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Datasheet
2461 SourceMeter SMU Instrument

The Model 2461 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips.

1KW-60288-2 | Date: Wednesday, August 09 2023
Datasheet
2470 Graphical SourceMeter SMU Instrument Datasheet

1KW-61523-0 | Date: Wednesday, August 09 2023
Technical Document
Rechargeable Battery Charge and Discharge - Galvanic - Cycling Using the Keithley Model 2450 or 2460 SourceMeter SMU Instrument

Introduction Rechargeable, or secondary, batteries are commonly used in place of disposable batteries in electronic devices such as laptops, video game controllers, mobile phones, digital cameras, and remote controls. In an …

Date: Friday, October 24 2014
Technical Document
Measuring Low Resistance Devices with High Current Using the Model 2460 SourceMeter SMU Instrument

Source Measure Unit (SMU) instruments or SourceMeter® instruments can simplify making low resistance measurements with high current stimulus. A SourceMeter instrument is capable of sourcing and measuring both current and voltage.

1KT-60883-0 | Date: Friday, September 16 2016
Datasheet
2460 Source Measure Unit

The 2460 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips.

1KW-60905-2 | Date: Thursday, October 07 2021
Technical Document
Source Measure Unit (SMU) Instruments Selector Guide

MAKE MULTIPLE MEASUREMENTS ACCURATELY USING A SINGLE INSTRUMENT A source measure unit (SMU) instrument is a five-in-one tool. It combines the useful features of a digital multimeter (DMM), power supply, current …

1KW-61458-2 | Date: Tuesday, August 24 2021
Technical Document
Gate Dielectric Capacitance-Voltage Characterization Using the Model 4200

This application note discusses how to use the Keithley Model 4200 Semiconductor Characterization System (4200-SCS) to make C-V measurements. It also addresses basic MOS physics, proper C-V measurement techniques, and parameter extraction from C-V test results.

#2239 | Date: Friday, April 21 2006
Technical Document
New High Power Semiconductor Devices are Pushing Instrumentation to Extremes

Design and production of today’s semiconductors and power modules based on silicon carbide and gallium nitride demand more rigorous testing than with previous generations. This technical brief provides information on how to cost-effectively achieve safe, accurate, and reliable testing to meet precise design requirements.

1KW-73841-0 | Date: Wednesday, October 13 2021
Technical Document
Migrating Test Applications from the Keithley Model 2400 SourceMeter SMU Instrument to a Series 2600B System SourceMeter SMU Instrument

Introduction Keithley's Series 2600B System SourceMeter instruments are the test and measurement industry's fastest SMU (Source Measurement Unit) instruments. Based on Keithley’s thirdgeneration SMU architecture, the Series …

Date: Wednesday, December 19 2012
Technical Document
Keithley Connectors Adapters and Tools Selector Guide

Selector guide for connectors, adapters, and tools compatible with Keithley products.

1KW-73965-1 | Date: Tuesday, August 08 2023