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Tag: #SMU

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Keithley’s 2601B-PULSE System SourceMeter product image
Speeding up Failure Analysis using Lock-in Thermography Thursday, February 4, 2021
Semiconductor companies and semiconductor researchers are constantly looking for ways to make devices fail in the lab in order to prevent failures in the field. Countless hours are spent by failure analysis (FA) engineers trying to understand why a device failed and how it can be prevented in the future. This is vital as many devices are used in mission critical applications where “failure is not …
How Keithley’s New 2601B-PULSE Can Help Vertical Cavity Surface Emitting Laser (VCSEL) Designers Save More Lives Tuesday, April 21, 2020
It’s late at night and you’re driving home. You’re tired and just want to get to bed. But then, all of a sudden, you are faced with a big animal in the middle of the road. Immediately, your car slams on the brakes to prevent you from hitting the animal and from swerving off the road. Through the technology of light detection and ranging – better known as LIDAR, your vehicle has protected you from …
MOSFETs Characterization in the Low Power Range Wednesday, March 25, 2020
Introduction The Semiconductor Industry is always searching for new special materials, dielectric solutions, and new device geometries for scaling down the device size further and further. Lateral and vertical heterostructures of 2D materials, for instance, have led to new revolutionary tiny and low-power electronics. A 4200A Electrical Parameter Characterization system controlled from his …
They’re Back: New Software for Keithley SMUs Emulates Classic Tektronix Curve Tracers Saturday, December 7, 2019

Tektronix introduced the industry’s first curve tracer in 1955 to display characteristic curves for vacuum tubes, followed over the years by models for testing transistors, diodes and other solid-state devices. Tektronix curve tracers such as the 576 (below) and 370A/370B went on to broad industry acceptance until production eventually stopped in the mid-eighties. Approximating a power supply and an oscilloscope packaged in the same box, curve tracers source voltage while plotting voltage vs. current.

New SMUs Overcome Tough Test Challenges Involving Low-Current, Capacitive Setups Friday, November 1, 2019
Test setups that involve the use of long cables or capacitive chucks can increase capacitance at the output of the test instrument, resulting in inaccurate or unstable measurements. This is particularly true for very sensitive low-current measurements while sourcing or sweeping a DC voltage. To address these challenges, Keithley, a Tektronix Company, has introduced two new source measure unit (SMU …
Performing Breakdown Voltage and Leakage Current Measurements on Today’s High Voltage Semiconductor Devices Wednesday, September 11, 2019
After years of research and design, Silicon Carbide (SiC) and Gallium Nitride (GaN) power devices are becoming more viable.  But, these devices, though high performance, come with challenges, including gate drive requirements.   SiC requires much higher gate voltage (Vgs) with a negative bias for turn off.  GaN, on the other hand, has much lower threshold voltage (Vth), requiring tight gate drive …
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Are You Making the Big ‘Power’ Switch to SiC and GaN? Wednesday, May 15, 2019
Silicon Carbide and Gallium Nitride demand for 5G, automotive, and energy systems is rising. Design complexity is increasing; the time to market window continues to shrink. It’s increasingly harder to ensure that designs meet demanding specifications and compliance requirements. Does this sound all too familiar to you? While we take so much for granted, many engineers and scientists are working …
From Button Pushing to Automation: Getting Started with Scripting
From Button Pushing to Automation: Getting Started with Scripting Saturday, January 19, 2019
By Andrew Kirby Making simple electrical measurements is something that every engineer is familiar with. These measurements are the usual: current, voltage, and resistance. In a typical benchtop setting, these measurements are made one at a time, using the front panel of a given instrument. The knobs of the power supply are turned to the appropriate voltage, the current limit is set, the DMM is …

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