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  • Testing Power Semiconductor Devices with Keithley High Power System SourceMeter SMU Instruments and ACS Basic Edition Software
    Technical Document

    Testing Power Semiconductor Devices with Keithley High Power System SourceMeter SMU Instruments and ACS Basic Edition Software

    Keithley’s SourceMeter Source Measure Unit (SMU) instruments give both device test engineers and power module design engineers the tools they need to make the measurements they require. Whether they’re familiar with curve tracers, semiconductor parameter analyzers, or oscilloscopes, they can obtain accurate results simply and quickly. This application note highlights some of the most commonly performed tests, the challenges associated with them, and how Keithley SMU instruments and ACS Basic Edition Software can simplify the testing process.
  • Source-Measure-Unit-Series-2400-Source-Measure-Unit-Datasheet
    Datasheet

    Series 2400 SourceMeter SMU Instruments

    Keithley’s Series 2400 Source Measure Unit (SMU) Instruments are designed specifically for test applications that demand tightly coupled sourcing and measurement. All SourceMeter models provide precision voltage and current sourcing as well as …
  • 2470 Graphical SourceMeter SMU Instrument Datasheet
    Datasheet

    2470 Graphical SourceMeter SMU Instrument Datasheet

  • ACS Wafer Level Reliability Edition Datasheet
    Datasheet

    ACS Wafer Level Reliability Edition Datasheet

    Keithley has taken the power of its Automated Characterization Suite (ACS) software and focused it on wafer level reliability (WLR) testing. ACS-WLRFL is an added functionality to ACS that leverages the measurement speed and system integration …
  • Measuring Breakdown Voltage on a Wide Bandgap MOSFET
    Videos, Webinars and Demos

    Measuring Breakdown Voltage on a Wide Bandgap MOSFET

    Watch this demonstration of a breakdown test on a Silicon Carbide MOSFET using a Keithley 2657A High Power System SourceMeter™ SMU Instrument, 8010 Test Fixture, and KickStart Software.
  • Source Measure Unit (SMU) Instruments Selector Guide
    Technical Document

    Source Measure Unit (SMU) Instruments Selector Guide

    MAKE MULTIPLE MEASUREMENTS ACCURATELY USING A SINGLE INSTRUMENT A source measure unit (SMU) instrument is a five-in-one tool. It combines the useful features of a digital multimeter (DMM), power supply, current …
  • Tips and Techniques for Efficient DC Testing and Current-Voltage Characterization
    Technical Document

    Tips and Techniques for Efficient DC Testing and Current-Voltage Characterization

    This e-guide explores some of the most common DC current vs. voltage (I-V) tests being performed today, the seemingly inherent complications posed by each, and how new techniques can help to not only overcome these challenges but enhance efficiency and productivity, as well.
  • Testing High Power Semiconductor Devices from Inception to Market
    Technical Document

    Testing High Power Semiconductor Devices from Inception to Market

    This primer discusses methods for efficient, flexible test and characterization throughout the life cycle of a power semiconductor device.
  • New High Power Semiconductor Devices are Pushing Instrumentation to Extremes
    Technical Document

    New High Power Semiconductor Devices are Pushing Instrumentation to Extremes

    Design and production of today’s semiconductors and power modules based on silicon carbide and gallium nitride demand more rigorous testing than with previous generations.  This technical brief provides information on how to cost-effectively achieve safe, accurate, and reliable testing to meet precise design requirements.
  • Keithley Test Fixtures Selector Guide
    Technical Document

    Keithley Test Fixtures Selector Guide

    Selector guide for Keithley text fixtures