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Datasheet Literature Number: ReleaseDate 4200A-SCS Parameter Analyzer Datasheet
1KW-60780-6 Model 4200-RM Rack Mount Kit Packing List
Model 4200-RM Rack Mount Kit Packing List PA-709PA-709
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Technical Documents Document Type ReleaseDate Keithley Low Level Measurements Handbook - 7th Edition
The Keithley Low Level Measurements Handbook is a reference and guide for anyone looking to perform sensitive DC electrical measurements. Scroll down to find the section you need, or download the entire book as a PDF above. Once you click on each of …Handbook Making Three-Terminal Capacitance-Voltage Measurements Up to 400 V Using the 4200A-CVIV Multi-Switch Bias Tee Capability
This application note explains how the CISS, COSS and CRSS measurements are made using the bias tee capabilities in the 4200A-CVIV Multi-Switch. This application note also shows how the instrument DC output voltage was doubled from 200 V to 400 V for …Application Note Pulse I-V Characterization of Non-Volatile Memory Technologies
This application note provides a brief history of non-volatile memory (NVM), an overview of the test parameters required for electrical characterization of NVM materials and devices, and a discussion of emerging test requirements. It also provides …Application Note Using USB Communication to Control External Instruments with the 4200A-SCS Parameter Analyzer
The 4200A-SCS Parameter Analyzer with Clarius+ V1.9 software can control instruments through USB communication. The Clarius software includes user libraries to control a generic USB instrument and one that controls the Keithley DMM6500 and DMM7510 …Application Note Using the 4200A-SCS Parameter Analyzer Built-in FFT Functions
The 4200A-SCS Parameter Analyzer with Clarius+ V1.9 software includes FFT analysis functions that enable the user to automatically make frequency-based calculations on time domain measurements without having to download the data and perform analysis …Application Note DC I-V Characterization of FET-Based Biosensors Using the 4200A-SCS Parameter Analyzer
Research and development of FET-based biosensors have increased because of their low cost, rapid response, and accurate detection. A bioFET converts a biological response to an analyte into an electrical signal that can easily by measured by DC I-V …Application Note Making Femtofarad (1e-15F) Capacitance Measurements with the 4215-CVU
This application note explains how to make femtofarad capacitance measurements using the 4215-CVU Capacitance Voltage Unit. This includes making proper connections and using the proper test settings in the Clarius software for the best results.Application Note Qualifying High-K Gate Materials with Charge-Trapping Measurements
As the size of transistors continues to scale down, the use of conventional SiO2 as a gate dielectric material is approaching physical and electrical limits. The principal limitation is high leakage current due to quantum mechanical tunneling of …Technical Article Using the 4200-CVU-PWR C-V Power Package to Make High Voltage and High Current C-V Measurements with the 4200A-SCS Parameter Analyzer
Application Note SOLUTIONS FOR SCIENTIFIC AND ENGINEERING RESEARCH
Brochure Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS
Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS Semiconductor Characteriztion System Parametric characterization of semiconductor devices typically requires making extremely low current measurements. For MOSFET devices, the …Application Note Advances in Electrical Measurements for Nanotechnology E-Handbook
Rev 3.13Fact Sheet Making Low Current Pulse I-V Measurements
This application note defines ultra-fast I-V, explains the fundamental limits of current measurements as a function of time and measure window, and describes the techniques for making ultra-fast I-V low current measurements.Application Note The Emerging Challenges of Nanotechnology Testing
Nanotechnology is an important new area of research that promises significant advances in electronics, materials, biotechnology, alternative energy sources, and dozens of other applications. …Technical Article Writing Prober Drivers for the Model 4200-SCS
Application Note Using the Model 4225-RPM Remote Amplifier/ Switch to Automate Switching Between DC I-V, C-V, and Pulsed I-V Measurements
Application Note Making Optimal Capacitance and AC Impedance Measurements with the 4200A-SCS Parameter Analyzer
Capacitance-voltage (C-V) and AC impedance measurements are commonly performed on many types of devices for a wide variety of applications. This application note describes how to make optimal capacitance measurements using proper measurement …Application Note Using the Model 4200-CVU-PWR C-V Power Package to Make High Voltage and High Current C-V Measurements with the Model 4200-SCS Semiconductor Characterization System
Application Note Automating High and Low Frequency C-V Measurements and Interface Trap Density (DIT) Calculations of MOS Capacitors Using the 4200A-SCS Parameter Analyzer
This application note discusses how to use the 4200A-SCS Parameter Analyzer to measure and to automatically switch between high and low frequency C-V measurements on MOS capacitors. Basic information on MOS capacitors and common parameter extractions …Application Note 1 ns Pulsing Solutions for Non-Volatile Memory Testing
Ultra-fast (<10 ns) pulsing is required to develop the newest non-volatile memory types like Flash, PCRAM, STT-RAM and others. In addition to the recommended minimum and allowable minimum pulse widths possible using the Keithley 4225-PMU Ultra-Fast I …Technical Brief KTEI V8.2 for the Model 4200-SCS: Characterize NVM, Measure VLF C-V, Make More Pulsed or Ultra-fast I-V Measurements in Parallel
Brochure Using the 4200A-CVIV Multi-Switch to Make High Voltage and High Current C-V Measurements
This application note explains the implementation of the bias tee modes of the 4200A-CVIV to make high voltage C-V measurement. It assumes the reader is familiar with making C-V measurements with the Keithley 4200A-SCS using the CVIV.Application Note Model 4200-SCS & KTEI 5.0 Software Extend Semi Characterization to Stress-Measure, Reliability Test
Cleveland, Ohio - December 11, 2003 - Keithley Instruments, Inc. (NYSE: KEI) today announced availability of its Model 4200-SCS Semiconductor Characterization System with its integral Keithley Test Environment-Interactive (KTEI) v5.0 software.News Release ACS Integrated Test System for Lab-Based Automation
Application Note Pulsed I-V Testing for Components and Semiconductor Devices - Applications Guide
Application Note Ultra-Fast I-V Applications for the Model 4225-PMU Ultra-Fast I-V Module
Application Note METHODS AND TECHNIQUES FOR SEMICONDUCTOR CHARACTERIZATION
Application Note Evolving Materials and Testing for Emerging Generations of Power Electronics Design
Transitioning from silicon to wide bandgap semiconductors such as silicon carbide and gallium nitride means that power module designs can be physically smaller than what came before, while also increasing MOSFET switching speed and energy efficiency …Technical Brief Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer
Evolving design scales and new materials are making wafer level reliability testing more critical than ever. This is also driving the demand for reliability testing and modeling much further upstream, especially into the R&D process …Application Note Performing Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices Using the Mode 4200-SCS Semiconductor Characterization System
Application Note Performing Charge Pumping Measurements with the 4200A-SCS Parameter Analyzer
This application note explains how to make charge pumping measurements using the 4200A-SCS with the optional 4225-PMU Ultra-Fast I-V Module (PMU) or 4220-PGU Pulse Generator Unit (PGU).Application Note Keithley Instrumentation for Electrochemical Test Methods and Applications
With more than 60 years of measurement expertise, Keithley Instruments is a world leader in advanced electronic test instrumentation. Our customers are scientists and engineers in a wide range of research and industrial …Application Note C-V Testing for Semiconductor Components and Devices - Applications Guide
C-V Characterization of MOS Capacitors Using the Model 4200-SCS Parameter Analyzer Introduction Maintaining the quality and reliability of gate oxides of MOS structures is a critical task in a semiconductor fab …Application Note TECHNIQUES FOR MEASURING RESISTIVITY FOR MATERIALS CHARACTERIZATION
Application Note Upgrade Your 4200-SCS System and Protect Your Investment
Upgrade your 4200-SCS Parameter Analyzer to the 4200A-SCS - the industry's highest performance analyzer - and accelerate I-V, C-V, and ultra-fast pulsed I-V testing of your complex devices for materials research, semiconductor device design, process …Fact Sheet Gate Dielectric Capacitance-Voltage Characterization Using the Model 4200
Introduction Maintaining the quality and reliability of gate oxides is one of the most critical and challenging tasks in any semiconductor fab. With feature sizes shrinking to 0.18µm or less, gate oxides are often less than 30Å …Application Note Model 4200-SCS Semiconductor Characterization System
Full color brochure covering the semiconductor characterization system, Model 4200-scs.Brochure Moving from Windows XP to Windows 7? Upgrade Your Model 4200-SCS
How-to Guide Pulse Testing for Nanoscale Devices
Technical Article Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the 4200A-SCS Parameter Analyzer
Application Note Four-Probe Resistivity and Hall Voltage Measurements with the Model 4200-SCS
Application Note Performing Charge Pumping Measurements with the Model 4200-SCS Semiconductor Characterization System
Application Note Optimizing Low Current Measurements with the Model 4200-SCS Semiconductor Characterization System
Introduction Many critical applications demand the ability to measure very low currents such as picoamps or less. These applications include determining the gate leakage current of FETs, testing sensitive nano-electronic …Application Note E-Handbook Guide to Switch Considerations by Signal Type
Introduction Many electronic test systems use relay switching to connect multiple devices to sources and measurement instruments. In some cases,multiple sources and measuring instruments are connected to a single device …Fact Sheet Electrical Characterization of Photovoltaic Materials and Solar Cells with the Model 4200-SCS Semiconductor Characterization System
Application Note Measuring Inductance Using the 4200-CVU Capacitance-Voltage Unit
Application Note Evaluating Hot Carrier Induced Degradation of MOSFET Devices
Application Note # 2197 Evaluating Hot Carrier Induced Degradation of MOSFET Devices With decreased MOSFET gate length, hot carrier induced degradation has become one of the most important reliability concerns.Application Note Simplifying MOSFET and MOSCAP Device Characterization e-Guide
This e-guide answers some common questions about making better semiconductor measurements, with a focus on DC I-V and capacitance-voltage (C-V) measurements. It also touches on more specific applications and how you can simplify making the …Brochure Breathe New Life into Your 4200-SCS Parameter Analyzer
Fact Sheet Safely Using the Interlock on the Keithley Model 4200-SCS
Use the safety interlock circuit to avoid personal injury or death caused by hazardous voltages. Safety interlock connections The safety interlock feature on the Model 4200-SCS should be used to avoid possible shock …Application Note C-V Characterization of MOS Capacitors Using the Model 4200-SCS Semiconductor Characterization System
Application Note How to Choose and Apply Source Measure Unit SMU Instruments
Application Note Electrical Characterization of Photovoltaic Materials and Solar Cells with the 4200A-SCS Parameter Analyzer
Application Note Making I-V and C-V Measurements on Solar/Photovoltaic Cells Using the Model 4200-SCS Semiconductor Characterization System
Application Note An Ultra-Fast Single Pulse (UFSP) Technique for Channel Effective Mobility Measurement
Application Note Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the Model 4200-SCS Semiconductor Characterization System
Application Note Making Charge-Pumping Measurements with the Model 4200-SCS Semiconductor Characterization System and Series 3400 Pulse/Pattern Generator
Application Note DC Electrical Characterization of RF Power Transistors
Application Note Touch, Test, Invent with the Next Generation Current and Voltage Source-Measure Instruments
Fact Sheet Switching Between C-V and I-V Measurements Using the 4200A-CVIV Multi-Switch and 4200A-SCS Parameter Analyzer
Introduction Full parametric characterization of a semiconductor device usually requires an array of tests to gather all of the device's important parameters. Current-voltage (I-V) tests are used to determine device …Application Note Resistivity Measurements of Semiconductor Materials Using the 4200A-SCS Parameter Analyzer and a Four-Point Collinear Probe
Application Note Making van der Pauw Resistivity and Hall Voltage Measurements Using the 4200A-SCS Parameter Analyzer
This application note provides an overview of the van der Pauw and Hall effect measurement methods and how to use the built-in applications that are included with the 4200A-SCS Parameter Analyzer to perform these measurements.Application Note Creating External Instruments Drivers for the Model 4200-SCS
Application Note C‑V Characterization of MOS Capacitors Using the 4200A-SCS Parameter Analyzer
Application Note Probing Transistors at the Contact Level in Integrated Circuits
Application Note Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
Brochure Using the Wafer Map Parameters Option with Cascade Nucleus Prober Software and the Model 4200-SCS
Application Note Monitoring Channel Hot Carrier (CHC) Degradation of MOSFET Devices using Keithley's Model 4200-SCS
Application Note Evaluating Oxide Reliability
Application Note Number 2240 Evaluating Oxide Reliability Using V-Ramp and J-Ramp Techniques Oxide integrity is an important reliability concern, especially for today's ULSI MOSFET devices, where oxide thickness has been scaled to a few atomic layers …Application Note Measuring MOSFET Gate Charge with the 4200A-SCS Parameter Analyzer
Introduction Power MOSFETs are used in a variety of applications and can be used as high-speed switching. The switching speed of the device is affected by internal capacitances, which is typically specified in data sheets in terms of Ciss and Coss …Application Note I-V Measurements of Nanoscale Wires and Tubes with the Model 4200-SCS and Zyvex S100 Nanomanipulator
Application Note DC I-V Testing for Components and Semiconductor Devices
DC I-V measurements are the cornerstone of device and material testing. This DC I-V testing applications e-guide features a concentration of application notes on DC I-V testing methods and techniques using Keithley’s Model 4200-SCS Parameter Analyzer …Application Note Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the Model 4200-SCS Semiconductor Characterization System
Application Note Ultra Fast Single Pulse Technique for Channel Effective Mobility Measurement
Application Note Performing Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices Using the 4200A-SCS Parameter Analyzer
Application Note Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the 4200A-SCS Parameter Analyzer
Application Note Improving the Measurement Speed and Overall Test Time of the Model 4200-SCS
Application Note Optimizing Low Current Measurements with the 4200A-SCS Parameter Analyzer
Introduction Many critical applications demand the ability to measure very low currents such as picoamps or less. These applications include determining the gate leakage current of FETs, testing sensitive nano-electronic …Application Note DC I-V and AC Impedance Testing of Organic FETs
This application note outlines how to optimize DC I-V and AC impedance measurements on OFETs using the 4200A-SCS Parameter Analyzer. Timing parameters, noise reduction, shielding, proper cabling, and other important measurement considerations for …Application Note Making Stable Low Current Measurements with High Test Connection Capacitance Using the 4201-SMU and 4211-SMU
This application note explains the maximum capacitance specifications of an SMU, and describes several applications on which the 4201-SMU and 4211-SMU enables you to make stable low current measurements. The example applications describe include the …Application Note
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Software Document Type Part Number: ReleaseDate 4200A-SCS Clarius+ Software Suite V1.9.1
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a …Application 4200A-CLARIUS-V1.9.1 4200A-SCS Clarius+ Software Suite V1.9
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a …Application 4200A-CLARIUS-V1.9 Hot Fix Package for 4200A-SCS Clarius V1.8.1
This download is not a complete Clarius+ software installation. It only contains the files necessary to address important issues found with KXCI SMU control in Clarius+ V1.8.1. Please read the release notes for the installation instructions and …Application CLARIUS_V1.8.1HF1 4200A-SCS Clarius+ Software Suite V1.8.1
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a …Application 4200A-CLARIUS-V1.8.1 4200A-SCS Clarius+ Software Suite V1.3 (Legacy – Unsupported)
This legacy version of Clarius is made available for Windows 7 computers. For the latest version of Clarius+ please visit the 4200A-SCS Product Support page ( Product Support and Downloads | Tektronix ) and select Software. The 4200A-SCS Clarius+ …Application 4200A-CLARIUS-V1.3
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FAQS FAQ ID Is there a resettable fuse on the interlock circuit for model 4200A-SCS?
Yes, there is a resettable fuse. It takes several minutes to reset, please give it some time.This is discussed on page 4 and 5 of the included application note. Here is a link to the application note on the Tek website: https://www.tek …248681 What is included in the 4200A-SCS Windows 10 Upgrade option?
The 4200A-SCS can be upgraded from the Windows 7 operating system to Windows 10. The part number for this upgrade is 4200A-WIN10-UP. This service will provide a USB flash drive containing the upgrade program files and instructions for installing the …780921 Does Model 4200A-SCS support Model 590-CV meter like the Model 4200-SCS?
The Model 590-CV is a stand alone CV meter and can be controlled from either the 4200A-SCS and 4200-SCS using the KIXI (remote interface software).249356 Do I need to calibrate my instruments separately when I upgrade from the 4200-SCS to a 4200A-SCS mainframe?
No; when the 4200A-MF-UP service is selected, the 4200-SCS is converted to the 4200A-SCS mainframe. This system gains the Clarius software. All supported instrument modules in the original system will be moved to the new, 4200A-SCS mainframe and will …780926 Does the 4200A-SCS support ICCAP?
Although the 4200ICCAP-6.0 driver is obsolete, the 4200A is ICCAP supported through the KXCI software. The 4200 drivers in the KXCI software come with ICCAP in them and all KXCI programs for the 4200 are compatible with the 4200A. Note: ICCAP only …255351 What is the time required to switch between Pulse IV (4225PMU) and CV (4210ACVU) measurements using the 4225-RPM for the 4200A-SCS?
The RPM eliminates the need to re-cable and increases switching speed between Pulsed IV and CV measurements. However, we do not specify the switching time for the RPMs in the data sheets. A simple test using a MDO3102 yeided the below …469646 I have lost the device library on the 4200A-SCS, how to get it back?
The best way to get the library back is to re-install Clarius the their system. It’s free from our Tek.com website. Here is the link :https://www.tek.com/software/clarius/1-3247546
