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  • Datasheet Literature Number: ReleaseDate
    Bit Error Rate Tester
    The BERTScope Bit Error Rate Tester Series provides a new approach to signal integrity measurements of serial data systems. Perform bit error rate detection more quickly, accurately, and thoroughly by bridging eye diagram analysis with BER pattern …
    65W-25444-15
    M-PHY Receiver Solution Datasheet
    GRL’s MIPI MPhy Receiver Calibration and Test Application Software for the Tektronix BERTScope™ BSA(GRL-MIPI-MPHY-RX) provides an automated, simple, and efficient way to test MIPI MPhy Receiver to the Jitter Tolerance and other test requirements of …
  • Manuals Manual Type Part Number: ReleaseDate
    Tektronix BERTScope

    BSA & BA Remote Control Guide Programmer Manual

    Programmer Manuals 077069605
    Tektronix BERTScope

    Bit Error Ratio Analyzers & Pattern Generators Quick Start User Manual

    Primary User 071286904
    Tektronix BERTScope

    BSAPCI3 Instructions

    User Manuals 071304600
    Tektronix BERTScope BSA Series

    Declassification and Security Instructions

    Declassification Manuals 077079100
    Tektronix BERTScope

    BSAITS125 Declassification & Securities Instructions

    Declassification Manuals 077069500
    ITSRACK

    Rackmount Instructions

    User Manuals 071305100
    BERTScope Analyzers

    BERTScope Bitalyzer Remote Control Guide Programmer Manual

    Programmer Manuals 077067700
    BERTScope Analyzers

    BERTScope Bitalyzer Remote Control Guide Programmer Manual

    Programmer Manuals 077055400
    BERTScope Analyzers

    BERTScope Bit Error Ratio Analyzer Instructions Quick Start User Manual

    User Manuals 077055200
  • Technical Documents Document Type ReleaseDate
    High Speed Interface Standards
    How-to Guide
    Physical Layer Tests of 100 Gb/s Communications Systems
    In this application note, learn how to prepare for compliance measurements on 100G standards including IEEE802.3ba/bj/bm and the tests for optical, electrical, or PAM4 transmitters and receivers that help diagnose noncompliant components and systems.
    Application Note
    USB 3.1 Receiver Compliance Testing
    In this application note, all aspects of USB 3.1 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin.        
    Application Note
    Practices for Measurements on 25 Gb/s Signaling
    This application note describes the measurement practices for the characterization and compliance test of the transmitter and receiver for 25+ Gb/s signaling in 100 G systems. Focus is on oscilloscope measurements, with some comments on BERTs.
    Application Note
    Stress Calibration for Jitter >1UI
    While measuring the amount of jitter present on a signal is relatively straight forward conceptually; when the levels of jitter are small, amounts above a bit period (1 unit interval or UI) can be more difficult. This has practical consequences for …
    Application Note
    Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate
    Figure 1. An example Fibre Channel topology. Abstract The Fibre Channel standard is evolving to include the next generation "16G" data rate. Specifications show a line rate of 14 …
    Primer
    Stressed Eye Primer
    Figure 1. Conceptual picture of an ideal receiver. Figure 2. Simplified Receiver Block Diagram. Abstract Many high-speed serial …
    Primer
    PCI Express® Transmitter PLL Testing — A Comparison of Methods
    Abstract The electrical compliance test specification drafted by PCISIG requires testing loop response of the Phase Locked Loop (PLL) used in add-in cards to generate a local transmitter clock from a 100 MHz reference oscillator …
    Primer
    Stressed Eye: “Know What You’re Really Testing With”
    BER-based measurements can provide a better view of the stress eye opening down at the deep BER levels that the receiver will be expected to operate at when it is tested.
    Primer
    Clock Recovery Primer, Part 2
    Abstract Clock recovery is a common part of many measurements, whether as part of the test setup or part of the device under test. We’re going to look at clock recovery from a practical point of view, with emphasis on how it affects …
    Primer
    Clock Recovery Primer, Part 1
    Figure 1. If clock and data were to move in time by the same amount at the same time, a decision circuit could remove the effect of jitter. Abstract Clock recovery is a common part …
    Primer
    Dual-Dirac+ Scope Histograms and BERTScan Measurements
    Figure 1.1. Using an eye diagram to set a window around the crossing point and plot edge positions. Abstract Much has been written about the strengths and weaknesses of dual-Dirac …
    Primer
    Evaluating Stress Components using BER-Based Jitter Measurements
    Figure 1.1. Self-verification stress setup - connections to a BERTScope S or BERTScope with option SE (left). Stress user interface (right) showing the addition of individual impairments …
    Primer
    BERTScope® Bit Error Rate Testers Jitter Map “Under the Hood”
    Abstract Jitter Map is a capability on the BERTScope that uses BER measurements tomeasure Total Jitter as well as decompose jitter beyond basic Random and Deterministic Jitter. This paper introduces the reader to the methodologies …
    Application Note
    Exploring Power Supply Voltage Sensitivity in an IC with a BERTScope® Bit Error Rate Tester
    Eye diagrams alone may not be as effective in showing major system issues and should be coupled with BER-based measurements for deeper insight and problem resolution.
    Application Note
    Exploring Power Supply Voltage Sensitivity in an IC with a BERTScope® Bit Error Rate Tester
    Eye diagrams alone may not be as effective in showing major system issues and should be coupled with BER-based measurements for deeper insight and problem resolution.
    Application Note
    Comparing Jitter Using a BERTScope® Bit Error Rate Testing
    Introduction In most systems, it is desirable to have each data bit have the same duration (see Figures 1(a) and 2(d)). When bits vary in length, either randomly or systematically, this is known as jitter. One traditional form of …
    Application Note
    D.C. Blocks, a Trap for the Unwary When Using Long Patterns
    It is obvious to focus on ensuring that the upper frequency of the range is adequate to pass the desired data signal; while it is less obvious to worry about the low end frequency specification, this application note discusses that it can be equally …
    Application Note
    Signal Integrity of Reference Clock Bleed-Through in an IC
    This application note examines some signal integrity examples related to AMB testing, but also with wider applicability. Clock bleed-through is examined, as well as the effect of a lowered supply voltage on error performance.
    Application Note
    Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester
    Introduction Mask testing is a common method of estimating whether a transmitted waveform is of sufficient quality to meet system requirements. In most systems the requirement is to pass bits error free, or at least at better than 1 …
    Application Note
    Bridging the Gap Between BER and Eye Diagrams — A BER Contour Tutorial
    Abstract This paper provides an introduction to the BER Contour measurement - what it is, how it is constructed, and why it is a valuable way of viewing parametric performance at gigabit speeds. It also provides illustrative examples …
    Application Note
    Clock Recovery’s Impact on Test and Measurement
    Introduction Clock recovery plays a significant role in making accurate test measurements, whether incorporated into the test setup or as part of the device under test. As most gigabit communication systems are synchronous, the data …
    Application Note
    BSA Series BERTScope Bit Error Rate Testers Fact Sheet
    This BERTScope Fact Sheet contains key specs and ordering information for the BSA Series BERTScope Bit Error Rate Testers.
    Fact Sheet
  • Software Document Type Part Number: ReleaseDate
    Tektronix Receiver Test Application Software for USB3.1 Gen1 and Gen2 - V2.3.0
    USB 3.1 Gen1 and Gen2: Testing is described in the USB-IF Compliance Test Specification (CTS) document. Receiver testing is accomplished by connecting the output of a BERT pattern generator as an input to the DUT, through a specialized set of …
    Application 066195002
    BERTScope Application Software, V11.02.1903
    BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 28.6 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER …
    Application 066165804
    BSAUSB31 USB 3.1 Receiver Test Application Software, V1.1.1907
    The BERTScope USB 3.1 Receiver Test Automation Software runs on a BERTScope or PC, and connects to the BERTScope, DPP, CR, and Instrument Switch test equipment via LAN. It uses remote control automation protocols to fully automate USB 3.1 calibration …
    Application 066171100
    BERTSCOPE APPLICATION SOFTWARE, V11.02.1886
    BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 28.6 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER …
    Application 066165802
    BSAPCI3 PCIe 3.0 Receiver Test Application Software, V1.1.1449
    The PCIe 3.0 Receiver Test Automation Software (BSAPCI3) runs on a BERTScope or peripheral PC, and connects to a BERTScope and DPP (Digital PreEmphasis Processor) test equipment via LAN. It uses remote control automation protocols to fully automate …
    Application 066156501
    BERTScope Software Release, V 10.15.1284
    BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 28.6 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER …
    Firmware 066148402
    BERTScope Software Release
    BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 26 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER pattern …
    Application 066123808
    BERTScope Driver for LabVIEW V1.0.2
    BERTScope? and BERTScope? S Driver for LabVIEW Version 1.0.2 Release Date: June 1, 2006
    Driver 066130500
    BERTScope Software Release V 10.11.1006
    BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 26 Gb/s. They are the industry's first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER pattern …
    Firmware 066123802
    Bertscope USB 3.0 Support files V1.0
    The compressed file has the User patterns, Mask, JTOL and Configuration files for the Bertscope USB 3.0 application.
    Waveform 066124700
    Bertscope PCI Express Support Files V 1.0
    The compressed file has BERTScope User patterns, Mask Files and Jitter Tolerance files for the Bertscope PCI Express Application.
    Waveform 066124600
    Bertscope SAS Support files V1.0
    The compressed file has the BERTScope User patterns and Jitter Tolerance files for the Bertscope SAS application.
    Application 066124900
    Bertscope Software Support - Jitter Tolerance Template files V1.0
    BERTScope Template files to be used with the Jitter Tolerance applications.
    Waveform 066125000
    Bertscope SATA Support files V1.0
    The compressed file has the BERTScope User patterns and JTOL files for the Bertscope SATA application.
    Waveform 066124800
  • Get an overview of the optical solutions available from Tektronix. Learn about what we showcased at our OFC 2016 exhibit, then learn more about these solutions online.
    Duration: 1m 16s
    Python® is one of the preferred software environments to implement test strategy automation, due to its portability, ease of use, and scalability.  This webinar provides a good understanding of …
    Duration: 37m 53s
    Watch our webinar to learn about characterization, compliance test and validation of new designs for USB 3.1 and the Type-C Connector. You’ll see how you can simplify your validation tasks and …
    Duration: 31m 46s
    Learn how to address the test and measurement challenges posed by PCIE Gen1-5 for both base silicon testing and CEM compliance testing. Gain insights and solutions for automation, validation, and …
    Duration: 41m
    In this video we look at a topic that is becoming increasingly important in the high-speed serial industry—how to perform embedded measurements at the IC or PCB level using probes.
    Duration: 4m 14s
    View this demonstration of interoperability at OFC2013 using Tektronix DSA8300 Sampling Oscilloscope and BSA286C BERTScope. Tektronix assisted the Optical Internetworking Forum (OIF) and member …
    Duration: 4m 56s
    Designing and developing 100G components, modules and systems requires the latest tools and techniques. In this video, you'll learn how to:Set up a complete system for active optical cable …
    Duration: 2m 7s