DSA8300 Digital Sampling Oscilloscope

DSA8300 Digital Sampling Oscilloscope

With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4.

Features

Benefits

Electrical module signal measurement accuracy:

  • Ultra-low system jitter (<100 fs, typical)
  • > 70GHz
<100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterization of high bit-rate signals (5th harmonic to data rates of 28 Gb/sec and 3rd harmonic to data rates >45 Gb/sec).
Industry’s lowest system noise at all bandwidths:

  • 600 µV max (450 µV typ.) @ 60 GHz
  • 380 µV max (280 µV typ.) @ 30 GHz
Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure.
Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe. High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels.
Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4x25) Ethernet. Provides cost-effective and versatile optical test system for single and multi-mode optical standards from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, -LR4 and ER4) at 850, 1310 and 1550nm.
Superior acquisition throughput with up to 300 kS/s maximum sample rate. Reduced manufacturing or device characterization test-time by 4X with superior system throughput.
Ability to place the samplers adjacent to the device under test (DUT). Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed.
Independent calibrated channel de-skew. Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing.

 

Models

Model Analog Bandwidth Sample Rate Record Length Analog Channels List Price
DSA8300 70 GHz Electrical, 80 GHz Optical Up to 300 kS/s 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) Determined by the sampling modules used, up to 8 channels Configure & Quote
ModelDSA8300
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
Model Analog Bandwidth Sample Rate Record Length Analog Channels List Price
DSA8300 70 GHz Electrical, 80 GHz Optical Up to 300 kS/s 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) Determined by the sampling modules used, up to 8 channels Configure & Quote
ModelDSA8300
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
Datasheet LinkProbeDescriptionConfigure and Quote
DVT30-1MM GigaProbe

30 GHz TDR probe available from GigaProbes.

Contact Us
P8018 HANDHELD TDR PROBE, PASSIVE; 20 GHZ, SINGLE-ENDED, 50 OHM, SMA CONNECTOR WITH 20 GHZ SMA CABLE; DESIGNED TO WORK WITH 80A02 EOS/ESD PROTECTION MODULE; STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT Configure & Quote
P80318 Probe kit,18GHz 100 Ohm Differential Hand Probe Configure & Quote
Data SheetAccessoryDescription
80A02 EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT
80A03 TEKCONNECT PROBE INTERFACE MODULE
80B28G 8000 Series - Electrical Sampling Scope Bundle to Support 25/28 Gb/s standards (includes 80E09B, 82A04B, CR286A and accessories)
80C07B OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH
80C08D Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode
80C10C Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3)
80C11B Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode
80C12B 12 GHz, Broad WaveLength, Amplified Optical Sampling Module
80C14 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module
80C15 8000 Series Optical Module: single channel, 32GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80C17 8000 Series Optical Module: single channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80C18 8000 Series Optical Module: dual channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80E03 SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD
80E04 SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD
80E07B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1)
80E08B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1)
80E09B 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1)
80E10B 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1)
80E11 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1)
80E11X1 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1)
82A04B 8000 Series, Phase Reference Module (includes D1)
Data SheetModuleDescription
80A02 EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT
80A03 TEKCONNECT PROBE INTERFACE MODULE
80B28G 8000 Series - Electrical Sampling Scope Bundle to Support 25/28 Gb/s standards (includes 80E09B, 82A04B, CR286A and accessories)
80C07B OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH
80C08D Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode
80C10C Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3)
80C11B Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode
80C12B 12 GHz, Broad WaveLength, Amplified Optical Sampling Module
80C14 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module
80C15 8000 Series Optical Module: single channel, 32GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80C17 8000 Series Optical Module: single channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80C18 8000 Series Optical Module: dual channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm
80E03 SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD
80E04 SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD
80E07B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1)
80E08B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1)
80E09B 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1)
80E10B 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1)
80E11 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1)
80E11X1 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1)
82A04B 8000 Series, Phase Reference Module (includes D1)
TitleTypeDate
How do I use TekVISA to send commands to my instrument?
TekVISA Download Link: /node/69201In order to communicate with and control the scope, you can use OpenChoice Talker-Listener. Back on the Application and Utilities panel, click on OpenChoice Talker Listener and click Start Application or Utility. A new…
FAQ ID: 69181 11 Jun 2014
Tektronix Rolls Out HDMI 2.0 Compliance Test and Debug Support
New Test Solution Enables New “4K” Video Monitor Technology for
News Release 10 Jun 2014
Highly Reliable Testing of 10-Gb/s Systems (STM-64/OC-192)
The growth of the Internet, e-commerce, virtual private networks, IP telephony, and other data-centric applications, is prompting a demand for increased bandwidth. To keep up, network providers are being forced to move quickly from 2.5-Gb/s to 10-Gb/s…
Literature number: 85W-13595-0
Application Note 27 May 2014
Ultra-low Jitter Performance with Phase-Reference Module 82A04 & TDS/CSA8200 Sampling Oscilloscope

This application note discusses operation, functionality and ultra-low jitter measurement capabilities of the Tektronix 82A04 Phase-Reference Module.


Literature number: 85W-18385-0
Application Note 27 May 2014
Time Domain Methods for Measuring Crosstalk for PCB Quality Verification Application Note
Learn about the elements of crosstalk and how you can measure it on a single-layer PCB using a sampling scope.
Literature number: 85W-16643-0
Application Note 27 May 2014
Variations in 10 Gigabit Ethernet Laser Transmitter Testing Using Reference Receivers
One of the key tools used by telecom/datacom original equipment manufacturers, system installers and system servicers to view eye patterns on an oscilloscope and test the quality of a laser’s time-domain signal is the reference receiver (RR).
Literature number: 85W-16691-1
Application Note 27 May 2014
Finding and Examining Pattern-dependent Failures with FrameScan™ Acquisition Technology

This application note explains how the FrameScan technology locates and examines pattern-dependent failures at 10 Gbps and beyond.


Literature number: 85W-13561-2
Application Note 27 May 2014
Effects of Infiniband Fixture Crosstalk on Synthesized Eye Diagram
Application note for de-embedding fixture crosstalk from synthesized eye diagrams working on characterization of Infiniband designs.
Literature number: 61W-19673-0
Application Note 27 May 2014
HDMI/DVI Method Of Implementation (MOI)

Procedures Guide for HDMI Sink Instruments Differential Impedance Measurements using the Tektronix TDS/DSA8200 and Sampling Module 80E04

Method of implementation 25 May 2014
High-speed Interconnects: Characterization and Measurement-based Modeling

A primer that takes on the measurement issues of high-speed interconnects.


Literature number: 85W-19887-0
Primer 22 May 2014
Downloads
Download

Download Manuals, Datasheets, Software and more:

Go to top