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USB
Tektronix provides comprehensive, integrated tool sets to serve the validation, compliance, and debug needs of engineers designing USB2.0 and 3.0 based systems, which are compliant to the USB-IF test standards.
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Debugging Serial Buses in Embedded System DesignsFind out how the powerful trigger, decode and search capabilities of the popular MSO and DPO Series oscilloscopes solve serial debug challenges with exceptional efficiency. |
Triggering Fundamentals With Pinpoint® Triggering and Event Search & Mark for DPO7000This document discusses some fundamentals of triggering, and how Pinpoint triggering takes triggering in real-time oscilloscopes to a new level. |
Understanding and Performing USB 2.0 Physical Layer TestingUSB 2.0 physical layer measurements and electrical compliance testing |
USB 3.0 Receiver Compliance TestingAll aspects of USB 3.0 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin. |
The Basics of Serial Data Compliance and Validation MeasurementsThis primer is designed to help you understand the common aspects of serial data transmission and to explain the analog and digital measurement requirements that apply to these emerging serial technologies |
Understanding and Characterizing Timing Jitter PrimerTiming jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. This paper focuses primarily on jitter in electrical systems. |
USB 3.0 Physical Layer MeasurementsEvaluation Engineering |
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USB3 Receiver Test Automation |
This step-by-step guide to USB3 receiver testing, uses the Tektronix DPO70000 Series oscilloscope and BERTScope hardware and automation software. |
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Receiver Testing to Third Generation Standards Webinar |
With the advent of 3rd Generation Serial Standards at rates above 5 GT/sec, it is critically important to characterize receiver performance for a successful serial communication system design. This seminar, using PCI Express 3.0 and USB3 as example standards, will highlight the latest trends and illustrate important practical learnings for successful test execution. |
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Overcoming Challenges in S-Parameter Measurements |
In this webinar we will describe and demonstrate the latest tools available to perform serial data S-parameter measurements for more efficient signal integrity analysis. This versatile approach provides repeatable, accurate, cost-effective results. |
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USB3 DPOJET MOI |
This MOI specifies the testing procedures for USB 3.0 Transmitter Tests using Tektronix DPOJET and Tektronix Oscilloscopes. |
USB 3.0 Cable Tests MOI |
This MOI specifies the testing procedures for the Super Speed channels of a USB 3.0 cable and mated cable assembly.. |
USB 3.0 Receiver Testing MOI |
This MOI reviews the methods used for USB 3.0 receiver compliance testing using the BERTScope Bit Error Rate Testers. |
Related Information
Understanding and Characterizing Timing Jitter Primer
Solve jitter timing issues faster with the power of Tektronix Jitter & Timing Analysis tools.
Download Anatomy of an Eye Diagram Application Note
Learn how transmitters, channels, and receivers are tested and the different ways an eye diagram can be sliced to gain more insight.
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