Jitter and Timing Analysis
Tektronix offers jitter measurement solutions for signals ranging from low-speed digital to ultra-high speed serial data. Tektronix real-time oscilloscopes provide electrical measurement and debug capability to support standards up to 10.25 Gigabits, and optical measurement capability to 2.5 Gigabit OC-48.
For electrical standards above 8 Gigabits, and optical standards above 2.5 Gigabits, Tektronix offers our sampling oscilloscope DSA8200 Series with optical and electrical capabilities for 40 Gigabit OC-768 and beyond.
For solving jitter problems on low level and low noise signals, or for measuring the very small amounts of jitter often found on clocks, Tektronix offer Real-Time Spectrum Analyzers (RTSA) that enable engineers to measure and characterize jitter over a wide dynamic range.
Analyzing jitter to find random and deterministic components is easily accomplished across all three product groups. DPOJET provides a full complement of jitter debug, analysis and standards based compliance testing for real-time oscilloscopes. 80SJNB provides jitter decomposition and adds important noise decomposition to sampling oscilloscopes.
Tektronix spectrum analyzers include essential jitter decomposition tools to find random and periodic jitter. Tektronix signal generators, like the AWG7100 Series and DTG5000 Series, provide jitter generation capability for applications including receiver jitter tolerance testing.
Application Information
Jitter 360° Knowledge Series
Advance your design and perfect your understanding of jitter with the keen insights and ready information you'll discover in this rigorous and sweeping six-part knowledge series from Tektronix. Written and presented by Ransom Stephens, Ph.D., one of the leading experts in the field, this series offers you a robust set of valuable jitter solutions through six independent Webinars and associated technical briefs.
Real-time Spectrum Analyzer Performs Jitter Measurements Tutorial
In this presentation, we will begin with a basic overview of jitter. Proceed with a discussion on what are some of the important measurement challenges to consider when analyzing jitter. Then conclude by highlighting some of the key Real-Time Spectrum Analyzer capabilities that solve these challenges.
Jitter Quick Fact Sheet
(2 MB)
Understanding and Characterizing Timing Jitter Primer
Characterizing Phase Locked Loops Using Tektronix Real-Time Spectrum Analyzers (RTSA)
This application note presents an overview of Phase Locked Loop operation including both linear and non-linear effects. It also shows measurements of these effects in both the time and frequency domains using Tektronix Real-Time Spectrum Analyzers.
Choose the Right Platform for Your Jitter Measurements
(4 MB)
This document will explain some essential jitter terms, and then go on to discuss jitter measurements and the tools best suited for evaluating and quantifying jitter.
80SJNB Jitter Measurement Results Correlation White Paper
(684 KB)
Jitter Generation Techniques For Serializer-Deserializer Compliance Testing
(2.64 MB)
A Brief Guide to Jitter
(248 kB)
Controlled Jitter Generation for Jitter Tolerance and Jitter Transfer Testing Application Note
RTSA Analysis Toolset Handles Challenging Jitter Measurements
For solving jitter problems on low level signals, Tektronix offers Real-Time Spectrum Analyzers (RTSA) that enable engineers to solve Periodic and Random jitter on low level signals, even in the presence of much larger signals.
Equalization and Serial Data Link Analysis Methods (SDLA) with 80SJNB Advanced
(3 MB)
Related Information
Paper presented 8/9/05 at the T11.2 FC-MSQS Ad Hoc Meeting: Impact of Noise on BER Estimation
(405 kB)
TDSJIT3 Timing & Analysis Brochure
(567 kB)
Jitter Accuracy Reference Guide
Jitter Algorithms Reference Guide
(291 kB)
Jitter Analysis Reference Guide
(482 kB)
Jitter Correlation Reference Guide
(337 kB)

