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Model 4200-SCS & KTEI 5.0 Software Extend Semi Characterization to Stress-Measure, Reliability Test


Cleveland, Ohio - December 11, 2003 - Keithley Instruments, Inc. (NYSE: KEI) today announced availability of its Model 4200-SCS Semiconductor Characterization System with its integral Keithley Test Environment-Interactive (KTEI) v5.0 software.