Asia Symposium 2006

With serial data rates increasing, engineers are facing growing challenges regarding the best techniques to verify that their receiver circuits will work in real world conditions. Test methodologies include the practice of adding transmission path imperfections to simulate worst case conditions. These methodologies include adding jitter and noise, inserting delays between data lines and adjusting amplitudes and pre-emphasis to digital patterns to simulate system artifacts caused by many variables surrounding the circuit or device under test.

With fast digital to analog converters and faster sample clock capabilities, instruments such as Arbitrary Waveform Generators can be used as a method for direct synthesis of analog transmission line effects on serial data signals. Since testing requirements are, in effect, replicating real world transmission path effects, it only makes sense to create signals that have these effects as part of the analog signal that is used for the test. This would eliminate the need to inject jitter and noise from other sources, remove the requirement for multi-channel added signals to create pre-emphasis and also increase the capability of providing true transmission path artifacts such as ISI and other system anomalies. This session will demonstrate this Direct Synthesis approach to serial data receiver testing.

Bob Buxton is the Marketing Manager for Tektronix' Signal Source Product Line. In this role he combines his nature for technical inquiry with a desire to provide solutions to customer needs. Bob Buxton joined Tektronix in December 1994 as a product marketing manager. Buxton's career includes positions in R&D, product management, sales, and marketing. Prior to his current post, Bob has had marketing and management roles in Tektronix' video and RF businesses.

Ultra Wide Band (UWB) wireless radio technology is used for consumer, computer, mobile appliance, industrial and military applications. It addresses needs for new radio communications systems and short-range high-speed data transmissions systems.

The high-frequency bandwidth required to test UWB places it beyond the capabilities of most test and measurement equipment. Tektronix, however, delivers UWB testing and design tools with its fastest in the industry real-time oscilloscopes, leading spectrum analyzers and signal sources, along with UWB application software, to enable you to solve your UWB design challenges quickly and effectively.

This presentation touches on the definition, history and some of the exciting emerging applications of Ultra Wideband RF. As you bring your design to market, understanding the regulatory activities, compliance, interoperability and manufacturing tests become important. Tektronix will demonstrate new tools for UWB to enable you to generate and measure these complex RF waveforms to help you with your UWB designs. There will be emphasis on WiMedia (Wireless USB, UWB Bluetooth WiNet) UWB radio testing.

UN Vasudev is a Product Marketing Manager in Instruments Business Unit of Tektronix. Vasu is responsible for defining, marketing and support of Ethernet, HDMI, FB-DIMM, DVI and emerging technology solutions for Performance Oscilloscope product lines. Vasu has been with the Test and Measurement industry for Fourteen years. Vasu holds a Bachelor's degree in Electronics and Communications and a Post Graduate diploma in Business Management.

In today's digital world, increasing system complexity and the need to deliver more in less time have brought tremendous pressure on engineering teams. Enhancing productivity is the only way to conquer this challenge. Timing analysis is a fundamental methodology in testing and debugging digital systems that could take 50-80% of an engineers' working hour. In this session, we will introduce techniques to capture elusive timing problems as well as how to use the latest logic analyzers and oscilloscopes to improve your productivity.

Lawrence Wilson has over 13 years experience in the high industry and is currently the Product Manager for the Tektronix' Logic Analyzer products. Lawrence entered the Test & Measurement industry in 1998. During this time he has held a number of marketing positions and has been responsible for products ranging from Spectrum Analyzers to Logic Analyzers. Previously Lawrence had spent five years as a Design Engineer. Lawrence holds a B Eng (Hons) in Electronic & Communication Engineering from Napier University, Edinburgh, Scotland and a M.B.A from the University of Portland, Oregon, USA. Lawrence regularly authors and presents papers at technology and industry seminars.

DDR2 SDRAMs are today's mainstream memory technology used in computers to embedded systems. FB-DIMM uses DDR2 SDRAMs to support up to eight FB-DIMMs per memory channel. This satisfies the need for very large memory systems used in servers and workstations. DDR3 SDRAMs are the next generation of high-performance memories that will be used in future computer and server designs. The speed of DDR3 SDRAMs starts at 800MT/s and it will quickly increase to 1333 MT/s. In the future DDR3 SDRAMs are expected to operate at 1600 MT/s. DDR3 SDRAMs designs are implemented using fast edges, high clock frequencies and low voltages that require careful verification and testing to ensure reliable memory system operation. This session shows designers effective ways to validate and to debug their DDR2, DDR3 and FB-DIMM memory system designs.

Lawrence Wilson has over 13 years experience in the high industry and is currently the Product Manager for the Tektronix' Logic Analyzer products. Lawrence entered the Test & Measurement industry in 1998. During this time he has held a number of marketing positions and has been responsible for products ranging from Spectrum Analyzers to Logic Analyzers. Previously Lawrence had spent five years as a Design Engineer. Lawrence holds a B Eng (Hons) in Electronic & Communication Engineering from Napier University, Edinburgh, Scotland and a M.B.A from the University of Portland, Oregon, USA. Lawrence regularly authors and presents papers at technology and industry seminars.

Radar pulse measurements have historically presented many challenges for the design engineer, production test manager and field technician. The transient nature of the radar pulse combined with modern pulse compression schemes often demand elaborate test setups. Traditionally, comprehensive pulse measurement software has not been offered by the test and measurement industry, forcing many radar engineers to create complex custom test solutions.

The Tektronix Real-Time Spectrum Analyzer, combined with the Advance Signal Analysis software, now offers a comprehensive solution to radar pulse analysis in a single test instrument. The Real-Time Spectrum Analyzer's extraordinary capabilities can also provide signal details that have been out of reach with other test equipment.

In this seminar, we begin with a review of some key radar system concepts associated with pulse design and diagnostics. This is followed by a look at the Real-Time Spectrum Analyzer and its unique abilities. Techniques for reliably capturing and viewing radar signals are then presented.

Matt Maxwell is a Product Manager for Real-Time Spectrum Analyzers at Tektronix. During this time, he has worked with the communications and microwave industry and authored multiple symposium papers and application notes across a variety of application topics. Matt has also worked across a broad range of RF technologies and with numerous categories of RF test equipment. Among his areas of expertise are radar, electronic warfare, and communications. Prior to joining Tektronix, he served as a US Navy Officer on board nuclear submarines, where he held various positions from Communications Officer to Reactor Controls Officer. He received his education at the University of Washington in Seattle, Washington, obtaining his a BSEE in 1995.

Multi-Carrier Power Amplifier (MCPA) designs make it crucial for today's engineers and scientists to be able to reliably detect and characterize RF signals that change over time, something not easily done with traditional measurement tools. Swept spectrum analyzers and vector signal analyzers might provide snapshots of the signal in the frequency domain and the modulation domain, but this is often not enough information to confidently describe the dynamic RF signals produced by the device.

To address this problem, Tektronix has designed the Real-Time Spectrum Analyzer (RTSA), a new instrument that can trigger on RF signals, seamlessly capture them into memory, and analyze them in the frequency, time, and modulation domains. This seminar will describe how the RTSA can be used solve many measurement problems by enabling the RF engineers to analyze frequency and amplitude changes over time.

Jim Taber is a Product Planner for Real-Time Spectrum Analyzers at Tektronix. He holds a bachelor's degree in Electrical Engineering from the University of Missouri-Rolla and an MS in the Management of Technology from the NTU School of Engineering. During his 20 year career, he has managed a variety of test and measurement products including spectrum analyzers, digital signal generators and vector network analyzers.

New compression technologies and their applications have been adopted in IPTV, mobile TV, 3G services and many of the consumer electronics. In this class, those new compression standards will be reviewed as well as the trends of the new applications. The content of this class will offer you test and monitoring solutions for R&D engineers who are developing digital video equipment so as to improve time to market for your products. The content will also cover solutions for operators to make sure right contents being distributed to the right place at the right time.

Steve Foy has worked in the video industry for 10 years. He began work in video for the Cambridge start-up Symbionics Instruments in 1996. Symbionics Instruments was rebranded as Adherent Systems in 1997 and quickly became a successful player in the MPEG test market. Adherent Systems was acquired by Tektronix in 2001. Since then, Steve has worked with Tektronix customers around the world in various roles including MPEG Customer Support, Systems Integration, Project Management and Technical Training for both Tektronix employees and customers. Steve has worked on large scale MPEG monitoring systems implementations for Tektronix's largest MPEG customers worldwide. He has also been involved in supporting Tektronix Sales Teams around the world in major MPEG deals, from bid processes to end system design and implementation. Steve gained his BSc and Dip. IT from the Open University in the UK and is a full member of the Institute of Engineering and Technology

With serial data rates increasing, engineers are facing growing challenges regarding the best techniques to verify that their receiver circuits will work in real world conditions. Test methodologies include the practice of adding transmission path imperfections to simulate worst case conditions. These methodologies include adding jitter and noise, inserting delays between data lines and adjusting amplitudes and pre-emphasis to digital patterns to simulate system artifacts caused by many variables surrounding the circuit or device under test.

With fast digital to analog converters and faster sample clock capabilities, instruments such as Arbitrary Waveform Generators can be used as a method for direct synthesis of analog transmission line effects on serial data signals. Since testing requirements are, in effect, replicating real world transmission path effects, it only makes sense to create signals that have these effects as part of the analog signal that is used for the test. This would eliminate the need to inject jitter and noise from other sources, remove the requirement for multi-channel added signals to create pre-emphasis and also increase the capability of providing true transmission path artifacts such as ISI and other system anomalies. This session will demonstrate this Direct Synthesis approach to serial data receiver testing.

Bob Buxton is the Marketing Manager for Tektronix' Signal Source Product Line. In this role he combines his nature for technical inquiry with a desire to provide solutions to customer needs. Bob Buxton joined Tektronix in December 1994 as a product marketing manager. Buxton's career includes positions in R&D, product management, sales, and marketing. Prior to his current post, Bob has had marketing and management roles in Tektronix' video and RF businesses.

Ultra Wide Band (UWB) wireless radio technology is used for consumer, computer, mobile appliance, industrial and military applications. It addresses needs for new radio communications systems and short-range high-speed data transmissions systems.

The high-frequency bandwidth required to test UWB places it beyond the capabilities of most test and measurement equipment. Tektronix, however, delivers UWB testing and design tools with its fastest in the industry real-time oscilloscopes, leading spectrum analyzers and signal sources, along with UWB application software, to enable you to solve your UWB design challenges quickly and effectively.

This presentation touches on the definition, history and some of the exciting emerging applications of Ultra Wideband RF. As you bring your design to market, understanding the regulatory activities, compliance, interoperability and manufacturing tests become important. Tektronix will demonstrate new tools for UWB to enable you to generate and measure these complex RF waveforms to help you with your UWB designs. There will be emphasis on WiMedia (Wireless USB, UWB Bluetooth WiNet) UWB radio testing.

UN Vasudev is a Product Marketing Manager in Instruments Business Unit of Tektronix. Vasu is responsible for defining, marketing and support of Ethernet, HDMI, FB-DIMM, DVI and emerging technology solutions for Performance Oscilloscope product lines. Vasu has been with the Test and Measurement industry for Fourteen years. Vasu holds a Bachelor's degree in Electronics and Communications and a Post Graduate diploma in Business Management.

In today's digital world, increasing system complexity and the need to deliver more in less time have brought tremendous pressure on engineering teams. Enhancing productivity is the only way to conquer this challenge. Timing analysis is a fundamental methodology in testing and debugging digital systems that could take 50-80% of an engineers' working hour. In this session, we will introduce techniques to capture elusive timing problems as well as how to use the latest logic analyzers and oscilloscopes to improve your productivity.

Lawrence Wilson has over 13 years experience in the high industry and is currently the Product Manager for the Tektronix' Logic Analyzer products. Lawrence entered the Test & Measurement industry in 1998. During this time he has held a number of marketing positions and has been responsible for products ranging from Spectrum Analyzers to Logic Analyzers. Previously Lawrence had spent five years as a Design Engineer. Lawrence holds a B Eng (Hons) in Electronic & Communication Engineering from Napier University, Edinburgh, Scotland and a M.B.A from the University of Portland, Oregon, USA. Lawrence regularly authors and presents papers at technology and industry seminars.

DDR2 SDRAMs are today's mainstream memory technology used in computers to embedded systems. FB-DIMM uses DDR2 SDRAMs to support up to eight FB-DIMMs per memory channel. This satisfies the need for very large memory systems used in servers and workstations. DDR3 SDRAMs are the next generation of high-performance memories that will be used in future computer and server designs. The speed of DDR3 SDRAMs starts at 800MT/s and it will quickly increase to 1333 MT/s. In the future DDR3 SDRAMs are expected to operate at 1600 MT/s. DDR3 SDRAMs designs are implemented using fast edges, high clock frequencies and low voltages that require careful verification and testing to ensure reliable memory system operation. This session shows designers effective ways to validate and to debug their DDR2, DDR3 and FB-DIMM memory system designs.

Lawrence Wilson has over 13 years experience in the high industry and is currently the Product Manager for the Tektronix' Logic Analyzer products. Lawrence entered the Test & Measurement industry in 1998. During this time he has held a number of marketing positions and has been responsible for products ranging from Spectrum Analyzers to Logic Analyzers. Previously Lawrence had spent five years as a Design Engineer. Lawrence holds a B Eng (Hons) in Electronic & Communication Engineering from Napier University, Edinburgh, Scotland and a M.B.A from the University of Portland, Oregon, USA. Lawrence regularly authors and presents papers at technology and industry seminars.

Radar pulse measurements have historically presented many challenges for the design engineer, production test manager and field technician. The transient nature of the radar pulse combined with modern pulse compression schemes often demand elaborate test setups. Traditionally, comprehensive pulse measurement software has not been offered by the test and measurement industry, forcing many radar engineers to create complex custom test solutions.

The Tektronix Real-Time Spectrum Analyzer, combined with the Advance Signal Analysis software, now offers a comprehensive solution to radar pulse analysis in a single test instrument. The Real-Time Spectrum Analyzer's extraordinary capabilities can also provide signal details that have been out of reach with other test equipment.

In this seminar, we begin with a review of some key radar system concepts associated with pulse design and diagnostics. This is followed by a look at the Real-Time Spectrum Analyzer and its unique abilities. Techniques for reliably capturing and viewing radar signals are then presented.

Matt Maxwell is a Product Manager for Real-Time Spectrum Analyzers at Tektronix. During this time, he has worked with the communications and microwave industry and authored multiple symposium papers and application notes across a variety of application topics. Matt has also worked across a broad range of RF technologies and with numerous categories of RF test equipment. Among his areas of expertise are radar, electronic warfare, and communications. Prior to joining Tektronix, he served as a US Navy Officer on board nuclear submarines, where he held various positions from Communications Officer to Reactor Controls Officer. He received his education at the University of Washington in Seattle, Washington, obtaining his a BSEE in 1995.

Ensuring high quality content production and distribution is always a challenge to content provider, network operators and broadcasters. In this class, the speaker will spend more time in discussing how audio/video test and monitoring tools can help you producing and distributing high quality digital contents. HD video and Dolby audio will always be used as examples in the class. Finally, a vivid demonstration will be conducted.

Rodger Cutler is a member of the Tektronix Worldwide Training group and has been with Tektronix for over 20 years. In his position, he develops video training seminars which he presents around the world to a wide range of audiences including operators, technicians, engineers and scientist. Rodger holds a master's degree from Oregon State University and has over thirty years of video experience dealing with analog video/audio, non-compressed digital video/audio and compressed digital video/audio.

Radar pulse measurements have historically presented many challenges for the design engineer, production test manager and field technician. The transient nature of the radar pulse combined with modern pulse compression schemes often demand elaborate test setups. Traditionally, comprehensive pulse measurement software has not been offered by the test and measurement industry, forcing many radar engineers to create complex custom test solutions.

The Tektronix Real-Time Spectrum Analyzer, combined with the Advance Signal Analysis software, now offers a comprehensive solution to radar pulse analysis in a single test instrument. The Real-Time Spectrum Analyzer's extraordinary capabilities can also provide signal details that have been out of reach with other test equipment.

In this seminar, we begin with a review of some key radar system concepts associated with pulse design and diagnostics. This is followed by a look at the Real-Time Spectrum Analyzer and its unique abilities. Techniques for reliably capturing and viewing radar signals are then presented.

Matt Maxwell is a Product Manager for Real-Time Spectrum Analyzers at Tektronix. During this time, he has worked with the communications and microwave industry and authored multiple symposium papers and application notes across a variety of application topics. Matt has also worked across a broad range of RF technologies and with numerous categories of RF test equipment. Among his areas of expertise are radar, electronic warfare, and communications. Prior to joining Tektronix, he served as a US Navy Officer on board nuclear submarines, where he held various positions from Communications Officer to Reactor Controls Officer. He received his education at the University of Washington in Seattle, Washington, obtaining his a BSEE in 1995.

The increasingly widespread success of cellular technology and wireless data networks has caused the cost of basic RF components to plummet. Digital RF device have become so pervasive that they can be found in almost any imaginable location.

As digital RF signals have become ubiquitous in the modern world, so too have problems with interference between the devices that generate them. In order to overcome these evolving challenges, it is crucial for today’s engineers and scientists to be able to reliably detect and characterize RF signals that change over time, something not easily done with traditional measurement tools. Real-Time Spectrum Analyzer is an instrument that can solve many measurement problems associated with capturing and analyzing modern RF signals, greatly shorten your testing time.

Matt Maxwell is a Product Manager for Real-Time Spectrum Analyzers at Tektronix. During this time, he has worked with the communications and microwave industry and authored multiple symposium papers and application notes across a variety of application topics.

Peter Chen is a RF product specialist in Tektronix, focusing on real time spectrum analyzers. He travels frequently in the Asia Pacific region to train clients, solve various application problems, as well as present papers at symposiums and seminars.

New compression technologies and their applications have been adopted in IPTV, mobile TV, 3G services and many of the consumer electronics. In this class, those new compression standards will be reviewed as well as the trends of the new applications. The content of this class will offer you test and monitoring solutions for R&D engineers who are developing digital video equipment so as to improve time to market for your products. The content will also cover solutions for operators to make sure right contents being distributed to the right place at the right time.

Steve Foy has worked in the video industry for 10 years. He began work in video for the Cambridge start-up Symbionics Instruments in 1996. Symbionics Instruments was rebranded as Adherent Systems in 1997 and quickly became a successful player in the MPEG test market. Adherent Systems was acquired by Tektronix in 2001. Since then, Steve has worked with Tektronix customers around the world in various roles including MPEG Customer Support, Systems Integration, Project Management and Technical Training for both Tektronix employees and customers. Steve has worked on large scale MPEG monitoring systems implementations for Tektronix's largest MPEG customers worldwide. He has also been involved in supporting Tektronix Sales Teams around the world in major MPEG deals, from bid processes to end system design and implementation. Steve gained his BSc and Dip. IT from the Open University in the UK and is a full member of the Institute of Engineering and Technology