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Yuegang Zhao to Present at International Solid-State and Integrated-Circuit Technologies Conference


Cleveland, Ohio - October 15, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced that Yuegang Zhao will orally present his paper "Effective Minimization of Charge Trapping in High-k Gate Dielectrics with an Ultra-short Pulse Technique" at the 7th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT).