Tektronix provides test tools to serve the validation, compliance, and debug needs of engineers designing USB 2.0, USB 3.1, USB PD and USB Type-C based systems, which are compliant to the USB-IF test standards.

USB 3.1 transmitter testing requires jitter and eye height measurements after applying an equalizer and clock recovery functions. USB 3.1 receiver testing checks for bit error ratio while injecting a worst case test pattern containing different forms of jitter. In addition, USB Type-C based designs may require power delivery (PD) testing as well as alternate modes such as DisplayPort or MHL serial buses.

Featured Content

Understanding and Characterizing Jitter Primer

Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. This paper focuses primarily on jitter in electrical systems.

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Anatomy of an Eye Diagram Application Note

This application note discusses different ways that information from an eye diagram can be sliced to gain more insight. It also discusses some basic ways that transmitters, channels, and receivers are tested.

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Testing USB3.1 Knowledge Series Webinar

With computer peripheral devices demanding more bandwidth; the industry is making its move to faster serial I/O. USB3.1 brings a staggering 10Gb/sec to computing peripherals. View this short webinar to learn more about this new standard and how to prepare for compliance tests.

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