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Tektronix USB Tx and Rx software solutions meet the electrical validation, compliance, characterization and debug needs of engineers designing USB 3.1 Type-C, USB 3.1, and USB 2.0 based systems, which are compliant to the USB-IF test standards. A solution for USB-PD electrical parametric and protocol measurements for compliance is also available.

NEW! Automated USB 3.1 Type-C Test Solution

  • Quickly find the root cause of issues when testing SuperSpeed USB 3.1 Type-C designs with the combination of full SigTest support and DPOJET. USB 3.1 Software datasheet »

Transmitter & Receiver Testing with Tektronix Oscilloscopes and BERTs 

Discover more about our solutions for USB 3.1 Type-C, USB 3.1, and USB 2.0 based systems.

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The Basics of Serial Data Compliance and Validation Measurements
High-speed serial bus architectures are the new norm in today’s high-performance designs. While parallel bus standards are undergoing some changes, serial buses are established across multiple markets...
USB 3.0 Physical Layer Measurements
High Speed Interface Standards
This e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical ...
Advanced Serdes Debug with a BERT
Learn simple strategies to pinpoint bit errors to the exact bit position and timing with powerful Error Location Analysis and a BERT.
USB 2.0 Compliance Solution
This fact sheet details the recommended equipment to meet the USB 2.0 compliance testing requirements. 
Application Kit for USB 3.1 Transmitter and Receiver Testing
This kit contains the following application notes:   USB 3.1 Receiver Compliance Testing covers all aspects of USB 3.1 receiver testing, including stressed eye calibration and jitter tolerance testi...
Troubleshooting USB 2.0 Problems with Your Oscilloscope
Learn the basics of the USB 2.0 physical layer to help you troubleshoot bus problems or system issues.  Learn how to set up and interpret the results when using automated decoding, triggering, and sea...
Debugging Serial Buses in Embedded System Designs
Learn the basics of the hardware protocols of the most common serial buses, such as I2C, SPI , USB, RS-232/422/485/UART, CAN, CAN FD, LIN, FlexRay, Ethernet, and I2S/LJ/RJ/TDM.  Find out how to use th...
USB 3.1 Receiver Compliance Testing
In this application note, all aspects of USB 3.1 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin.        
Simplifying Validation and Debug of USB 3.1 Designs
This application note will explain the evolution of the Universal Serial Bus (USB) standard and testing approaches that have been developed to accommodate the increasing speed and complexity of this ...
USB 3.1 What you need to know - Reference Guide
Quickly and easily reference important USB specifications without having to comb through hundreds of pages. This guide includes important Electrical Test Parameters, reference pictures for Compliance ...
Understanding and Performing USB 2.0 Electrical Testing and Debugging
USB 2.0 is used in a wide range of applications, thanks to its performance, reliability and relatively low cost. Automated USB 2.0 compliance testing may be used to prepare for formal compliance cert...
How to Debug USB 3.1 Gen1 and Gen2 Electrical Compliance Failures
Learn more about the Type-C connector and the benefits it brings to USB 3.1, the latest USB 3.1 specifications, and how you can go beyond compliance testing to get to the bottom of issues that east in...
The physical setup for USB 3.1 receiver calibration and testing is shown in this video.
This video highlights some of the newest features and capabilities of the USB 3.1 Receiver testing application. These updates enhance the functionality of the software, and give users more tools t...
This video details the the BERTScope's Error Location Analysis tool that provides a huge advantage for looking beyond compliance and debug system issues that can cause costly delays in design cycl...
The USB 3.1 Receiver application's Margin Test feature gives engineers quantitative answers on a design's performance and as a debug tool, a better understanding of where devices fail. This video ...
This video focuses on the Link Training Status State Machine UI feature of the USB 3.1 Gen2 Receiver test application and shows the path that is taken by a device being trained into loopback mode ...
Debug physical layer and link training issues quickly for standards running up to 32 Gb/s. Move from complexity to confidence.
Discover how to use a Tektronix MSO5000B Series Oscilloscope to validate the operation of a High-Speed USB serial bus, using the SR-USB option.
Learn how to dramatically cut down test time on required compliance interop tests for USB3 using an automated test suite from Tektronix. 
This short video shows how to debug a compliance measurement that has failed by using Tektronix’ Jitter and Eye Diagram Software, DPOJET. Using DPOJET, engineers can go from a compliance environme...
This short video demonstrates testing concepts for USB 3.1 Transmitter Testing; allowing viewers to visually observe the process to properly test for USB 3.1 device compliance using Tektronix DPO/...
Electrical Validation of the Type-C Interface
The introduction of the Type-C interface, and its implementation across multiple high-demand serial standards, has created new challenges for developers. These include new compliance channel requireme...
Testing USB 31
With computer peripheral devices demanding more bandwidth; the industry is making its move to faster serial I/O. USB3.1 brings a staggering 10Gb/sec to computing peripherals. View this short webinar t...
Simplify your USB TypeC Design Validation From Complexity to Confidence
Comprehensive tools for debugging failures are key to building confidence that your product will pass compliance and achieve certification. This in-depth webinar will help simplify your validation tas...
Tektronix USB2.0 Device MOI
USB 2.0 Universal Serial Bus Measurement MOI 
Tektronix High-Speed Electrical Testing - Host MOI
High-Speed Electrical Testing - Host MOI 
USB 2.0 Hub MOI
High-Speed Electrical Testing - Hub MOI 
USB 3.1 Receiver Testing MOI
This MOI reviews the methods used for USB 3.1 (10 Gb/s) receiver compliance testing using the BERTScope Bit Error Rate Testers. 
USB 2.0 Test Procedures MOI
USB 2.0 Test Procedures Method of Implementation  
USB 3.1 Cable Tests MOI
This MOI specifies the testing procedures for the SuperSpeed channels of a USB 3.1 cable and mated cable assembly including Type-C to Type-C and Type-C to legacy connectors. 
USB 3.0 Cable Tests MOI
This MOI specifies the testing procedures for the Super Speed channels of a USB 3.0 cable and mated cable assembly. 
This MOI specifies the testing procedures for USB 3.1 Transmitter Tests (Gen 1 and Gen 2) using Tektronix DPOJET and Tektronix Oscilloscopes. 
USB 3.0 Receiver Testing MOI
This MOI reviews the methods used for USB 3.0 receiver compliance testing using the BERTScope Bit Error Rate Testers. 
High-Speed Electrical Testing - Hub MOI
High-Speed Electrical Testing - Hub MOI 
USB 2.0 Host MOI
High-Speed Electrical Testing - Host MOI