DDR Test, Validation and Debug

DDR Memory Interface

New generations of memory technology like DDR4 and LPDDR4 bring higher speeds, lower I/O voltage, and various form factors to meet different application needs. The result is new debug and validation challenges with tighter margins, faster edge rates and complex bus protocol.

Tektronix provides the most comprehensive tool set for memory validation and debug:

  • Electrical Validation for DDR:
    Capture, measure and characterize DDR memory interfaced signal behavior, jitter, eye size, crossover, strobes/clock alignment, bit errors.
  • Logic Validation for DDR:
    Capture and measure the digital logic state of the DDR memory interface and perform bus cycle based timing and protocol analysis.


DesignCon 2015 Paper - Designing High Performance Interposers with 3-port and 6-port S-parameters

This technical paper explains how multiport S-parameters can be used to validate memory interposer design cases. This helps memory designers understand some of the performance characteristics that can be inferred from S-parameters, as well as some of the interactions between the interposer and the device under test and probing system; leading to more accurate validation efforts on very fast memory systems utilizing DDR4 or LPDDR4. 

The NEW P7700 Series TriMode Probe provides the highest probe fidelity available…


The MSO/DPO70000 Series oscilloscope delivers exceptional signal acquisition…


The Tektronix P7700 TriMode Probe supports solder connections to a device under…

New Characterization Techniques for DDR4/LPDDR4 and Next Generation Memory Standards
This webinar provides an update on the latest characterization and debug techniques to enable analysis of the highest DDR4/LPDDR4 speed grades (DDR4-3200/LPDDR4-4266).  
Efficiently Design and Electrically Validate a DDR4 Interface

This webinar will show how Cadence and Tektronix can enable you with flexible and power efficient DDR4 IP, design and analysis tools used in the office, and lab-based solutions to address the key challenges in electrical validation of the DDR4 interface.

Memory Interface Verification and Debug

This webinar will explain how to prepare for next generation DDR-based memory testing. Learn about the changes these new standards bring to electrical verification and how to prepare for proper signal access to LPDDR3 and DDR4 memory systems. Get advance knowledge to plan for proper instrument selection needed for performing electrical verification tests on these emerging standards.


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