Keithley 4200A-SCS Parameter Analyzer

Keithley 4200A-SCS Parameter Analyzer

Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.

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DC Current-Voltage
(I-V) Range

10 aA - 1A
0.2 µV - 210 V

Capacitance-Voltage
(C-V) Range

1 kHz - 10 MHz
± 30V DC bias

Pulsed I-V
Range

±40 V (80 V p-p), ±800 mA
200 MSa/sec, 5 ns sampling rate

 

Keithley 4200A-SCS Parameter Analyzer

Parametric insight, fast and clear.

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Making connections to your bold discoveries has never been easier. The 4200A-SCS Parameter Analyzer reduces characterization complexity and test setup by up to 50%, providing clear, uncompromised measurement and analysis capability. Plus, embedded measurement expertise—an industry first—provides test guidance and gives you supreme confidence in your results.

Highlights

  • Built-in measurement videos in English, Chinese, Japanese, and Korean
  • Jump start your testing with hundreds of user-modifiable application tests
  • Automated real-time parameter extraction, data graphing, arithmetic functions

Measure. Switch. Repeat.

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The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.

Highlights

  • Move C-V measurement to any device terminal without re-cabling
  • User-configurable for low current capability
  • Personalize the names of output channels
  • View real-time test status

Characterize. Customize. Maximize.

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Put simply, the 4200A-SCS is completely customizable and fully upgradeable so you can perform electrical characterization and evaluation of semiconductor devices, new materials, active/passive components, wafer level reliability, failure analysis, electrochemistry or virtually any type of sample.

Highlights

  • NBTI/PBTI testing
  • Random telegraph noise
  • Non-volatile memory devices
  • Potentiostat application tests

Integrated solution with analytical probers and cryogenic controllers.

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The 4200A-SCS Parameter Analyzer supports many manual and semi-automated wafer probers and cryogenic temperature controllers, including Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryogenic temperature controller.

Highlights

  • "Point and click" test sequencing
  • "Manual" prober mode tests prober functionality
  • Fake prober mode enables debugging without removing commands

 

Models

Model Current-Voltage (I-V) Range Capacitance-Voltage (C-V) Range Pulsed I-V Range List Price
4200A-SCS 10 aA - 1A
0.2 µV – 210 V
1 kHz – 10 MHz
± 30V DC bias
±40 V (80 V p-p), ±800 mA
200 MSa/sec, 5 ns sampling rate
Configure & Quote
Model4200A-SCS
Current-Voltage (I-V) RangeCapacitance-Voltage (C-V) RangePulsed I-V Range
10 aA - 1A<br> 0.2 µV – 210 V1 kHz – 10 MHz<br>± 30V DC bias±40 V (80 V p-p), ±800 mA<br> 200 MSa/sec, 5 ns sampling rate
Model Current-Voltage (I-V) Range Capacitance-Voltage (C-V) Range Pulsed I-V Range List Price
4200A-SCS 10 aA - 1A
0.2 µV – 210 V
1 kHz – 10 MHz
± 30V DC bias
±40 V (80 V p-p), ±800 mA
200 MSa/sec, 5 ns sampling rate
Configure & Quote
Model4200A-SCS
Current-Voltage (I-V) RangeCapacitance-Voltage (C-V) RangePulsed I-V Range
10 aA - 1A<br> 0.2 µV – 210 V1 kHz – 10 MHz<br>± 30V DC bias±40 V (80 V p-p), ±800 mA<br> 200 MSa/sec, 5 ns sampling rate

Semiconductor Reliability

Perform complex reliability tests while letting the 4200A-SCS take care of the complex coding. Included projects like Hot Carrier Injection Degradation (HCI) give you a jump start on device analysis.

Highlights

  • Combine DC I-V, C-V, and pulse measurements in one set of tests
  • Included support for many probe stations and external instruments
  • Easy to use cycling system allows repeat measurements without coding

C-V Measurement for High Impedance Applications

Use Keithley’s custom Very Low Frequency C-V Technique to analyze the capacitance of your high resistance sample. This technique is performed using only source measure unit (SMU) instruments but can be combined with a 4210-CVU to perform higher frequency measurements as well.

Highlights

  • .01 to 10 Hz frequency range with sensitivity of 1 pF to 10 nF
  • 3½-digit typical resolution, minimum typical of 10 fF

Non-volatile Memory

Put your new technologies to the test with thorough pulsed I-V characterization. The 4200A-SCS comes with support and ready-to-run tests for the latest in NVRAM technologies from floating gate flash to ReRAM and FeRAM. Dual sourcing and measuring capabilities in current and voltage allow both transient and I-V domain characterization.

VCSEL Testing

Multiple, concurrent source measure unit (SMU) instruments in the 4200A-SCS simplify your laser diode testing. Generate LIV (Light intensity-Current-Voltage) curves with connections to only a single box. Advanced probe station and switch support means you can use the same instrument for on-wafer production testing of individual diodes or entire arrays. SMUs can be configured for up to 21 W capabilities for a variety of continuous wave (CW) VCSEL applications.

Nanoscale Device Characterization

The integrated instrument capabilities of the 4200A-SCS simplify the measurement requirements in developing nanoscale electronics such as carbon nanotubes. Start your investigations from a preconfigured test project and expand your work from there. A pulsed source mode for SMUs helps reduce overheating problems can be combined with low voltage C-V and ultra-fast pulsed DC measurements in seconds.

Resistivity of Materials

Use a 4200A-SCS with integrated SMUs to easily measure resistivity using a four-point collinear probe or van der Pauw method. Included tests perform repetitive van der Pauw calculations automatically, saving you valuable research time. A maximum current resolution of 10aA and input impedance of >10­­­­16 ohms give you more accurate and precise results.

MOSFET Characterization

The 4200A-SCS can hold all the instruments necessary for full characterization of MOS devices through component or on-wafer testing. Included tests and projects solve for oxide thickness of a MOSCap, threshold voltages, doping concentration, mobile ion concentration, and more. All these tests can be run at the touch of a button from a single instrument box.

Datasheet Model Description Pricing
View Datasheet 4200A-SCS-PK1
High Resolution IV
210V/100mA, 0.1 fA resolution
For two- and three-terminal devices, MOSFET, CMOS characterization Package 4200A-SCS-PK1 includes:
  • 4200A-SCS parameter analyzer
  • (2) 4200-SMU Module
  • (1) 4200-PA Preamp
  • (1) 8101-PIV Test fixture with sample devices
Request a Quote
View Datasheet 4200A-SCS-PK2
High Resolution IV & CV
210V/100mA, 0.1 fA resolution, 1kHz - 10MHz
For high κ dielectric, deep submicron CMOS characterization Package 4200A-SCS-PK2 includes:
  • 4200A-SCS parameter analyzer
  • (2) 4200-SMU Module
  • (1) 4200-PA Preamp
  • (1) 4210-CVU Capacitance-Voltage Module
  • (1) 8101-PIV Test fixture with sample devices
Request a Quote
View Datasheet 4200A-SCS-PK3
High Resolution and Power IV & CV
210V/1A, 0.1 fA resolution, 1kHz - 10MHz
For power devices, high κ dielectric, deep submicron CMOS device characterization Package 4200A-SCS-PK3 includes:
  • 4200A-SCS parameter analyzer
  • (2) 4200-SMU Module
  • (2) 4210-SMU
  • (1) 4200-PA Preamp
  • (1) 4210-CVU Capacitance-Voltage Module
  • (1) 8101-PIV Test fixture with sample devices
Request a Quote
View Datasheet 4200-BTI-A
Ultra-fast NBTI/PBTI
For sophisticated NBTI and PBTI measurements on leading-edge silicon CMOS technology Package 4200-BTI-A includes:
  • (1) 4225-PMU Ultra-Fast I-V Module
  • (2) 4225-RPM Remote Preamplifier/Switch Modules
  • Automated Characterization Suite (ACS) Software
  • Ultra-Fast BTI Test Project Module
  • Cabling
Request a Quote

 

Data SheetModuleDescriptionConfigure and Quote
4200-BTI-A ULTRA FAST BTI PKG Configure & Quote
4200-PA REMOTE PREAMPLIFIER MODULE Configure & Quote
4200-SMU MEDIUM POWER SOURCE-MEASURE UNIT Configure & Quote
4200A-CVIV I-V/C-V MULTI-SWITCH MODULE Configure & Quote
4210-CVU CAPACITANCE-VOLTAGE UNIT Configure & Quote
4210-SMU HIGH POWER SOURCE-MEASURE UNIT Configure & Quote
4220-PGU HIGH VOLTAGE PULSE GENERATOR UNIT Configure & Quote
4225-PMU ULTRA-FAST PULSE MEASURE UNIT Configure & Quote
4225-RPM REMOTE PREAMPLIFIER/SWITCH MODULE Configure & Quote
4200-BTI-A ULTRA FAST BTI PKG Configure & Quote
4200-BTI-A ULTRA FAST BTI PKG Configure & Quote
TitleTypeDate
Resistivity Measurements of Semiconductor Materials Using the 4200A-SCS Parameter Analyzer and a Four-Point Collinear Probe
This application note explains how to use the 4200A-SCS with a four-point collinear probe to make resistivity measurements on semiconductor materials.
Literature number: 1KW-60640-0
Application Note 01 Sep 2016
Electrical Characterization of Photovoltaic Materials and Solar Cells with the 4200A-SCS Parameter Analyzer
I‑V, C‑V, C-f, DLCP, Pulsed I-V, Resistivity, and Hall Voltage MeasurementsThis application note describes how to use the 4200A-SCS Parameter Analyzer  to make a wide range of electrical measurements on PV cells, including DC and pulsed current-voltage (I‑V), capacitance-voltage (C‑V), capacitance-frequency (C-f), drive level…
Literature number: 1KW-60642-0
Application Note 01 Sep 2016
An Ultra-Fast Single Pulse (UFSP) Technique for Channel Effective Mobility Measurement
This application note describes a novel Ultra-Fast Single Pulse technique (UFSP) [4, 5] for accurate mobility evaluation, including the technique principle, how to connect the device, and how to use the Clarius software in the 4200A-SCS Parameter Analyzer…
Literature number: 1KW-60643-0
Application Note 01 Sep 2016
Using the Model 4225-RPM Remote Amplifier/ Switch to Automate Switching Between DC I-V, C-V, and Pulsed I-V Measurements
This application note explains how to use the 4225-RPM to switch between the SMU, CVU, and PMU and make DC I-V, C-V, and pulsed I-V measurements on a single device. In particular, it describes hardware connections and how to use the system software,…
Literature number: 1KW-60628-0
Application Note 01 Sep 2016
Performing Charge Pumping Measurements with the 4200A-SCS Parameter Analyzer
This application note explains how to make charge pumping measurements using the 4200A-SCS with the optional 4225-PMU Ultra-Fast I-V Module (PMU) or 4220-PGU Pulse Generator Unit (PGU).
Literature number: 1KW-60634-0
Application Overview 01 Sep 2016
Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the 4200A-SCS Parameter Analyzer
This application note explains how to optimize DC, pulsed I-V, and C-V measurements on a CNT FET using the 4200A-SCS Parameter Analyzer. It includes detailed information on proper cabling and connections, guarding, shielding, noise reduction techniques,…
Literature number: 1KW-60633-0
Application Note 01 Sep 2016
Four-Probe Resistivity and Hall Voltage Measurements with the Model 4200-SCS

Literature number: Rev 7.15.11 ah
Application Note 28 Aug 2016
Evaluating Hot Carrier Induced Degradation of MOSFET Devices
This application note describes how to use the key capabilities needed for measuring hot carrier induced degradation with the Keithley Model 4200-SCS Semiconductor Characterization System.
Application Note 11 Aug 2016
Evaluating Oxide Reliability
This application note describes how to use the Keithley Model 4200-SCS Semiconductor Characterization System to perform oxide reliability testing.
Application Note 11 Aug 2016
Ultra-Fast I-V Applications for the Model 4225-PMU Ultra-Fast I-V Module
The 4225-PMU is one of several modules available for the 4200-SCS Semiconductor Characterization System. Depending on the application’s requirements, the system can be configured to include precision DC source measure unit instruments, DC PreAmps, a multi…
Application Note 08 Aug 2016
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