Semiconductor Device Characterization and Validation

Nearly all of the leading-edge technology sectors - high-speed networking, wired and wireless communications, digital video graphics, a constantly expanding host of consumer devices, and more - depend on high-performance semiconductor devices, highly integrated circuits with analog, digital and mixed signal functionality and high-speed interconnects to drive performance.

These complex devices and system with their faster edge rates and narrower data pulses create unique, exacting demands on the debug, verification and stress testing process. At high clock/data rates, digital signals appear more and more analog-like, making design, calibration and troubleshooting ever more challenging. Demand for precise validation and characterization under a wide variety of conditions adds to the challenge with signals that can become unreliable under even a small amount of distortion or jitter. And, it all must be done under continually more aggressive time-to-market schedules and demands.

Tektronix measurement solutions - signal sources, oscilloscopes, logic analyzers, probes and software - deliver unparalleled features and performance that simplify validation and characterization for today's analog, digital and mixed signal systems.