DSA8300 Digital Sampling Oscilloscope

DSA8300 Digital Sampling Oscilloscope

With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4.

Features

Benefits

Electrical module signal measurement accuracy:

  • Ultra-low system jitter (<100 fs, typical)
  • > 70GHz
<100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterization of high bit-rate signals (5th harmonic to data rates of 28 Gb/sec and 3rd harmonic to data rates >45 Gb/sec).
Industry’s lowest system noise at all bandwidths:

  • 600 µV max (450 µV typ.) @ 60 GHz
  • 380 µV max (280 µV typ.) @ 30 GHz
Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure.
Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe. High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels.
Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4x25) Ethernet. Provides cost-effective and versatile optical test system for single and multi-mode optical standards from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, -LR4 and ER4) at 850, 1310 and 1550nm.
Superior acquisition throughput with up to 300 kS/s maximum sample rate. Reduced manufacturing or device characterization test-time by 4X with superior system throughput.
Ability to place the samplers adjacent to the device under test (DUT). Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed.
Independent calibrated channel de-skew. Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing.

 

Models

Model Analog Bandwidth Sample Rate Record Length Analog Channels List Price
DSA8300 70 GHz Electrical, 80 GHz Optical Up to 300 kS/s 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) Determined by the sampling modules used, up to 8 channels Configure & Quote
ModelDSA8300
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
Model Analog Bandwidth Sample Rate Record Length Analog Channels List Price
DSA8300 70 GHz Electrical, 80 GHz Optical Up to 300 kS/s 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) Determined by the sampling modules used, up to 8 channels Configure & Quote
ModelDSA8300
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
Datasheet LinkProbeDescriptionConfigure and Quote
DVT30-1MM GigaProbe

30 GHz TDR probe available from GigaProbes.

Contact Us
P8018 HANDHELD TDR PROBE, PASSIVE; 20 GHZ, SINGLE-ENDED, 50 OHM, SMA CONNECTOR WITH 20 GHZ SMA CABLE; DESIGNED TO WORK WITH 80A02 EOS/ESD PROTECTION MODULE; STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT Configure & Quote
P80318 Probe kit,18GHz 100 Ohm Differential Hand Probe Configure & Quote
Data SheetAccessoryDescription
80A02 EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT
80A03 TEKCONNECT PROBE INTERFACE MODULE
80B28G 8000 Series - Electrical Sampling Scope Bundle to Support 25/28 Gb/s standards (includes 80E09B, 82A04B, CR286A and accessories)
80C07B OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH
80C08D Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode
80C10C Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3)
80C11B Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode
80C12B 12 GHz, Broad WaveLength, Amplified Optical Sampling Module
80C14 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module
80C15 8000 Series Optical Module: single channel, 32GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80C17 8000 Series Optical Module: single channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80C18 8000 Series Optical Module: dual channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80E03 SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD
80E04 SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD
80E07B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1)
80E08B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1)
80E09B 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1)
80E10B 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1)
80E11 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1)
80E11X1 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1)
82A04B 8000 Series, Phase Reference Module (includes D1)
Data SheetModuleDescription
80A02 EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT
80A03 TEKCONNECT PROBE INTERFACE MODULE
80B28G 8000 Series - Electrical Sampling Scope Bundle to Support 25/28 Gb/s standards (includes 80E09B, 82A04B, CR286A and accessories)
80C07B OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH
80C08D Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode
80C10C Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3)
80C11B Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode
80C12B 12 GHz, Broad WaveLength, Amplified Optical Sampling Module
80C14 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module
80C15 8000 Series Optical Module: single channel, 32GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80C17 8000 Series Optical Module: single channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80C18 8000 Series Optical Module: dual channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80E03 SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD
80E04 SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD
80E07B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1)
80E08B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1)
80E09B 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1)
80E10B 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1)
80E11 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1)
80E11X1 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1)
82A04B 8000 Series, Phase Reference Module (includes D1)
TitleTypeDate
Automation Answers Compliance Challenge

Interoperability and compliance concerns are commanding an ever-larger share of the serial system designer's attention.


Literature number: 55W-21408-0
Fact Sheet 22 May 2014
Receiver Test Solution Application Fact Sheet
An overview about receiver testing and available measurement solutions.
Literature number: 76W-21670-2
Fact Sheet 22 May 2014
80A09
These instructions show how to install and test the 80A09 ESD Protection Device, used with supported 80E00 Electrical Sampling Modules.
Part number: 071327900
Primary User 09 May 2014
Equalization and Serial Data Link Analysis Methods (SDLA) with 80SJNB Advanced Application Note

Describes the Equalization concept and SDLA methods using the 80SJNB.


Literature number: 61W-21428-1
Application Note 20 Apr 2014
Can I load a standard copy of Windows OS on my Tektronix oscilloscope?
No, as the OS we are using is NOT 100% the same as the standard Window OS.  It may have the same base name, such as Windows 7 Ultimate 64-bit: however to make it work with our hardware and instrument s/w we do incorporate some modifications  in the…
FAQ ID: 69346 05 Mar 2014
Utility software that loads DSA8200 set up files into the DSA8300.
Yes, there is setup file conversion utility for the 8000 series sampling scopes. Below is an extract from the Readme file for the current 8300 scope firmware download:The 6.2 and later product software media contains an independentutility application…
FAQ ID: 69336 05 Mar 2014
Practices for Measurements on 25 Gb/s Signaling

Review of the measurement practices for the characterization and compliance test of the transmitter and receiver for 25+ Gb/s signaling in 100 G systems with oscilloscopes.


Literature number: 86W-29118-1
Application Note 04 Mar 2014
DSA8300 and Sampling Modules
Supports DSA8300 TekScope application 6.1.X and greater. This document lists the performance verification procedures for the DSA8300 mainframe instrument and supported optical and electrical sampling modules.
Part number: 077068202
Performance Verification 11 Feb 2014
DSA8300 CEI-VSR
This document is a PDF version of the TekExpress CEI-VSR help system. It contains installation and operatating information for product, which provides an automated, simple, and efficient way to test CEI-VSR Host to Module and Module to Host Interfaces to…
Part number: 077087200
Online Help 03 Feb 2014
Ultralow drive voltage silicon traveling-wave modulator Paper (Optical Society of America)

In this paper from the Optical Society of America, the DSA8300 Series Oscilloscope is being used to verify operation of a broadband modulator with a drive voltage of 0.63 Vpp at 20 Gb/s.


Literature number: Optics Express, Vol. 20, Issue 11, pp. 12014-12020 (2012)
Technical Brief 15 Jan 2014
Downloads
Download

Download Manuals, Datasheets, Software and more:

Go to top