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Datasheet Literature Number: ReleaseDate 4200A-SCS Parameter Analyzer Datasheet
1KW-60780-5
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Manuals Manual Type Part Number: ReleaseDate Model 4200A-SCS Parameter Analyzer Reference Manual
Primary User 4200A-901-01G_September_2019_Reference.pdf Model 4200A-SCS Clarius V1.7 Software
Release Notes 077132609 Model 4200A-SCS Clarius V1.6.1 Software
Release Notes 077132608 Model 4200A Parameter Analyzer User's Manual
The Keithley Instruments Model 4200A-SCS User's Manual provides detailed product, connection, accessory, application, and Clarius+ software information. User ManualPrimary User 4200A-900-01C Model 4200A-SCS Parameter Analyzer Reference Manual
The Model 4200A-SCS Parameter Analyzer Reference Manual provides detailed instruction for the 4200A-SCS.Primary User 4200A-901-01F Model 4200A-CVIV Multi-Switch User's Manual
User's manual for the 4200A CV-IV multi-switch.Primary User 4200A-CVIV-900-01D Models 4200-MAG-BASE, VAC-BASE, and 4225-RPM
User PA-624C Model 4200A-RM Rack Mount Kit Installation Instructions
Model 4200A-RM Rack Mount Kit Installation Instructions071348701 Model 4210-MMPC-C Multi-Measurement Prober Cable Kit Quick Start Guide
This multi-measurement cable set is a collection of standard and custom connectors and accessories used to take I-V, C-V, and pulsed I-V measurements using a single prober cable setup. Instruction ManualUser PA-1001D KTE Interactive V9.1 Service Pack 2 Software Release Notes & Installation Instructions
Release notes and installation instructions for KTE Interactive software for the 4200. Release NotesRelease Notes PA-895R Model 4200A-SCS Declassification and Security Instructions
Model 4200A-SCS Declassification and Security Instructions InstructionsDeclassification 077126200 Model 4200-SCS Semiconductor Characterization System Declassification and Security Instructions
Model 4200-SCS Semiconductor Characterization System Declassification and Security Instructions InstructionsDeclassification 077134300 Modèle 4200A-SCS Liste d'Avertissements
Warnings from the QSGs, User's Manual and Reference Manual translated into French for the 4200A-SCS OtherUser 077126000 Model 4200A-SCS Package 3 System Quick Start Guide
Model 4200A-SCS Package 3 System Quick Start Guide Quick Start User ManualPrimary User 4200A-PK3-903-01A Model 4200A-SCS Semiconductor Characterization System Quick Start Guide
Model 4200A-SCS Semiconductor Characterization System Quick Start Guide Quick Start User ManualPrimary User 4200A-903-01A Model 4200A-SCS-PK2 Parameter Analyzer Quick Start Guide
Model 4200A-SCS-PK2 Parameter Analyzer Quick Start Guide Quick Start User ManualPrimary User 4200A-PK2-903-01A Model 4200-Compiler Installation Instructions
4200-Compiler installation instructions for the 4200A-SCS and 4200-SCS InstructionsCombined User/Service PA-1030E Keithley PreAmp Adapter Installation
User PA-633A
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Technical Documents Document Type ReleaseDate Improving the Measurement Speed and Overall Test Time of the Model 4200-SCS
Application Note Performing Charge Pumping Measurements with the Model 4200-SCS Semiconductor Characterization System
Application Note Performing Charge Pumping Measurements with the 4200A-SCS Parameter Analyzer
This application note explains how to make charge pumping measurements using the 4200A-SCS with the optional 4225-PMU Ultra-Fast I-V Module (PMU) or 4220-PGU Pulse Generator Unit (PGU).Application Note Performing Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices Using the 4200A-SCS Parameter Analyzer
Application Note Performing Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices Using the Mode 4200-SCS Semiconductor Characterization System
Application Note Breathe New Life into Your 4200-SCS Parameter Analyzer
Fact Sheet Four-Probe Resistivity and Hall Voltage Measurements with the Model 4200-SCS
Application Note Pulse I-V Characterization of Non-Volatile Memory Technologies
Application Note Pulsed I-V Testing for Components and Semiconductor Devices - Applications Guide
Application Note Pulse Testing for Nanoscale Devices
Technical Article Optimizing Low Current Measurements with the 4200A-SCS Parameter Analyzer
Application Note Optimizing Low Current Measurements with the Model 4200-SCS Semiconductor Characterization System
Application Note Integral PC Design of Keithley Model 4200-SCS is at the Leading Edge of a New Instrumentation Trend
Technical Article Low Level Measurements Handbook - 7th Edition
Handbook A Local Area Network Laboratory Based on the Keithley 4200-SCS for Engineering Education in Microelectronics
Whitepaper KTEI V8.2 for the Model 4200-SCS: Characterize NVM, Measure VLF C-V, Make More Pulsed or Ultra-fast I-V Measurements in Parallel
Brochure Safely Using the Interlock on the Keithley Model 4200-SCS
Application Note Keithley Pulse Solutions
Brochure Keithley Instrumentation for Electrochemical Test Methods and Applications
This application note discusses a variety of electrochemical applications, including voltammetry, low and high resistivity measurements, battery test, potentiometry, electrodeposition, electrical device characterization, and other tests that involve …Application Note Simplifying MOSFET and MOSCAP Device Characterization e-Guide
This e-guide answers some common questions about making better semiconductor measurements, with a focus on DC I-V and capacitance-voltage (C-V) measurements. It also touches on more specific applications and how you can simplify making the …Brochure SOLUTIONS FOR SCIENTIFIC AND ENGINEERING RESEARCH
Brochure Probing Transistors at the Contact Level in Integrated Circuits
Application Note Writing Prober Drivers for the Model 4200-SCS
Application Note Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer
Evolving design scales and new materials are making wafer level reliability testing more critical than ever. This is also driving the demand for reliability testing and modeling much further upstream, especially into the R&D process …Application Note Making van der Pauw Resistivity and Hall Voltage Measurements Using the 4200A-SCS Parameter Analyzer
This application note provides an overview of the van der Pauw and Hall effect measurement methods and how to use the built-in applications that are included with the 4200A-SCS Parameter Analyzer to perform these measurements.Application Note Creating External Instruments Drivers for the Model 4200-SCS
Application Note Switching Between C-V and I-V Measurements Using the 4200A-CVIV Multi-Switch and 4200A-SCS Parameter Analyzer
Application Note Model 4200-SCS Semiconductor Characterization System
Full color brochure covering the semiconductor characterization system, Model 4200-scs.Brochure Model 4200-SCS & KTEI 5.0 Software Extend Semi Characterization to Stress-Measure, Reliability Test
Cleveland, Ohio - December 11, 2003 - Keithley Instruments, Inc. (NYSE: KEI) today announced availability of its Model 4200-SCS Semiconductor Characterization System with its integral Keithley Test Environment-Interactive (KTEI) v5.0 software.News Release Modifying Keithley Interlock Cable 236-ILC-3 for Use w/Cascade 12000 Series Semiautomatic Probers
Application Note 1 ns Pulsing Solutions for Non-Volatile Memory Testing
Ultra-fast (<10 ns) pulsing is required to develop the newest non-volatile memory types like Flash, PCRAM, STT-RAM and others. In addition to the recommended minimum and allowable minimum pulse widths possible using the Keithley 4225-PMU Ultra-Fast I …Technical Brief Evolving Materials and Testing for Emerging Generations of Power Electronics Design
Transitioning from silicon to wide bandgap semiconductors such as silicon carbide and gallium nitride means that power module designs can be physically smaller than what came before, while also increasing MOSFET switching speed and energy efficiency …Technical Brief Evaluating Hot Carrier Induced Degradation of MOSFET Devices
Application Note # 2197 Evaluating Hot Carrier Induced Degradation of MOSFET Devices With decreased MOSFET gate length, hot carrier induced degradation has become one of the most important reliability concerns.Application Note Evaluating Oxide Reliability
Application Note Number 2240 Evaluating Oxide Reliability Using V-Ramp and J-Ramp Techniques Oxide integrity is an important reliability concern, especially for today's ULSI MOSFET devices, where oxide thickness has been scaled to a few atomic layers …Application Note Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the 4200A-SCS Parameter Analyzer
Application Note Electrical Characterization of Photovoltaic Materials and Solar Cells with the Model 4200-SCS Semiconductor Characterization System
Application Note Electrical Characterization of Photovoltaic Materials and Solar Cells with the 4200A-SCS Parameter Analyzer
Application Note Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the Model 4200-SCS Semiconductor Characterization System
Application Note C-V Testing for Semiconductor Components and Devices - Applications Guide
Application Note C-V Characterization of MOS Capacitors Using the Model 4200-SCS Semiconductor Characterization System
Application Note C‑V Characterization of MOS Capacitors Using the 4200A-SCS Parameter Analyzer
Application Note E-Handbook Guide to Switch Considerations by Signal Type
Fact Sheet DC I-V Testing for Components and Semiconductor Devices
DC I-V measurements are the cornerstone of device and material testing. This DC I-V testing applications e-guide features a concentration of application notes on DC I-V testing methods and techniques using Keithley’s Model 4200-SCS Parameter Analyzer …Application Note DC Electrical Characterization of RF Power Transistors
Application Note I-V Measurements of Nanoscale Wires and Tubes with the Model 4200-SCS and Zyvex S100 Nanomanipulator
Application Note ACS Integrated Test System for Lab-Based Automation
Application Note An Ultra-Fast Single Pulse (UFSP) Technique for Channel Effective Mobility Measurement
Application Note Ultra-Fast I-V Applications for the Model 4225-PMU Ultra-Fast I-V Module
Application Note Upgrade Your 4200-SCS System and Protect Your Investment
Upgrade your 4200-SCS Parameter Analyzer to the 4200A-SCS - the industry's highest performance analyzer - and accelerate I-V, C-V, and ultra-fast pulsed I-V testing of your complex devices for materials research, semiconductor device design, process …Fact Sheet Ultra Fast Single Pulse Technique for Channel Effective Mobility Measurement
Application Note Using the Model 4200-CVU-PWR C-V Power Package to Make High Voltage and High Current C-V Measurements with the Model 4200-SCS Semiconductor Characterization System
Application Note Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the Model 4200-SCS Semiconductor Characterization System
Application Note Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the 4200A-SCS Parameter Analyzer
Application Note Using the Wafer Map Parameters Option with Cascade Nucleus Prober Software and the Model 4200-SCS
Application Note Using the Model 4225-RPM Remote Amplifier/ Switch to Automate Switching Between DC I-V, C-V, and Pulsed I-V Measurements
Application Note Using the 4200-CVU-PWR C-V Power Package to Make High Voltage and High Current C-V Measurements with the 4200A-SCS Parameter Analyzer
Application Note Using the 4200A-CVIV Multi-Switch to Make High Voltage and High Current C-V Measurements
This application note explains the implementation of the bias tee modes of the 4200A-CVIV to make high voltage C-V measurement. It assumes the reader is familiar with making C-V measurements with the Keithley 4200A-SCS using the CVIV.Application Note Gate Dielectric Capacitance-Voltage Characterization Using the Model 4200
Application Note Number 2239 Gate Dielectric Capacitance - Voltage Characterization Using the Model 4200 Semiconductor Characterization System Maintaining the quality and reliability of gate oxides is one of the most critical and challenging tasks in …Application Note Resistivity Measurements of Semiconductor Materials Using the 4200A-SCS Parameter Analyzer and a Four-Point Collinear Probe
Application Note Monitoring Channel Hot Carrier (CHC) Degradation of MOSFET Devices using Keithley's Model 4200-SCS
Application Note Moving from Windows XP to Windows 7? Upgrade Your Model 4200-SCS
How-to Guide TECHNIQUES FOR MEASURING RESISTIVITY FOR MATERIALS CHARACTERIZATION
Application Note METHODS AND TECHNIQUES FOR SEMICONDUCTOR CHARACTERIZATION
Application Note Making Stable Low Current Measurements with High Test Connection Capacitance Using the 4201-SMU and 4211-SMU
This application note explains the maximum capacitance specifications of an SMU, and describes several applications on which the 4201-SMU and 4211-SMU enables you to make stable low current measurements. The example applications describe include the …Application Note Making Optimal Capacitance and AC Impedance Measurements with the 4210-CVU Capacitance Voltage Unit
Capacitance-voltage (C-V) and AC impedance measurements are commonly performed on many types of devices for a wide variety of applications. This application note describes how to make optimal capacitance measurements using proper measurement …Application Note Making Low Current Pulse I-V Measurements
This application note defines ultra-fast I-V, explains the fundamental limits of current measurements as a function of time and measure window, and describes the techniques for making ultra-fast I-V low current measurements.Application Note Making Three-Terminal Capacitance-Voltage Measurements Up to 400 V
This application note explains how the CISS, COSS and CRSS measurements are made using the bias tee capabilities in the 4200A-CVIV Multi-Switch. This application note also shows how the instrument DC output voltage was doubled from 200 V to 400 V for …Application Note Making Charge-Pumping Measurements with the Model 4200-SCS Semiconductor Characterization System and Series 3400 Pulse/Pattern Generator
Application Note Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS
Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS Semiconductor Characteriztion System Parametric characterization of semiconductor devices typically requires making extremely low current measurements. For MOSFET devices, the …Application Note Making I-V and C-V Measurements on Solar/Photovoltaic Cells Using the Model 4200-SCS Semiconductor Characterization System
Application Note Advances in Electrical Measurements for Nanotechnology E-Handbook
Rev 3.13Fact Sheet Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
Brochure The Emerging Challenges of Nanotechnology Testing
Technical Article DC I-V and AC Impedance Testing of Organic FETs
This application note outlines how to optimize DC I-V and AC impedance measurements on OFETs using the 4200A-SCS Parameter Analyzer. Timing parameters, noise reduction, shielding, proper cabling, and other important measurement considerations for …Application Note How to Choose and Apply Source Measure Unit SMU Instruments
Application Note Touch, Test, Invent with the Next Generation Current and Voltage Source-Measure Instruments
Fact Sheet Measuring Inductance Using the 4200-CVU Capacitance-Voltage Unit
Application Note Measuring MOSFET Gate Charge with the 4200A-SCS Parameter Analyzer
This application note describes how to measure gate charge on a MOSFET based on the JEDEC Gate Charge Test Method using the 4200A-SCS Parameter Analyzer.Application Note Greater Reliability Testing Confidence from Lab to Fab - Wafer Level Reliability Test Solutions
Keithley Instruments has long been an industry leader in both overall parametric test technology and wafer level reliability (WLR) testing. Several generations of Keithley’s parametric test solutions have offered WLR test algorithm libraries as …Poster
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Software Document Type Part Number: ReleaseDate 4200A-SCS Clarius+ Software Suite V1.7
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a …Application 4200A-CLARIUS-V1.7 4200A-SCS Clarius+ Software Suite V1.6.1
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a …Application 4200A-CLARIUS-V1.6.1 4200A-SCS Clarius+ Software Suite V1.5
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix company, at tek.com to upgrade the parameter analyzer.If installing on a …Application 4200A-CLARIUS-V1.5 4200A-SCS Clarius+ Software Suite V1.3
The 4200A-SCS Clarius+ Software Suite provides a clear, uncompromised parameter analysis for your semiconductor devices, materials, processes and more. Download the latest version of Clarius+ to stay up-to-date with the ever-growning library of ready …Application 4200A-CLARIUS-V1.3 4200-SCS KTEI V9.1 Service Pack 2
4200-SCS KTE Interactive V9.1 Service Pack 2 includes all changes from KTEI V9.1 Service Pack 1, plus additional enhancements and fixes for known bugs. This service pack is to be installed on top of either KTEI V9.1 or V9.1 Service Pack 1 software on …Application 4200-KTEI-V9.1SP2
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FAQS FAQ ID Do I need to calibrate my instruments separately when I upgrade from the 4200-SCS to a 4200A-SCS mainframe?
No; when the 4200A-MF-UP service is selected, the 4200-SCS is converted to the 4200A-SCS mainframe. This system gains the Clarius software. All supported instrument modules in the original system will be moved to the new, 4200A-SCS mainframe and will …780926 What is included in the 4200A-SCS Windows 10 Upgrade option?
The 4200A-SCS can be upgraded from the Windows 7 operating system to Windows 10. The part number for this upgrade is 4200A-WIN10-UP. This service will provide a USB flash drive containing the upgrade program files and instructions for installing the …780921 What is the time required to switch between Pulse IV (4225PMU) and CV (4210ACVU) measurements using the 4225-RPM for the 4200A-SCS?
The RPM eliminates the need to re-cable and increases switching speed between Pulsed IV and CV measurements. However, we do not specify the switching time for the RPMs in the data sheets. A simple test using a MDO3102 yeided the below …469646 Does Model 4200A-SCS support Model 590-CV meter like the Model 4200-SCS?
The Model 590-CV is a stand alone CV meter and can be controlled from either the 4200A-SCS and 4200-SCS using the KIXI (remote interface software).249356 Is there a resettable fuse on the interlock circuit for model 4200A-SCS?
Yes, there is a resettable fuse. It takes several minutes to reset, please give it some time.This is discussed on page 4 and 5 of the included application note. Here is a link to the application note on the Tek website: https://www.tek …248681 I have lost the device library on the 4200A-SCS, how to get it back?
The best way to get the library back is to re-install Clarius the their system. It’s free from our Tek.com website. Here is the link :https://www.tek.com/software/clarius/1-3247546 Does the 4200A-SCS support ICCAP?
Although the 4200ICCAP-6.0 driver is obsolete, the 4200A is ICCAP supported through the KXCI software. The 4200 drivers in the KXCI software come with ICCAP in them and all KXCI programs for the 4200 are compatible with the 4200A. Note: ICCAP only …255351
