DSA8300 Digital Sampling Oscilloscope
DSA8300 Digital Sampling Oscilloscope
With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4.
Features |
Benefits |
Electrical module signal measurement accuracy:
|
<100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterization of high bit-rate signals (5th harmonic to data rates of 28 Gb/sec and 3rd harmonic to data rates >45 Gb/sec). |
Industry’s lowest system noise at all bandwidths:
|
Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure. |
| Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe. | High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels. |
| Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4x25) Ethernet. | Provides cost-effective and versatile optical test system for single and multi-mode optical standards from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, -LR4 and ER4) at 850, 1310 and 1550nm. |
| Superior acquisition throughput with up to 300 kS/s maximum sample rate. | Reduced manufacturing or device characterization test-time by 4X with superior system throughput. |
| Ability to place the samplers adjacent to the device under test (DUT). | Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed. |
| Independent calibrated channel de-skew. | Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing. |
Models
| Model | Analog Bandwidth | Sample Rate | Record Length | Analog Channels | List Price |
|---|---|---|---|---|---|
| DSA8300 | 70 GHz Electrical, 80 GHz Optical | Up to 300 kS/s | 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) | Determined by the sampling modules used, up to 8 channels | Configure & Quote |
ModelDSA8300
List PriceConfigure & Quote
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
| Model | Analog Bandwidth | Sample Rate | Record Length | Analog Channels | List Price |
|---|---|---|---|---|---|
| DSA8300 | 70 GHz Electrical, 80 GHz Optical | Up to 300 kS/s | 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) | Determined by the sampling modules used, up to 8 channels | Configure & Quote |
ModelDSA8300
List PriceConfigure & Quote
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
| Datasheet Link | Probe | Description | Configure and Quote |
|---|---|---|---|
| DVT30-1MM GigaProbe | 30 GHz TDR probe available from GigaProbes. | Contact Us | |
| View Datasheet | P8018 | HANDHELD TDR PROBE, PASSIVE; 20 GHZ, SINGLE-ENDED, 50 OHM, SMA CONNECTOR WITH 20 GHZ SMA CABLE; DESIGNED TO WORK WITH 80A02 EOS/ESD PROTECTION MODULE; STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT | Configure & Quote |
| View Datasheet | P80318 | Probe kit,18GHz 100 Ohm Differential Hand Probe | Configure & Quote |
| Data Sheet | Accessory | Description |
|---|---|---|
| 80A02 | EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT | |
| 80A03 | TEKCONNECT PROBE INTERFACE MODULE | |
| 80B28G | 8000 Series - Electrical Sampling Scope Bundle to Support 25/28 Gb/s standards (includes 80E09B, 82A04B, CR286A and accessories) | |
| 80C07B | OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH | |
| 80C08D | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode | |
| 80C10C | Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3) | |
| 80C11B | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode | |
| 80C12B | 12 GHz, Broad WaveLength, Amplified Optical Sampling Module | |
| 80C14 | 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module | |
| 80C15 | 8000 Series Optical Module: single channel, 32GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | |
| 80C17 | 8000 Series Optical Module: single channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | |
| 80C18 | 8000 Series Optical Module: dual channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | |
| 80E03 | SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | |
| 80E04 | SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | |
| 80E07B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1) | |
| 80E08B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | |
| 80E09B | 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1) | |
| 80E10B | 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | |
| 80E11 | 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | |
| 80E11X1 | 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | |
| 82A04B | 8000 Series, Phase Reference Module (includes D1) |
| Data Sheet | Module | Description |
|---|---|---|
| 80A02 | EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT | |
| 80A03 | TEKCONNECT PROBE INTERFACE MODULE | |
| 80B28G | 8000 Series - Electrical Sampling Scope Bundle to Support 25/28 Gb/s standards (includes 80E09B, 82A04B, CR286A and accessories) | |
| 80C07B | OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH | |
| 80C08D | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode | |
| 80C10C | Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3) | |
| 80C11B | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode | |
| 80C12B | 12 GHz, Broad WaveLength, Amplified Optical Sampling Module | |
| 80C14 | 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module | |
| 80C15 | 8000 Series Optical Module: single channel, 32GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | |
| 80C17 | 8000 Series Optical Module: single channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | |
| 80C18 | 8000 Series Optical Module: dual channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | |
| 80E03 | SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | |
| 80E04 | SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | |
| 80E07B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1) | |
| 80E08B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | |
| 80E09B | 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1) | |
| 80E10B | 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | |
| 80E11 | 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | |
| 80E11X1 | 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | |
| 82A04B | 8000 Series, Phase Reference Module (includes D1) |