Universal Serial Bus (USB) has grown to become a common interface in many embedded industrial, automotive, and consumer applications. What began with USB 2.0 operating at 480 Mb/s has grown to today’s USB 3.1, which transforms the USB interface into a high-speed (10Gb/s), high-power (up to 100 watts) platform. A new USB Type-C connector dramatically changes the user experience and paves the way for future, higher performance USB products.

USB 3.1 transmitter testing requires jitter and eye height measurements after applying an equalizer and clock recovery functions. USB 3.1 receiver testing checks for bit error ratio while injecting a worst case test pattern containing different forms of jitter. In addition, USB Type-C based designs may require power delivery (PD) testing as well as alternate modes such as DisplayPort or MHL serial buses.

Tektronix provides test tools to serve the validation, compliance, and debug needs of engineers designing USB 2.0, USB 3.1, USB PD and USB Type-C based systems, which are compliant to the USB-IF test standards.

  • Datasheet
      • USB Power Compliance Solution Datasheet
      • USB 2.0 Application Software
      • USB3 Transmitter and Receiver Solutions
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Debugging Serial Buses in Embedded System Designs

Find out how the protocol trigger, decode and search capabilities of the popular MSO and DPO Series oscilloscopes solve serial bus integration and debug challenges of many buses such as I2C, SPI , USB, RS-232/422/485/UART, CAN, LIN, FlexRay, Ethernet, and I2S/LJ/RJ/TDM.

The Basics of Serial Data Compliance and Validation Measurements

This primer is designed to help you understand the common aspects of serial data transmission and to explain the analog and digital measurement requirements that apply to these emerging serial technologies

Understanding and Characterizing Timing Jitter Primer

Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. This paper focuses primarily on jitter in electrical systems.

Triggering Fundamentals With Pinpoint® Triggering and Event Search & Mark for DPO7000

This document discusses some fundamentals of triggering, and how Pinpoint triggering takes triggering in real-time oscilloscopes to a new level.

Understanding and Performing USB 2.0 Physical Layer Testing

This application note provided an overview of USB 2.0 physical layer testing including signal quality, in-rush current check, drop and droop tests. It describes tests for high-speed mode, and information on using protocol analysis for debugging.

USB 3.0 Receiver Compliance Testing

All aspects of USB 3.0 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin.

USB 2.0 Compliance Solution

This fact sheet details the recommended equipment to meet the USB 2.0 compliance testing requirements.

Simplifying Validation and Debug of USB 3.0 Designs

This application note explores the new challenges associated with USB 3.0 and the tools needed for validation and debug of superspeed designs.

USB 3.0 Physical Layer Measurements

Evaluation Engineering


USB3 Receiver Test Automation

This step-by-step guide to USB3 receiver testing, uses the Tektronix DPO70000 Series oscilloscope and BERTScope hardware and automation software.

Testing USB 3.1

View this short webinar to learn more about this new standard and how to prepare for compliance tests.

Receiver Testing to Third Generation Standards Webinar

With the advent of 3rd Generation Serial Standards at rates above 5 GT/sec, it is critically important to characterize receiver performance for a successful serial communication system design. This seminar, using PCI Express 3.0 and USB3 as example standards, will highlight the latest trends and illustrate important practical learnings for successful test execution.

Overcoming Challenges in S-Parameter Measurements

In this webinar we will describe and demonstrate the latest tools available to perform serial data S-parameter measurements for more efficient signal integrity analysis. This versatile approach provides repeatable, accurate, cost-effective results.

USB3 Receiver Test Automation (55W-27049-0 )

55W-27049-0 USB3 RX test automation, step-by-step guide using DPO70K and BERTScope hardware/software.


Tektronix High-Speed Electrical Testing - Host MOI

High-Speed Electrical Testing - Host MOI

High-Speed Electrical Testing - Hub MOI

High-Speed Electrical Testing - Hub MOI

Tektronix USB2.0 Device MOI

USB 2.0 Universal Serial Bus Measurement MOI

USB 3.1 Receiver Testing MOI

This MOI reviews the methods used for USB 3.1 (10 Gb/s) receiver compliance testing using the BERTScope Bit Error Rate Testers.

USB 2.0 Test Procedures MOI

USB 2.0 Test Procedures Method of Implementation

USB 3.1 Cable Tests MOI

This MOI specifies the testing procedures for the SuperSpeed channels of a USB 3.1 cable and mated cable assembly including Type-C to Type-C and Type-C to legacy connectors.


This MOI specifies the testing procedures for USB 3.0 Transmitter Tests using Tektronix DPOJET and Tektronix Oscilloscopes.

USB 3.0 Receiver Testing MOI

This MOI reviews the methods used for USB 3.0 receiver compliance testing using the BERTScope Bit Error Rate Testers.

USB 3.0 Cable Tests MOI

This MOI specifies the testing procedures for the Super Speed channels of a USB 3.0 cable and mated cable assembly..

Related Information

Understanding and Characterizing Timing Jitter Primer

Solve jitter timing issues faster with the power of Tektronix Jitter & Timing Analysis tools.

Download Anatomy of an Eye Diagram Application Note

Learn how transmitters, channels, and receivers are tested and the different ways an eye diagram can be sliced to gain more insight.

Standards Bodies' Specs

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