400G Optical and Electrical Tx

Tektronix provides the support, expertise and equipment to perform standards-compliant Tx and Coherent Optical testing for 400G Networking technologies. Tektronix is the only test and measurement vendor offering comprehensive 400Gb/s transmitter testing tools for NRZ and PAM4 signaling as well as complex coherent modulation formats.

Tx Testing Solutions from Tektronix

Real-time Oscilloscope DPO70000SX offers un-paralleled debug and analysis capability for general purpose design, greatly simplifying the complex test setups found in 400G testing.

  • NEW! With the DPO7OE1 Optical Probe for the MSO/DPO70000 scopes you can easily troubleshoot your optical devices by adding powerful debug capabilities: software clock recovery for PAM4 and NRZ, triggering, error detection, and capture time correlated or contiguous acquisition of a signal.
  • PAM4 Software for DPO70000SX offers fully featured 400G measurements supporting emerging OIF-CEI and IEEE standards.
    • Opt. PAM4 - Comprehensive PAM4 analysis and debug including jitter, noise, BER, SNDR and more. See datasheet »
    • Opt. 400G-TXE – TekExpress 400G TX electrical compliance solution (OIF-CEI-56G-VSR, MR, and LR). See datasheet »

Sampling Oscilloscope DSA8300 has exceptionally high dynamic range, making it well-suited for detailed characterization for PAM4 and Transmitter Distortion Eye Closure Quaternary (TDECQ) based measurements on both electrical and optical based signals for both R&D and manufacturing test.

  • NEW! The 80C17 and 80C18 Optical Modules for the DSA8300 provide the industry's highest mask test sensitivity and lowest optical noise along with new features that increase production capacity and improve yield for current 100G designs moving into production.
  • PAM4 Software for DSA8300 offers fully featured 400G measurements supporting emerging OIF-CEI and IEEE standards.
    • Opt. 80SJARB/80SJNB -  Jitter, noise, and BER analysis of high-speed PAM-4 and PAM-2 NRZ serial data rates.  See datasheet »
    • Opt. 80S400G-TXO –TekExpress 400G TX optical compliance solution. (IEEE802.3bs and IEEE802.3cd).  See datasheet »

See Tektronix solutions for 100G »

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Overcoming SNDR Measurement Challenges in 100G, 400G Datacom Testing

With important changes occurring in transmitter characterization and measurement methods for 100G and 400G standards (both IEEE and OIF-CEI) it is vital to learn more about SNDR and its advantages, key instrument considerations to account for, and how acquisition bandwidth influences SNDR noise parameters and more.

Find the most comprehensive solution available for PAM4 analysis. Find out about…


Learn how more margin and higher yields are made possible with lowest optical…


Discover the coherent optical analysis solution that enables simultaneous signal…


This video highlights the benefits of using the DPO70000SX real time oscilloscope…


See a 100G/400G research and development solution including new optical-to-…


Watch our highlights overview of OFC 2017! 

Effective Optical Test Strategies for 400G Optical Standards

This webinar discusses how designers and test engineers can determine the most effective optical test strategies for 400G Optical Standards. Learn where PAM-2 and PAM-4 fits, PAM-4 specific Mask Testing- rethinking hit ratios, what is TDEC and how is TDECQ different, and much more.

PAM4 Electrical Webinar

This presentation will review PAM4 measurement methodologies and expand on emerging needs related to FFE reference equalization, clock recovery challenges, BER measurement needs as well as SNDR as it relates to multi-level signaling. 

Maximizing Margins for 4th Gen High Speed Serial Standards

As data rates increase, the effect of cables and fixtures become a larger part of the overall measurement result. Gain insight into the issues and how to solve them for each step of the signal path from the device under test to the oscilloscope.

Electrical Validation of the Type-C Interface

The introduction of the Type-C interface, and its implementation across multiple high-demand serial standards, has created new challenges for developers. This webinar explores the latest updates to the Type-C specification, as they pertain to USB3.1, DisplayPort, and Thunderbolt standards, including Power Delivery.

Practical 400G PAM4 Test Methods - Optical and Electrical Measurement

The accelerated development of 400G Ethernet technology is driving new requirements through the test community as it relates to measuring PAM4 signals for optical and electrical systems. This presentation will review both of these two very different technology fronts and discuss practical elements of physical layer PAM4 testing ranging from 50mm based CEI-XSR specs to 10Km 400GBASE-LR8.

NBASE-T and IEEE802.3bz Technology and Measurements

The rapid growth of ever-more powerful mobile devices, and the adoption of new wireless technologies such as 802.11ac, has enterprise networks struggling to keep pace. An overview of NBASE-T and the emerging IEEE802.3bz standard, as well as key measurement challenges, will be presented in this webinar.

New Technologies for Probing Low Power Circuits Webinar

As designs for mobile devices and computers use lower power circuits in their design, validation testing and debug become more challenging.


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