Keithley Automated Characterization Suite (ACS) Software

All-in-one solution: from test setup to analyzing results

ACS is a flexible, interactive software test environment designed for semiconductor device characterization, reliability test, parametric test, and component functional test. ACS supports a wide range of Keithley instrumentation, as well as Keithley's S500 and S530 systems. Exceptional testing and analysis flexibility and an intuitive GUI make novice users productive almost immediately.

  • Intuitive GUI simplifies test plan development, test execution, and results analysis
  • Develop and execute tests at the device, site, wafer, and cassette level
  • Supports a wide range of instruments and system configurations including multi-SMU parallel test systems
  • Full control of semi-automatic and fully-automatic probers
  • Interactive and real-time data plotting

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Price starting from
US $5,990 - US $14,600
LIST PRICE
US $5,990
Description

ACS Basic Edition is primarily for semiconductor component testing with manual probe stations or test fixtures. Perform initial device characterization quickly and interactively with “Trace Mode.” Or create detailed parameter extraction tests using the GUI-based set-up screen and extensive measurement libraries.

LIST PRICE
US $14,600
Description

ACS supports a wide range of semi-automatic and fully automatic probers for semiconductor device measurements across an entire wafer. Or control the prober interactively for testing individual devices. Monitor testing progress with individual device results and multi-device statistics during run-time.

What is ACS?

ACS is a powerful software framework for engineers performing a wide range of tests for detailed characterization of semiconductor devices. Use ACS with Keithley’s broad line of industry-leading SMU instruments and systems. Automate testing at the wafer or cassette level controlling automated probers with standard ACS. For manual or single device testing, consider ACS Basic Edition. And for advanced multi-DUT wafer level reliability (WLR), use standard ACS with the ACS-2600-RTM option. Or learn more below about various applications, measurement hardware, and ACS capabilities!

Component Characterization

Create and manage a wide variety of in-depths tests and measurement results for discrete semiconductor components such as MOSFETs, bipolar transistors, diodes, high-power IGBTs, and more. Explore Keithley’s wide range of “Measurement Capabilities” and corresponding descriptions below.

Click on a Measurement Capability on the left to view it's Description

ACS Software
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ACS supports a wide range of semi-automatic and fully automatic probers for semiconductor component measurements across an entire wafer. Or control the prober interactively for testing individual devices. Monitor testing progress with individual device results and multi-device statistics during run-time.

ACS Basic Edition Software

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ACS Basic Edition is primarily for semiconductor component testing with manual probe stations or test fixtures. Perform initial device characterization quickly and interactively with “Trace Mode”. Or create detailed parameter extraction tests using the GUI-based set-up screen and extensive measurement libraries. Quickly, ACS Basic leads to real-time results for analysis within ACS Basic or for export to other offline analysis tools.

Series 2600B System SourceMeter® Source Measure Unit (SMU) Instruments
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Series 2600B SourceMeter SMU Instruments include dual-channel units, optimal for testing multi-terminal semiconductors such as MOSFETs and BJTs. And Keithley’s TSP-Link® provides coordinated control and precise timing between SMU instruments. Choose from a wide variety of models from the Series 2600 family to meet specific voltage and current specifications. Click here for more information.

Series 2650A High Power System SourceMeter Source Measure Unit (SMU) Instruments
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The Series 2650A High Power SourceMeter SMU Instruments can be used in a variety of test configurations. Source and measure 3kV or 50A pulse up to 2000W pulse or 200W DC. And best-in-class low current capability provides outstanding leakage measurements. Use Keithley’s TSP-Link® for integrated system configurations with lower power Series 2600B SourceMeter SMU Instruments. Click here for more information.

PCT Configurations

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Keithley's Parametric Curve Tracer configurations are complete characterization solutions for power device characterization, including high performance instruments, cables, test fixturing, and software. Seven configurations are available, each providing both real-time trace mode for quickly checking fundamental device parameters like breakdown voltage and full parametric mode for extracting precise device parameters.

Model 4200-SCS Parameter Analyzer
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The 200V/1A SMU and 400V C-V capabilities of the Model 4200-SCS Parameter Analyzer are ideal for semiconductor component characterization. Configure the 4200-SCS with 2650A High Power SourceMeter SMU Instruments for testing up to 3kV or 50A. Create and execute tests across this range of Keithley capabilities with ACS Basic Edition software. Click here for more information.

S500 Integrated Test Systems
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Experience full turnkey solutions from Keithley with S500 Integrated Test Systems. These highly configurable systems can incorporate a wide range of measurement capability for technology development test stations. Or use the automation of ACS with S500 systems for high throughput multi-device testing with automated wafer probers. Click here for more information.

 

Data SheetAccessoryDescription
ACS-2600-RTM RELIABILITY TEST OPTION TO ACS
TitleType
VDS Ramp and HTRB Reliability Testing of High Power Semiconductor DevicesApplication Note
Testing High Power Semiconductor Devices from Inception to MarketBrochure
ACS Integrated Test System for Multi-Site Parallel TestApplication Note
ACS Integrated Test System for Lab-Based Automation

Increasing time to market and cost of test pressures means that test engineers must do more with less. Leveraging Keithley’s proven instrumentation and measurements, ACS integrated test systems fill an important gap between interactive laboratory-based tools and high throughput production test tools.

Application Note
Testing Power Semiconductor Devices with Keithley High Power System SourceMeter SMU InstrumentsApplication Note
Evolving Semiconductor Characterization and Parametric Test Solutions for the Evolving Semiconductor Industry (also Applicable to Series 2600B)Whitepaper
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