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Manual Manual Type Part Number Release Date Model 4200A-SCS Parameter Analyzer Reference Manual
The Model 4200A-SCS Parameter Analyzer Reference Manual provides detailed instruction for the 4200A-SCS.
The Model 4200A-SCS Parameter Analyzer Reference Manual provides detailed instruction for the 4200A. It includes hardware information, such as connection information and SMU, PGU, PMU, and CVU descriptions. It also includes descriptions of the Clarius, KCon, KPulse, KULT, and KXCI software. LPT library descriptions are also provide.
Primary User 4200A-901-01G_September_2019_Reference.pdf Model 4200A-SCS Clarius V1.6.1 Software Release Notes
The Clarius+ software application suite is the software for the 4200A-SCS. Clarius+ software requires Microsoft Windows 10 on your 4200A-SCS Parameter Analyzer. These release notes describe fixed issues and known issues in the software.
Release Notes 077132608 Model 4200A Parameter Analyzer User's Manual
This User's Manual includes specific applications to help you get started quickly.
Primary User 4200A-900-01C Model 4200A-RM Rack Mount Kit Installation Instructions
This document contains installation instructions for the Model 4200A-RM Rack-Mount Kit, a fixed rack-mount kit for cabinet mounting of the Keithley 4200A-SCS Semiconductor Characterization System.
071348701 Model 4210-MMPC-C Multi-Measurement Prober Cable Kit Quick Start Guide
This multi-measurement cable set is a collection of standard and custom connectors and accessories used to take I-V, C-V, and pulsed I-V measurements using a single prober cable setup.
User PA-1001D KTE Interactive V9.1 Service Pack 2 Software Release Notes & Installation Instructions
This document provides supplemental information regarding KTE Interactive V9.1 Service Pack 2 (SP2). This information includes detailed instructions describing how to install this service pack and and summary of fixes and enhancements included in KTE Interactive V9.1 Service Pack 2.
Release Notes PA-895R Model 4200-SCS Semiconductor Characterization System Declassification and Security Instructions
If you have data security concerns, this document tells you how to clear or sanitize the Keithley Instruments Model 4200-SCS Semiconductor Characterization System's memory devices. It also explains how to declassify an instrument that is not functioning.
Declassification 077134300 Modèle 4200A-SCS Liste d'Avertissements
List of documentation warnings for the Canadian market that are in both English and French.
User 077126000 Model 4200A-SCS-PK2 Parameter Analyzer Quick Start Guide
The Quick Start Guide for the Keithley Instruments 4200A-SCS-PK2 provides unpacking and basic connection information. It also provides sample tests that you can use to familiarize yourself with the Parameter Analyzer.
Primary User 4200A-PK2-903-01A Model 4200-Compiler Installation Instructions
Installation instructions for the Model 4200-Compiler, a compiler that you can use to create user modules for the 4200A-SCS Parameter Analyzer and the 4200-SCS.
Combined User/Service PA-1030E Document Document Type Release Date Making Stable Low Current Measurements with High Test Connection Capacitance Using the 4201-SMU and 4211-SMU
This application note explains the maximum capacitance specifications of an SMU, and describes several applications on which the 4201-SMU and 4211-SMU enables you to make stable low current measurements. The example applications describe include the following: OLED pixel device testing on a flat panel display, transfer characteristics of a MOSFET using long cables, FET testing through a switch matrix, nano-FET I-V measurements on a chuck, and capacitor leakage measurements. Details on calculating test system capacitance is also provided in this application note.
Application Note 21 Oct 2019 Performing Charge Pumping Measurements with the 4200A-SCS Parameter Analyzer
This application note explains how to make charge pumping measurements using the 4200A-SCS with the optional 4225-PMU Ultra-Fast I-V Module (PMU) or 4220-PGU Pulse Generator Unit (PGU).
Application Note 04 Sep 2019 Evolving Materials and Testing for Emerging Generations of Power Electronics Design
Transitioning from silicon to wide bandgap semiconductors such as silicon carbide and gallium nitride means that power module designs can be physically smaller than what came before, while also increasing MOSFET switching speed and energy efficiency. As competitive pressures make these design parameters more critical, design engineers must reevaluate their approaches to validation and testing.
Technical Brief 17 May 2019 Low Level Measurements Handbook - 7th Edition Handbook 17 Apr 2019 Making Low Current Pulse I-V Measurements Application Note 24 Mar 2019 Making Three-Terminal Capacitance-Voltage Measurements Up to 400 V Application Note 21 Mar 2019 1 ns Pulsing Solutions for Non-Volatile Memory Testing Technical Brief 11 Feb 2019 Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer Application Note 29 Jan 2019 Making Optimal Capacitance and AC Impedance Measurements with the 4210-CVU Capacitance Voltage Unit
Capacitance-voltage (C-V) and AC impedance measurements are commonly performed on many types of devices for a wide variety of applications. This application note describes how to make optimal capacitance measurements using proper measurement techniques and the 4210-CVU Capacitance Voltage Unit.
Application Note 23 Jan 2019 Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the 4200A-SCS Parameter Analyzer
This application note describes how to implement and optimize quasistatic C-V measurements using the 4200A-SCS and the ramp rate method.
Application Note 10 Nov 2018 Software Type Part Number Release Date 4200A-SCS Clarius+ Software Suite V1.7
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to ...
Application 4200A-CLARIUS-V1.7 4200A-SCS Clarius+ Software Suite V1.6.1
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prio...
Application 4200A-CLARIUS-V1.6.1 4200A-SCS Clarius+ Software Suite V1.5
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contac...
Application 4200A-CLARIUS-V1.5 4200A-SCS Clarius+ Software Suite V1.3
The 4200A-SCS Clarius+ Software Suite provides a clear, uncompromised parameter analysis for your semiconductor devices, materials, processes and more...
Application 4200A-CLARIUS-V1.3 4200-SCS KTEI V9.1 Service Pack 2
4200-SCS KTE Interactive V9.1 Service Pack 2 includes all changes from KTEI V9.1 Service Pack 1, plus additional enhancements and fixes for known bugs...
Application 4200-KTEI-V9.1SP2 FAQ FAQ ID Switch Time between Pulse IV and CV measurements using the 4225-RPM.
The RPM eliminates the need to re-cable and increases switching speed between Pulsed IV and CV measurements. However, we do not specify the switching time for the RPMs in the data sheets. A simple...
469646 Does the 4200A-SCS support ICCAP?
Although the 4200ICCAP-6.0 driver is obsolete, the 4200A is ICCAP supported through the KXCI software. The 4200 drivers in the KXCI software come with ICCAP in them and all KXCI programs for the 4200...
255351 Does Model 4200A-SCS support Model 590-CV meter like the Model 4200-SCS?
The Model 590-CV is a stand alone CV meter and can be controlled from either the 4200A-SCS and 4200-SCS using the KIXI (remote interface software). ...
249356 Resettable fuse on the interlock circuit for model 4200A-SCS.
Yes, there is a resettable fuse. It takes several minutes to reset, please give it some time. This is discussed on page 4 and 5 of the included application note. Here is a link to the application ...
248681 I have lost the device library on the 4200A-SCS.
The best way to get the library back is to re-install Clarius the their system. It’s free from our Tek.com website. Here is the link : https://www.tek.com/software/clarius/1-3 ...