Features | Benefits |
| Bandwidth of 33 GHz | Accurate characterization, jitter characterization and compliance testing of designs like 32 Gbaud Coherent Optical and PCIe 3.0 with data rates up to 20Gb/sec. |
| Industry leading sample rate of 100 GS/sec | Enables thorough analysis, channel to channel, and multi-lane measurements. Capture more details (i.e., fast edges) and achieve 10 Terasamples/s using equivalent time sampling on 4 channels. |
| Industry leading signal fidelity, minimum noise and highest effective number of bits (ENOB) | Perform your tests with more available margin and trust that you are seeing your real signal to make more precise measurements. |
| Industry's highest waveform capture rate on all 4 channels | Efficient discovery & capture of intermittent (rare) faults or events. |
| 16 logic channels with 80 psec timing resolution (MSO70000 Series only) | Precisely understand logic circuit performance with correlated analog/digital signal views. |
| Analog/digital probing with a variety of connectivity support options | Flexible probing solutions for small component leads or board vias that remove the need for special fixturing/costs. Industry's only 20 GHz TriMode™ probe and 2.5 GHz differential logic probe. |
| Pinpoint® triggering and high-speed serial pattern triggering up to 6.25 Gb/s | Speed up debug of buses like PCIe, SATA, USB and others through standards-specific trigger functions. |
| Comprehensive digital serial analysis solution - probing, triggering, decode and analysis | Faster design and compliance testing with a toolset engineered to automate setup, acquisition and analysis of high-speed serial data signals like USB, PCIe and DisplayPort. |
| Advanced Serial Analysis options for PCIe, I2C, SPI, RS-232/422/485/UART, USB2.0, MIPI D-PHY CSI & DSI, 8b/10b, CAN, LIN, FlexRay and MIL-STD1553B. | Enables automated capture and viewing of where control and data packets begin and end as well as identifying subpacket components such as address, data, CRC, etc. for common serial bus traffic. |