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Keithley's approach to differential conductance, a four-wire, source current/measure voltage technique, uses the 6220 and 6221 Current Sources and 2182A Nanovoltmeter.  The current sources combine the DC and AC components into one source, with no need to do a secondary measure of the current, because its output is much less dependent on the changing device impedance

This application note explains the maximum capacitance specifications of an SMU, and describes several applications on which the 4201-SMU and 4211-SMU enables you to make stable low current measurements. The example applications describe include the following: OLED pixel device testing on a flat panel display, transfer characteristics of a MOSFET using long cables, FET testing through a switch matrix, nano-FET I-V measurements on a chuck, and capacitor leakage measurements. Details on calculating test system capacitance is also provided in this application note.

This C-V testing applications e-guide features a concentration of application notes on C-V testing methods and techniques using Keithley’s Model 4200-SCS Parameter Analyzer.

Hall effect measurements have been valuable tools for material characterization since Edwin Hall discovered the phenomenon in 1879. Essentially, the Hall effect can be observed when the combination of a magnetic field …

This application note discusses a variety of electrochemical applications, including voltammetry, low and high resistivity measurements, battery test, potentiometry, electrodeposition, electrical device characterization, and other tests that involve sourcing and measuring current and voltage and measuring capacitance with high accuracy.

This document contains specifications and supplemental information for the Model DMM7510 7-1/2 Digit Graphical Sampling Multimeter instrument. Specifications are the standards against which the DMM7510 is tested. Upon leaving the factory, the DMM7510 meets these specifications.

This application note describes how to measure gate charge on a MOSFET based on the JEDEC Gate Charge Test Method using the 4200A-SCS Parameter Analyzer.

This tutorial explains the importance of electrical measurements to the science of nanotechnology, and presents practical considerations in making these measurements. Topics include material and structural characteristics that can be …

Measuring low resistances (1Ω and lower) has a variety of technical challenges. Depending on the application, test system builders can choose from various instrument options, including a nanovoltmeter used with a current …