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USB

Tektronix USB Tx and Rx software solutions meet the electrical validation, compliance, characterization and debug needs of engineers designing USB 3.1 Type-C, USB 3.1, and USB 2.0 based systems, which are compliant to the USB-IF test standards. A solution for USB-PD electrical parametric and protocol measurements for compliance is also available.

Automated USB 3.1 Type-C Test Solution

  • Quickly find the root cause of issues when testing SuperSpeed USB 3.1 Type-C designs with the combination of full SigTest support and DPOJET. USB 3.1 Software datasheet »

Transmitter & Receiver Testing with Tektronix Oscilloscopes and BERTs 

Discover more about our solutions for USB 3.1 Type-C, USB 3.2, and USB 2.0 based systems.

All references to USB 3.1 also apply to USB 3.2.

Library

Title
The Basics of Serial Data Compliance and Validation Measurements
High-speed serial bus architectures are the new norm in today’s high-performance designs. While parallel bus standards are undergoing some changes, serial buses are established across multiple markets …
USB 3.0 Physical Layer Measurements
High Speed Interface Standards
This e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical …
Advanced Serdes Debug with a BERT
Learn simple strategies to pinpoint bit errors to the exact bit position and timing with powerful Error Location Analysis and a BERT.
USB 2.0 Compliance Solution
This fact sheet details the recommended equipment to meet the USB 2.0 compliance testing requirements. 
Simplifying Validation and Debug of USB 3.1 Designs
This application note will explain the evolution of the Universal Serial Bus (USB) standard and testing approaches that have been developed to accommodate the increasing speed and complexity of this …
Troubleshooting USB 2.0 Problems with Your Oscilloscope
Learn the basics of the USB 2.0 physical layer to help you troubleshoot bus problems or system issues.  Learn how to set up and interpret the results when using automated decoding, triggering, and …
Debugging Serial Buses in Embedded System Designs
Learn the basics of the hardware protocols of the most common serial buses, such as I2C, SPI , USB, RS-232/422/485/UART, CAN, CAN FD, LIN, FlexRay, Ethernet, and I2S/LJ/RJ/TDM.  Find out how to use …
Understanding and Performing USB 2.0 Electrical Testing and Debugging
USB 2.0 is used in a wide range of applications, thanks to its performance, reliability and relatively low cost. Automated USB 2.0 compliance testing may be used to prepare for formal compliance …
USB 3.1 Receiver Compliance Testing
In this application note, all aspects of USB 3.1 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin.        
USB 3.1 What you need to know - Reference Guide
Quickly and easily reference important USB specifications without having to comb through hundreds of pages. This guide includes important Electrical Test Parameters, reference pictures for Compliance …
Application Kit for USB 3.1 Transmitter and Receiver Testing
This kit contains the following application notes:   USB 3.1 Receiver Compliance Testing covers all aspects of USB 3.1 receiver testing, including stressed eye calibration and jitter tolerance …
How to Debug USB 3.1 Gen1 and Gen2 Electrical Compliance Failures
Learn more about the Type-C connector and the benefits it brings to USB 3.1, the latest USB 3.1 specifications, and how you can go beyond compliance testing to get to the bottom of issues that east …
Title
Simplify your USB TypeC Design Validation From Complexity to Confidence
Comprehensive tools for debugging failures are key to building confidence that your product will pass compliance and achieve certification. This in-depth webinar will help simplify your validation …
Electrical Validation of the Type-C Interface
The introduction of the Type-C interface, and its implementation across multiple high-demand serial standards, has created new challenges for developers. These include new compliance channel …
Testing USB 31
With computer peripheral devices demanding more bandwidth; the industry is making its move to faster serial I/O. USB3.1 brings a staggering 10Gb/sec to computing peripherals. View this short webinar …
Title
Tektronix High-Speed Electrical Testing - Host MOI
High-Speed Electrical Testing - Host MOI 
Tektronix USB2.0 Device MOI
USB 2.0 Universal Serial Bus Measurement MOI 
High-Speed Electrical Testing - Hub MOI
High-Speed Electrical Testing - Hub MOI 
USBSSP DPOJET MOI
This MOI specifies the testing procedures for USB 3.1 Transmitter Tests (Gen 1 and Gen 2) using Tektronix DPOJET and Tektronix Oscilloscopes. 
USB 2.0 Test Procedures MOI
USB 2.0 Test Procedures Method of Implementation  
USB 2.0 Host MOI
High-Speed Electrical Testing - Host MOI 
USB 3.1 Receiver Testing MOI
This MOI reviews the methods used for USB 3.1 (10 Gb/s) receiver compliance testing using the BERTScope Bit Error Rate Testers. 
USB 3.0 Receiver Testing MOI
This MOI reviews the methods used for USB 3.0 receiver compliance testing using the BERTScope Bit Error Rate Testers. 
USB 2.0 Hub MOI
High-Speed Electrical Testing - Hub MOI 
USB 3.1 Cable Tests MOI
This MOI specifies the testing procedures for the SuperSpeed channels of a USB 3.1 cable and mated cable assembly including Type-C to Type-C and Type-C to legacy connectors. 
USB 3.0 Cable Tests MOI
This MOI specifies the testing procedures for the Super Speed channels of a USB 3.0 cable and mated cable assembly.