IV, CV and Ultra-fast Pulsed IV characterization for material and semiconductor device parameters

The 4200-SCS is a modular, fully integrated parameter analyzer that performs electrical characterization of materials, semiconductor devices and processes. Consisting of Source Measure Units for IV characterization, Capacitance-Voltage module for AC impedance measurements, and Ultra-fast Pulsed IV that performs waveform capture, and transient IV measurements, the 4200-SCS provides the researcher or engineer with critical parameters needed for materials research, semiconductor device design, development or production.