DSA8300 Digital Sampling Oscilloscope

The Ultimate in Signal Fidelity for Challenging High-Speed Characterization Tests

With an industry-leading intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155Mb/sec to 100G.



Models in the DSA8300 Digital Sampling Oscilloscope Series: 

Model Analog Bandwidth Sample Rate Record Length Analog Channels List Price Configure and Quote
DSA8300 DC - 80 GHz Up to 300 kS/s 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) Determined by the sampling modules used, up to 8 channels $29,000 Configure & Quote

Features

Benefits

Electrical module signal measurement accuracy:
  • Ultra-low system jitter (<100 fs, typical)
  • > 70GHz
<100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterization of high bit-rate signals (5th harmonic to data rates of 28 Gb/sec and 3rd harmonic to data rates >45 Gb/sec).
Industry’s lowest system noise at all bandwidths:
  • 600 µV max (450 µV typ.) @ 60 GHz
  • 380 µV max (280 µV typ.) @ 30 GHz
Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure.
Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe.High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels.
Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4x25) Ethernet.Provides cost-effective and versatile optical test system for single and multi-mode optical standards from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, -LR4 and ER4) at 850, 1310 and 1550nm.
Superior acquisition throughput with up to 300 kS/s maximum sample rate.Reduced manufacturing or device characterization test-time by 4X with superior system throughput.
Ability to place the samplers adjacent to the device under test (DUT).Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed.
Independent calibrated channel de-skew.Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing.

 

Data Sheet Probe Description Configure and Quote
DVT30-1MM GigaProbe

30 GHz TDR probe available from GigaProbes.

Add to Quote
View Datasheet P8018 HANDHELD TDR PROBE, PASSIVE; 20 GHZ, SINGLE-ENDED, 50 OHM, SMA CONNECTOR WITH 20 GHZ SMA CABLE; DESIGNED TO WORK WITH 80A02 EOS/ESD PROTECTION MODULE; STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT Configure & Quote
View Datasheet P80318 Probe kit,18GHz 100 Ohm Differential Hand Probe Configure & Quote

Low Voltage Probe - Single Ended

Data Sheet Probe Description Configure and Quote
View Datasheet P6150 Passive Probe: 10X/1X, 9GHz, 12.5V low capacitance Configure & Quote

Differential Probe - Low Voltage

Data Sheet Probe Description Configure and Quote
View Datasheet P7330

PROBE; DIFFERENTIAL; 3.5 GHz BW, +/-1.75 V DIFFERENTIA.L DYNAMIC RANGE, +5V -4V COMMON MODE RANGE, 2.3 MV RMS NOISE AT INPUT, 5X ATTENTUATION - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD

Configure & Quote
View Datasheet P7350

DIFFERENTIAL PROBE, 5 GHZ

Configure & Quote
Data Sheet Software Package / Software Option Description Configure and Quote
View Datasheet 80SICMX ICONNECT AND MEASUREXTRACTOR SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE Configure & Quote
View Datasheet 80SICON ICONNECT SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE Configure & Quote
View Datasheet 80SJNB, 80SJARB

Jitter, Noise, and BER Analysis Software.

Contact Account Manager
View Datasheet 80SSPAR ICONNECT S-PARAMETERS AND Z-LINE SOFTWARE Configure & Quote
View Datasheet CEI-VSR

Automated Compliance and Debug Solution for CEI-28G-VSR testing software.

Contact Account Manager
View Datasheet Opt. JNB02

Jitter, Noise, and BER Analysis Software with SDLA Visualizer

Contact Account Manager
Data Sheet Module Description
View Datasheet 80A02 EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT
View Datasheet 80A03 TEKCONNECT PROBE INTERFACE MODULE
View Datasheet 80A05

ELECTRICAL CLOCK RECOVERY MODULE

80B28G

8000 Series - Electrical Sampling Scope Bundle to Support 25/28 Gb/s standards (includes 80E09B, 82A04B, CR286A and accessories)

View Datasheet 80C07B OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH
View Datasheet 80C08D

Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode

View Datasheet 80C10C Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3)
View Datasheet 80C11B Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode
View Datasheet 80C12B

12 GHz, Broad WaveLength, Amplified Optical Sampling Module

View Datasheet 80C14

14+ GHz, Broad WaveLength, Amplified Optical Sampling Module

View Datasheet 80C15 8000 Series Optical Module, 32GHz, single/multi-mode, broad wavelength
View Datasheet 80E03

SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD

View Datasheet 80E04 SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD
View Datasheet 80E07B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1)
View Datasheet 80E08B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1)
View Datasheet 80E09B 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1)
View Datasheet 80E10B 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1)
View Datasheet 80E11 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1)
View Datasheet 80E11X1 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1)
View Datasheet 82A04B 8000 Series, Phase Reference Module (includes D1)
Title

Understanding the impact of reference clock jitter on data jitter - and techniques for measurement and analysis

Electronic Products & Technology magazine

BUJ Jitter Measurements Using Tektronix Instrumentation

Jitter Fact Sheet

Whether you need a quick clock jitter measurement or a thorough analysis of a BER performance problem, Tektronix oscilloscopes and integrated software tools deliver. You can rapidly solve problems and meet your design goals and compliance requirements.

Physical Layer Tests of 100 Gb/s Communications Systems

Learn how to prepare for compliance measurements on 100G standards.

Choose the Right Platform for Your Jitter Measurements

This document will explain some essential jitter terms, and then go on to discuss jitter measurements and the tools best suited for evaluating and quantifying jitter, when working with serial data communication architectures.

Extinction Ratio (ER) Calibrated White Paper

This white paper explains some of the benefits of highly accurate ER measurements in both 10 GbE (Ethernet), with its relatively low ER requirement, and in SONET/SDH, and the methodology that supports consistent, accurate ER result.

Equalization and Serial Data Link Analysis Methods (SDLA) with 80SJNB Advanced Application Note

Describes the Equalization concept and SDLA methods using the 80SJNB.

TDR and S-parameter Measurements - How Much Performance Do You Need?

How TDR-based measurement tools can provide you a quicker way to making s-parameter measurements over the traditional VNA.

TDR Impedance Measurements: A Foundation for Signal Integrity

At today’s high operating frequencies, anything that affects your signal’s rise time, pulse width, timing, jitter or noise content can impact reliability at the system level.

Performing RIN and RIN OMA Measurements on the DSA8300 Sampling Oscilloscope

Title

2014 Test and Measurement Solutions

The 2014 catalog covers key product information, applications, and quick-reference selection charts on our complete range of Oscilloscopes, Logic Analyzers, Signal Generators, Real-Time Spectrum Analyzers, Digital Multimeters, Power Analyzers, Power Supplies, Frequency Counter/Timers and Signal Generators and software solutions.

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Low Frequency Active Harmonic Load-Pull Measurements

Unleashing Active Load Pull and Waveform Engineering at UHF Frequencies

TDR Analysis for S Parameter Creation

This webinar reviews TDR basics and the ability to create S-parameters using TDR/TDT measurements to validate high speed channels for debug or de-embedding in a Serial Data Link Analysis application.

Automating DisplayPort Compliance Measurements

This webinar will provide engineers with an update on DisplayPort Serial Bus technology and recommended measurement approaches for compliance testing.

PHY Layer Testing for MIPI DPHY & MPHY Bus Compliance

Learn how to setup and perform verification and debug tests on the electrical PHY Layer for DPHY and MPHY serial interconnects as specified by the MIPI Alliance for mobile device designs.

Verification and Compliance Testing of 10Gb/sec Thunderbolt Designs

Learn about the Thunderbotl technology, tests and challenges, and how Tektronix supports this emerging technology

Jitter and Noise Measurements in Presence of Crosstalk

Testing High Speed Serial Buses for evidence of jitter is critical for higher yields and stable design.

Title

HDMI/DVI Method Of Implementation (MOI)

Procedures Guide for HDMI Sink Instruments Differential Impedance Measurements using the Tektronix TDS/DSA8200 and Sampling Module 80E04

DSA8300 Digital Sampling Oscilloscope Related Information

PHY Layer Testing for 100G

PHY Layer Testing for 100GIn this application note, learn how to prepare for compliance measurements on 100G standards including IEEE802.3ba and the tests that help diagnose noncompliant components and systems.

Learn how to test 16 GB Fibre Channel

Characterizing an SFP+ Transceiver at the 16G Fibre Channel RateStudy the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces.

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