Download
Download

Download Manuals, Datasheets, Software and more:

DOWNLOAD TYPE
MODEL or KEYWORD
DDR

DDR Test, Validation and Debug

DDR Memory Interface

Double data rate (DDR) memory is being used in an increasing number of devices. It started with laptops, computers, and mobile devices and is now moving into cutting edge servers, automotive and cloud computing applications. Testing and validating the performance of DDR systems can be challenging, but upgrading your bench with oscilloscopes, probes and test automation software that were built with memory tech in mind can make the process simpler and more efficient.

DDR5

Compared to DDR3/4, DDR5 improves bandwidth, density and channel efficiency. But higher data transfer rates and faster signal speeds require higher performance measurements for compliance, debugging and validation.

Our TekExpress DDR5 Transmitter solution meets the latest JEDEC memory standard requirements so you can spend more time validating the memory design and less time collecting the data. DDR5 test automation software option is available for MSO/DPO70000DX/SX Series Oscilloscopes and offers:

  • DFE analysis on the bursty DDR traffic
  • Automated read and write burst separation
  • De-embedding techniques using SDLA

Learn More:TekExpress DDR5 Transmitter automation solution

Learn More:TekExpress DDR5 Transmitter datasheet

DDR Memory
DDR Memory Visual trigger

DDR4/LPDDR4

Fast data rates, flexibility and proven technology make DDR4 DRAM extremely common in today’s devices. Still, attention is needed to ensure that designs adhere to JEDEC standards. DDRA and DDR-LP4 test automation software options are available for MSO/DPO70000C/DX/SX Series Oscilloscopes and they offer:

  • Easy identification of reads and writes
  • Automated setup and testing per DDR4 or LPDDR4 specifications
  • Automated report generation
  • Support for a wide range of interposers and high-performance probes

Learn more: DDRA Memory Interface Verification and Debug datasheet

DDR3/LPDDR3

Amplitude, timing and eye diagram measurements are important for verifying compliance with JEDEC electrical standards for DDR3 and LPDDR3 designs.

Test automation packages are available for high-bandwidth MSO/DPO70000C/DX/SX Series oscilloscopes and for 6 Series MSOs, with their 12-bit analog-to-digital converters.

Both platforms offer:

  • Easy identification of reads and writes
  • Automated setup and testing per DDR3 specifications
  • Automated report generation
  • Support for a wide range of interposers and high-performance probes

6 Series MSO: DDR3 and LPDDR3 Measurement and Analysis datasheet

MSO/DPO70000C/DX/SX: DDRA Memory Interface Verification and Debug datasheet

DDR3 LPDDR3