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MIPI High Speed Serial Technologies: Debug and Conformance Testing Challenges and Solutions


View the slides from the presentation, MIPI High Speed Serial Technologies: Debug & Conformance Testing Challenges and Solutions, created by Tektronix' Ramesh P.E, Principal Engineer and Parthasarathy Raju, System Engineer.  It covers these topics:

  • MIPI D-PHYSM Overview of Signal Characteristic
  • Measurement/Probing Challenges
  • MIPI C-PHYSM Overview of Signal Characteristics
  • MIPI C-PHYSM Clock recovery and Switching Jitter
  • Stress Signal Generation for Receiver Testing