Signal IntegrityAt today’s high operating frequencies, anything that affects your signal’s rise time, pulse width, timing, jitter or noise content can impact reliability at the system level. |
Time Domain Reflectometry (TDR) |
Programmable Interface Changes Between Tektronix DSA8200 and DSA8300 SamplingThis document contains the summary of changes to the Programmable Interface (PI).Comments on GPIB and TekVisa |
|
High-speed Interconnects: Characterization and Measurement-based ModelingA primer that takes on the measurement issues of high-speed interconnects. |
Time Domain Reflectometry (TDR) |
Choose the Right Platform for Your Jitter MeasurementsThis document will explain some essential jitter terms, and then go on to discuss jitter measurements and the tools best suited for evaluating and quantifying jitter, when working with serial data communication architectures. |
Satellite and Radio Test Equipment |
Case Study: Freescale Semiconductor Uses Tektronix IConnect®Freescale Semiconductor establishes a new approach to the usual methodology adopted in modeling a Transmitter. |
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Jitter Fact SheetWhether you need a quick clock jitter measurement or a thorough analysis of a BER performance problem, Tektronix oscilloscopes and integrated software tools deliver. You can rapidly solve problems and meet your design goals and compliance requirements. |
Jitter Measurement and Timing Analysis |
Storage Solutions Fact SheetThis technology fact sheet describes the support for SATA and SAS PHY Layer Testing for Hosts, Devices and Cables from Tektronix. |
Storage |
| Application | |
|---|---|
2012 Test and Measurement SolutionsThis 44-page catalog covers key product information, applications, and quick-reference selection charts on our complete range of Oscilloscopes, Logic Analyzers, Signal Generators, Real-Time Spectrum Analyzers and software solutions. |
| Application | |
|---|---|
Low Frequency Active Harmonic Load-Pull MeasurementsUnleashing Active Load Pull and Waveform Engineering at UHF Frequencies |
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OM4000 Optical Coherent LightwaveLearn how to perform real-time processing of the Optical Signal to Noise (OSNR) sensitivity effects of a 100G system configuration with the Tektronix OM4000. |
Optical Communications Applications |
Verification and Compliance Testing of 10Gb/sec Thunderbolt DesignsLearn about the Thunderbotl technology, tests and challenges, and how Tektronix supports this emerging technology |
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Jitter and Noise Measurements in Presence of CrosstalkTesting High Speed Serial Buses for evidence of jitter is critical for higher yields and stable design. |
| Application | |
|---|---|
HDMI/DVI Method Of Implementation (MOI)Procedures Guide for HDMI Sink Instruments Differential Impedance Measurements using the Tektronix TDS/DSA8200 and Sampling Module 80E04 |
RELATED INFORMATION
Get your FREE Basics of Serial Data Primer
High-speed serial bus architectures are the new norm in today’s high-performance designs. To learn more download our FREE primer, The Basics of Serial Data Compliance and Validation Measurements.
Learn how to test 16 GB Fibre Channel
Study the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces.
Get your NEW Product Catalogs now!
Three short form Tektronix catalogs are available - Test and Measurement, Bench Products and Video Test.
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