Computing Videos

As a leading participant in serial standards bodies, Tektronix solutions enable you to test with confidence against the latest and most challenging serial data requirements.

Learn about the latest technologies and their test requirements with these videos.

Anatomy of Jitter
This webinar describe the different categories and types of jitter; the origins and interrelationships and how they can be used to diagnois, characterize and debug system hardware. Plus, explain how these various jitter measurements are applicable to your specific application.
Fundamentals of Digital Debug Webinar
Learn critical techniques for debugging today's common serial buses, including properly triggering an oscilloscope and isolating infrequent events, and tips for decoding and searching on buses such as USB, Ethernet, I2C, SPI and more.
Receiver Testing to Third Generation Standards Webinar
With the advent of 3rd Generation Serial Standards at rates above 5 GT/sec, it is critically important to characterize receiver performance for a successful serial communication system design. This seminar, using PCI Express 3.0 and USB3 as example standards, will highlight the latest trends and illustrate important practical learnings for successful test execution.
The Impact of Clock Recovery on Your Serial Data Measurements
This video discusses the basics of clock recovery impact on your measurements. Why it is needed, the effect on jitter, as well as calibration considerations.
Dual-Dirac Jitter Model
This video is a refresher of the Dual-Dirac Jitter Model, which is one of the tools available for predicting your system's performance and troubleshooting/improving the system or components of the system.
Avoiding Pitfalls in Jitter Measurements
This webinar discusses common pitfalls when making jitter measurements and how you can avoid them when making your measurements.
USB3 Receiver Test Automation
This step-by-step guide to USB3 receiver testing, uses the Tektronix DPO70000 Series oscilloscope and BERTScope hardware and automation software.
Tektronix DPOJET Real-time Jitter and Timing Analysis
DPOJET is the premiere eye-diagram, jitter, and timing analysis package available for real-time oscilloscopes.
Automated USB 2.0 Analysis Physical Layer Compliance Testing - TDSUSB2
Watch this video to see the Tektronix TDSUSB2 Compliance Test automated tool. This is a critical tool for saving time, ensuring accuracy and replication for testing measurements in high speed serial designs.
Automated Ethernet Analysis Video - TDSET3
Watch this video to see how easy it is to do Ethernet compliance testing with the Tektronix TDSET3 Test Package. It makes compliance testing for 10BASE-T, 100BASE-TX and 1000BASE-T Ethernet devices simple.
Jitter and Eye Analysis Tools Video - DPOJET
Watch this video to see how the Tektronix DPOJET jitter and eye analysis tools transform complex jitter analysis into simple and easy measurement tasks.
PCI Express Gen 3 Measurements with the MSO70000 Series
This video shows how to make PCI Express Gen 3 measurements using the MSO70000 Series oscilloscope with the PCE3 and SDLA software.
Make Better Write DQ Eye Measurements
This DDR how-to video shows how to make better Write DQ eye measurements with the MSO70000 Series oscilloscope.
Optametra and Tektronix MSO70000 Series
See Optametra and Tektronix MSO70000 Series signal processing of single mode fiber communications.
How to Choose the Right Platform for Jitter Measurements
Learn what to consider when selecting a platform for jitter measurements.
Verifying Memory System Performance using MSO70000
This video explains how to verify memory system performance using an MSO70000 Series oscillosope.
PHY and Protocol Testing Guidance for the Latest MIPI Standards
Attend this 40 minute webinar followed by an interactive chat session with Tektronix' Chris Loberg, to review the most recent advancements in the MIPI family of interface standards. Returning from the recent MIPI Alliance meeting in June, Chris will also provide you with testing guidance on how to approach debug, verify and characterization steps using Tektronix test equipment for your MIPI-enable device designs.
Beyond Receiver Interoperability Testing Webinar
This 45 minute, live webinar will focus on the latest tools and techniques for properly performing jitter tolerance and stressed receiver sensitivity testing - including characterization and margin testing of next generation receivers. .
Tips for Fast, Efficient Debug of Serial Buses Webinar
Many embedded systems today utilize serial buses like I2C, SPI and USB for chip to chip communications and peripheral control. In this webinar, you'll learn how to debug these systems quickly with automated decode, trigger and search on common serial bus topologies. This approach will save hours of debugging time by automating the serial decoding process. Learn how to capture common serial bus traffic on an oscilloscope and view in a decoded format, helpful steps showing how to quickly debug signaling and electrical issues found in these serial buses, and more. The speaker Chris Loberg is a Senior Marketing Manager at Tektronix
TLA Series Video: Glitch
Tektronix logic analyzers are equipped with a unique glitch display to help you quickly identify the occurrence of a glitch regardless of the number of signals that are being analyzed.