Jitter Measurement and Timing Analysis

Understanding timing jitter has become a mandatory part of high-speed communications system design. Many of today’s serial data standards require extensive jitter compliance tests.  Whether you need a quick clock jitter measurement or a thorough analysis of a BER performance problem, Tektronix' comprehensive test instrumentation portfolio enables you to meet your design goals and compliance requirements – fast.

  • 80SJNB Jitter & Timing Analysis for Sampling Oscilloscopes: When used with the Tektronix DSA8300 Sampling Oscilloscope, 80SJNB analysis software performs timing and noise-based analysis to get a 3-D view of the eye diagram performance for deep, accurate evaluation on signals with speeds up to and beyond 50GHz.
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Stressed Eye Primer

Introduction to stressed eye testing.

Digital Design Debugging Guide

Learn all about digital design debugging in our 16-page how-to guide.

Jitter Fact Sheet

Whether you need a quick clock jitter measurement or a thorough analysis of a BER performance problem, Tektronix oscilloscopes and integrated software tools deliver. You can rapidly solve problems and meet your design goals and compliance requirements.

Direct Synthesis Comes to the Aid of Serial Measurements

An analog approach to revolutionize serial data receiver measurement methodologies.

Testing your High Definition embedded devices using the HDMI Version 1.3 specification

Embedded.com

Jitter Analysis Reference Guide

Embedded Systems Test & Measurement Challenges

In this primer, we look at the various elements of embedded systems in detail, and describe some of the challenges that arise in their implementation: challenges that are being addressed by a new generation of test & measurement tools.

Understanding the impact of reference clock jitter on data jitter - and techniques for measurement and analysis

Electronic Products & Technology magazine

Ultra-low Jitter Performance with Phase-Reference Module 82A04 & TDS/CSA8200 Sampling Oscilloscope

This application note discusses operation, functionality and ultra-low jitter measurement capabilities of the Tektronix 82A04 Phase-Reference Module.

Jitter Analysis: A Brief Guide to Jitter

A brief overview of jitter.

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Anatomy of Jitter

This webinar describe the different categories and types of jitter; the origins and interrelationships and how they can be used to diagnois, characterize and debug system hardware. Plus, explain how these various jitter measurements are applicable to your specific application.

The Impact of Clock Recovery on Your Serial Data Measurements

This video discusses the basics of clock recovery impact on your measurements. Why it is needed, the effect on jitter, as well as calibration considerations.

Dual-Dirac Jitter Model

This video is a refresher of the Dual-Dirac Jitter Model, which is one of the tools available for predicting your system's performance and troubleshooting/improving the system or components of the system.

Avoiding Pitfalls in Jitter Measurements

This webinar discusses common pitfalls when making jitter measurements and how you can avoid them when making your measurements.

How to Choose the Right Platform for Jitter Measurements

Learn what to consider when selecting a platform for jitter measurements.

Beyond Receiver Interoperability Testing Webinar

This 45 minute, live webinar will focus on the latest tools and techniques for properly performing jitter tolerance and stressed receiver sensitivity testing - including characterization and margin testing of next generation receivers. .

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