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  • 2450
    Model

    2450

    Learn More Datasheet Manual
  • ultra sensitive current sources series 6200 manual 1
    Manual

    ultra sensitive current sources series 6200 manual 1

    Date: Saturday, October 26 2019

  • Keithley Instrumentation for Electrochemical Test Methods and Applications
    Technical Document - Note d'application

    Keithley Instrumentation for Electrochemical Test Methods and Applications

    This application note discusses a variety of electrochemical applications, including voltammetry, low and high resistivity measurements, battery test, potentiometry, electrodeposition, electrical device characterization, and other tests that involve sourcing and measuring current and voltage and measuring capacitance with high accuracy.

    1KW-60158-1 | Date: Wednesday, April 25 2018

  • AC Versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices
    Technical Document - Article technique

    AC Versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices

    With modern current sources and nanovoltmeters, the DC reversal method requires less power while providing excellent low-noise results. This combination is optimal for low frequencies (0.1–24Hz,) allowing measurements to be made much faster than with a lockin amplifier. At resistances less than 100mΩ, they have much better rejection of lead resistances, and, at resistances greater than 1MΩ, they have much higher input impedance and less associated loading error

    Date: Wednesday, February 07 2007

  • Precision, Low Current Sources for Device Testing and Characterization
    Technical Document - Brochure

    Precision, Low Current Sources for Device Testing and Characterization

    High accuracy, low noise sourcing combined with exceptional ease of use.

    Date: Friday, January 07 2005

  • High Accuracy Electrometers for Low Current/High Resistance Applications
    Technical Document - Brochure

    High Accuracy Electrometers for Low Current/High Resistance Applications

    Keithley has more than a half-century of experience in designing and producing sensitive instrumentation. As new testing requirements have evolved, we've developed dozens of different models to address our customers needs …

    Date: Friday, November 15 2002

  • 2461-Source-Measure-Unit-2461-SMU-Instrument-Datasheet
    Datasheet

    2461 SourceMeter SMU Instrument

    The Model 2461 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips.

    1KW-60288-2 | Date: Wednesday, December 18 2024

  • Source Measure Unit (SMU) Instruments Selector Guide
    Technical Document - Guide de sélection de produit

    Source Measure Unit (SMU) Instruments Selector Guide

    MAKE MULTIPLE MEASUREMENTS ACCURATELY USING A SINGLE INSTRUMENT A source measure unit (SMU) instrument is a five-in-one tool. It combines the useful features of a digital multimeter (DMM), power supply, current source, electronic load and pulse …

    1KW-61458-2 | Date: Tuesday, August 24 2021

  • NEWS BLOG: New Plug-in Cards Extend Keithley Automated Test Solution’s Capabilities for Hall Effect and Sensitive Measurements
    Blog Entry

    NEWS BLOG: New Plug-in Cards Extend Keithley Automated Test Solution’s Capabilities for Hall Effect and Sensitive Measurements

    Automated testing solutions such as the Keithley Series 3700A address the challenge of how to cost-effectively test large numbers of electronic products and components. The Series 3700A is based on …

    Dernière mise à jour : Tuesday, August 1, 2023

  • Optimizing Low-Current Measurements and Instruments
    Technical Document - Livre blanc

    Optimizing Low-Current Measurements and Instruments

    Characterizing devices at low current levels requires knowledge, skill, and the right test equipment. Even with all three, achieving accuracy at low current levels can be a challenge because the level of the current is often at or below the noise …

    Date: Thursday, June 13 2013

  • Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer
    Technical Document - Note d'application

    Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer

    Introduction The continuing push for more devices on each chip and faster clock speeds is driving the demand for shrinking geometries, new materials, and novel technologies. All of these factors have a tremendous impact on the lifetime and …

    1KW-61526-0 | Date: Monday, January 28 2019