Presenter Bios

Rick Nelson oversees the editorial operations of Test & Measurement World and also writes and edits articles on automated test equipment (ATE), environmental test, RF/microwave wireless-communications test, electronic design automation, failure analysis, and machine vision and inspection.

Tom is Principal Engineer in the RF test group at Tektronix. He has over 37 years experience with RF test and measurement, 33 of those years at Tektronix.

Tom has held various Engineering and Technical Marketing positions with Tektronix since 1974, including general purpose and RF specific measurement equipment.

He develops measurement techniques and is responsible for translating end-user's needs into measurements and test equipment that solve those needs. He has specific expertise in Radar, Surveillance, EW, and Communication systems.

He has also consulted for other companies including: Planar Systems, Intel, Microconnect, Photon Kinetics, Anderson Associates, E-Beam and others. Additionally, he has authored application notes, technical articles and presented papers including MTTS, Microwave Update and International IIC. He holds several patents for test and measurement equipment.

He holds a BSEE from Clemson University. On his non-work time he is Principal Percussionist for the Marylhurst Symphony, builds Ham Radio equipment, and enjoys activities with his family.