Jitter and Eye Diagram Analysis Tools

DPOJET

Features & Benefits

• Jitter and Timing Analysis for Clocks and Data Signals
• Real-Time Eye Diagram (RT-Eye™) Analysis*¹
• TekWizard™ Interface for One-Button and Guided Jitter Summaries
• Full Pass/Fail Limits and Mask Testing with Comprehensive Standards Support Library; plus User Limit and Mask Files allows Support of Custom Test Configurations and New or Developing Standards
• Accurate Jitter Decomposition and TJ(BER) Estimation*² with Selectable Jitter Models Support Popular Standards; Fibre Channel or PCI-Express Delta-Delta (Dual-Dirac) and Convolved Results
• Nine Plot Types to View and Analyze Jitter: Eye Diagram, CDF Bathtub, Spectrum, Histogram, Trend, Data, Phase Noise and Transfer Function
• Programmable Software Clock Recovery including Software PLL*³
• User Selectable Golden PLL Support for Popular Standards
• Selectable High and Low Pass Measurement Filters
• Selectable High and Low Limit Measurement Bounds Test
• Comprehensive Statistics Logging, Reporting and Remote Automation
• Capture and Save Worst Case Signals for Detailed Analysis

Applications

• Characterize Performance of High-speed Serial and Parallel Bus Designs
• Characterize Clock and Data Jitter and Signal Integrity
• Characterize PLL Dynamic Performance
• Characterize Modulation of Spread Spectrum Clock Circuits
• Characterize Jitter Generation, Transfer and Tolerance
• Perform PHY Testing of PCI-Express, Serial ATA, SAS, Fibre-Channel, DisplayPort, DDR2, DDR3, FBD, and other Electrical and Optical Systems

Real Time Jitter and Eye Diagram Analysis

DPOJET is the premiere eye diagram, jitter, and timing analysis package available for real-time oscilloscopes. Operating in the Tektronix DPO7000, DPO70000, and DSA70000 Series oscilloscopes, DPOJET provides engineers the highest sensitivity and accuracy available in real-time instruments. With comprehensive jitter and eye diagram analysis and decomposition algorithms DPOJET simplifies discovering signal integrity concerns and jitter and their related sources in today's high speed serial, digital, and communication system designs.

Analog and digital designers in the computer, semiconductor, and communications industries are facing new challenges as processor clock speeds race beyond 3 GHz and back-plane bus and serial link data rates exceed 8 GT/s. These increasing speeds mean reduced circuit tolerance, or margin, for jitter and related signal integrity problems. By using tools that help you rapidly characterize and discover sources of jitter and signal integrity concerns, you can bring new designs to market faster, with more confidence that they operate reliably in today's ultra high-speed environment. Bringing new products to market faster with higher reliability and higher performance means greater opportunities for improving margins at your company.

Partial List of Measurements

Period/Frequency Measurements	Frequency, Period, N-Period, Cycle-Cycle Period, Positive Width, Negative Width, Positive Duty Cycle, Negative Duty Cycle, Positive Cycle-Cycle Duty, Negative Cycle-Cycle Duty
Time Measurements	Rise Time, Fall Time, High Time, Low Time, Setup, Hold, Skew
Amplitude Measurements	High, Low, High-Low, Common Mode, T/nT Ratio, Differential Crossover
Eye Diagram Measurements	Eye Height, Eye Width, Width@BER, Mask Hits
Jitter Measurements	TIE, RJ, DJ, TJ(BER), PJ, DCD, DDJ, RJ(δ-δ), DJ(δ-δ), Phase Noise
Clock Recovery Methods	Constant Clock Mean, Constant Clock Median, PLL, External, PLL External
Plots	Histogram, Time Trend, Data Trend, Spectrum, Phase Noise, Transfer Curve, Eye Diagram with Waveform Database, Eye Diagram Statistics (CDF Bathtub)
Limit and Mask Testing	Pass/Fail Measurement Test Limits, Load and Test to Standard Masks
Measurement Source	CH1 - CH4, MATH1 - MATH4, REF1 – REF4
Data Logging	Measurements, Statistics, Worst Case Waveform, and Snapshots
Report Generation	Export HTML Formatted Reports with Summary, Statistics, Plots, and Pass/Fail

DPOJET Jitter and Eye Diagram Analysis Tools extends Tektronix’ real-time oscilloscopes capability, performing complex measurements and analysis of clock, serial and parallel data signals captured in single shot acquisition mode or in continuous run acquisition mode. Providing jitter and timing measurements with pass/fail parameter testing, and eye diagrams with mask testing for today’s most common industry standards, DPOJET is specifically designed to meet the advanced measurement needs of today's high-speed digital designers in the computer and communications industries.

DPOJET provides the ability to make measurements of single ended and differential signals, measurements between two separate inputs, and measurements on multiple inputs simultaneously; with each input and each measurement independently configurable for maximum flexibility.

DPOJET supports displaying measurement results and plots on the internal display, on an external monitor, or both locations, thus making full use of the oscilloscope dual display ports.

DPOJET analysis plots, like Spectrum and Trend, go beyond simple measurements and results display. Trend analysis quickly shows engineers how timing parameters change over time, like frequency drift, PLL startup transients, or a circuit’s response to power supply changes. Spectrum analysis quickly shows the precise frequency and amplitude of jitter and modulation sources for easy, rapid identification. Finding sources like adjacent oscillators and clocks, power supply noise, or signal cross-talk is no longer a tedious chore. Unique in the industry, DPOJET also provides Phase Noise plots to show jitter in root/Hertz and Transfer Function plots that allow direct comparison of jitter spectrums between two signals of differing frequencies, providing the perfect tool for determining jitter in PLL circuits like clock multipliers.

DPOJET provides complete jitter and eye diagram analysis tools. With premiere measurement flexibility, oscilloscope model support, limit testing, results logging and reporting, and integrated remote programmability, DPOJET fully supports applications from device and system debug and characterization to short run functional test and production.

*¹ Patented USPTO #6,836,738

*² Patented USPTO #6,832,172, #6,853,933, #7,254,168

*³ Patented USPTO #6,812,688