Semiconductor Device Characterization and Validation
Measurement and Analysis Solutions
- Up to 7 GHz bandwidth and 20 GS/s real-time sample rate on 1 or 2 channels to capture the fastest signals in leading-edge digital designs
- As fast as 62 ps rise time (typical)
- Delta time measurement accuracy to 1.5 ps RMS
- Jitter measurements down to 0.7 ps RMS
- Industry-leading suite of advanced triggers
- OpenChoiceTM platform delivers built-in networking and analysis
- Trigger on and display glitches and setup/hold violations
- Simultaneous 125 ps (8 GHz) high-resolution timing and up to 800 MHz state clock rate (1.25 Gb/s data rate) analysis on all channels through the same probe
- Up to 2 GHz (500 ps) deep timing
- Exclusive iLinkTM Tool Set allows the designer to quickly analyze analog signal characteristics of digital signals using a single logic analyzer probe and a Tektronix oscilloscope
- High-performance oscilloscope probes deliver up to 6 GHz bandwidth, < 75 ps rise time capability and < 0.3 pF input capacitance
- High density, connectorless, active logic analyzer probes provide low input capacitance (0.7 pF total capacitance) and reduced layout complexity and cost
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