Contact us
Contact us
Live Chat with Tek representatives. Available 6:00 AM - 4:30 PM PST.
Download
Download
Download Manuals, Datasheets, Software and more:
100G Optical and Electrical Tx/Rx
Tektronix provides comprehensive Tx & Rx testing support for 100G standards along with testing guidance for both NRZ and PAM4 signaling as well as Complex Coherent Modulation formats. Tektronix Test Instrumentation will get your team ready to tackle the next wave of datacom technologies.
- DPO70000SX Series Real Time Oscilloscopes offer the ability to efficiently prove-out your technology advances and rapidly de-bug and validate 100G electrical technology standards. Clarify your 100G design's performance with an industry-low noise floor and high sample rate.
- NEW! With the DPO7OE1 Optical Probe for the MSO/DPO70000 scopes you can easily troubleshoot your optical devices by adding powerful debug capabilities: software clock recovery for PAM4 and NRZ, triggering, error detection, and capture time correlated or contiguous acquisition of a signal.
- DSA8300 Series Sampling Oscilloscopes are suitable for accurate characterization of optical transmitter performance for major single-mode optical standards using industry leading built-in optical reference receivers with very low OSNR.
- NEW! The 80C17 and 80C18 Optical Modules for the DSA8300 provide the industry's highest mask test sensitivity and lowest optical noise along with new features that increase production capacity and improve yield for current 100G designs moving into production.
- CR286A Clock recovery instruments support most 100Gbp/s standards and work in concert with the Tektronix Sampling Scopes and BERT’s to deliver a stable clock for accurate timing measurement analysis.
- BERTScope BSA Series Bit Error Rate Testers provide long pattern generation of PRBS signals along with very accurate BER measurement results and deep, root-cause analysis.
Featured Content
PAM4 in 400G, 200G, 100G, 50G Networking Technology Poster
Download this PAM4 poster and easily reference key measurements for electrical and optical signals to gain insight into signal impairments, better understand TDECQ and SNDR and how to successfully measure, and get the latest IEEE and OIF-CEI PAM4 standards overview.
NEW! 100G Link Training Tool for Debugging Datacenter Technologies
Watch this short video for an overview of the new Link Training Tool, part of the expanded analysis software for Tektronix DPO70000SX oscilloscopes. Link Training helps engineers to verify complex 100G datacenter interconnects and quickly pinpoint problems when links fail to train.
Physical Layer Tests of 100 Gb/s Communications Systems
Learn how to prepare for compliance measurements on 100G standards.
Library
| Title |
|---|
|
Semtech Turns to Tektronix DSA8300 Sampling Scope to Characterize New 25-28 Gb/s CDR Devices
This customer case study illustrates the benefits that Tektronix DataCom test solutions deliver to characterize electrical performance of 100G technologies with the industry’s lowest intrinsic noise …
|
|
Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate
Study the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces. Included is a test and …
|
|
Clock Recovery Primer, Part 1
Part 1 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.
|
|
Ultralow drive voltage silicon traveling-wave modulator Paper (Optical Society of America)
Silicon platforms are emerging as a commercial platform for integrated photonics. To integrate directly with on-chip electronics, drive voltages at or below 1 Vpp are desirable.In this paper from the …
|
|
Optical Bandwidth Requirements for NRZ and PAM4 Signaling
Until recently, both optical and electrical bandwidths produced similar results but this is no longer the case with the recent IEEE spec change. This paper clarifies these terms, mathematically shows …
|
|
32 Gbit/s QPSK Transmission at 385 GHz
Learn more about a world record breaking wireless system capable of transmitting data at 400 GHz (0.4 THz) using advanced signal coding (up to QAM-16) and key advanced THz devices in this whitepaper …
|
|
Extinction Ratio (ER) Calibrated White Paper
This white paper explains some of the benefits of highly accurate ER measurements in both 10 GbE (Ethernet), with its relatively low ER requirement, and in SONET/ SDH , and the methodology that …
|
|
Overcoming SNDR Measurement Challenges in 100G, 400G Datacom Testing
With important changes occurring in transmitter characterization and measurement methods for 100G and 400G standards (both IEEE and OIF-CEI) it is vital to learn more about SNDR and its advantages …
|
|
Coherent Optical Signal Generation with High-Performance AWG
Learn how instrument characteristics and performance level of the AWG70000 influence the ability to generate different modulation schemes and the way the instrument’s flexibility can be used to …
|
|
100G/400G Datacom Transmitter Measurements: Determining Proper Measurement Tools for 100G/400G Datacom Testing
This application note walks through a number of common misconceptions and key considerations to help you select the proper scope technology (RTO vs. ETO) for your needs.
|
| Title |
|---|
|
NBASET and IEEE8023bz Technology and Measurements
The rapid growth of ever-more powerful mobile devices, and the adoption of new wireless technologies such as 802.11ac, has enterprise networks struggling to keep pace. To meet these rising bandwidth …
|
|
Characterizing Coherent Optical Systems Webinar
Learn about the coherent modulation being considered for 400G networks, the key building blocks of a coherent test system, how to optimize measurement accuracy and the benefits of customizable …
|
|
PAM4 Electrical Webinar
The accelerated development of 400G Ethernet technology is driving new requirements through the test community as it relates to measuring electrical PAM4 systems. This presentation will review PAM4 …
|
|
New Technologies for Probing Low Power Circuits Webinar
As designs for mobile devices and computers use lower power circuits in their design, validation testing and debug become more challenging. Board and component density increase leaving little space …
|