The task of isolating and eliminating signal integrity problems anywhere in the system is challenging.
Tektronix delivers the bandwidth and time-saving features you need to properly address high-speed signal deviations, quickly locate and trace faults back to their source, and eliminate schedule delays and reliability issues.
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Product Series |
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Learn the basics and benefits of logic analyzers - see how this tool can solve your debug challenges. |
TLA6000 |
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Understand the important signal acquisition and usability features of your oscilloscope to achieve quicker results. |
DPO7000 |
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This primer is to provide some insight into signal integrity-related problems in digital systems, and to describe their causes, characteristics, effects, and solutions. |
RSA5000 |
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Learn all about digital design debugging in our 16-page how-to guide. |
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This fact sheet discusses Tektronix' powerful and complete portfolio to overcome signal degradation challenges |
RSA3000 |
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With an increasing number of designs utilizing serial communications links between the microcontroller and the peripheral chips, you need a proven test solution to verify these serial buses are operating as expected. |
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Chapter 10 of the Signal Integrity Engineer's Companion discusses new techniques in wireless signal measurement and thought-provoking ideas about signal analysis in the modern wireless environment. Part VII covers applying real-time spectrum analysis. From embedded.com. |
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The ideal way to determine if a receiver is fit for an application is to test it with the worst signal it is likely to ever see. This paper shows how different types of stress arise in systems, how they can be applied to a receiver for diagnosing problems and then look at a typical serial standard to see how stress tests are used for interoperability compliance. |
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This application note explains how the FrameScan technology locates and examines pattern-dependent failures at 10 Gbps and beyond. |
DSA8300 |
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Product Series |
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TLA Series Video: Glitch |
Tektronix logic analyzers are equipped with a unique glitch display to help you quickly identify the occurrence of a glitch regardless of the number of signals that are being analyzed. |
TLA7000 |
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TLA Series Video: MagniVu |
Debug, validate, and optimize your digital designs with MagniVu™ acquisition’s powerful 8 GHz (125ps) high-resolution sampling and avoid missing events in either timing or state acquisition mode on all channels. |
TLA7000 |
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TLA Series Video: iCapture |
Eliminate double probing and see both digital and analog acquisitions through a single logic analyzer probe with the exclusive iCapture™ multiplexing capability. |
TLA7000 |
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TLA Series Video: iView |
The integrated iView™ display provides complete system visibility with time-correlated, integrated analog and digital data on one screen. |
TLA7000 |
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TLA Series Video: Setup and Hold |
Quickly identify and measure elusive timing violations using drag-and-drop Setup and Hold triggers. |
TLA7000 |
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Fundamentals of Signal Integrity Webinar |
This 30-minute Webinar presented by Professor Geoff Lawday and Tektronix Marketing Manager David Ireland provide insight into signal integrity-related problems in digital and analog systems. This is an essential Webinar for Design Engineers working with complex digital systems and need clean, fast transitions free of transients. |
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