Keithley Parametric Test Systems

Today's analog and power semiconductor technologies, including wide bandgap devices such as GaN and SiC, require parametric testing that maximizes measurement performance, enables faster time-to-market, supports a wide product mix, and minimizes the cost of test.

Keithley meets these and other important challenges in critical applications across the workflow with both High Speed Production Solutions and Fully Customizable Test Solutions.

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High Speed Production Test Solutions

Applications include Semiconductor Process Control Monitoring (PCM), TEG Test, and Die Sort

Parallel Test capability maximizes test throughput
Measure from kV to fA in a single probe touchdown to further boost productivity
ISO-17025 System-level calibration
Smooth migration from legacy test systems, including probe card re-use
Low Cost-of-Ownership (COO)

Fully Customizable Test Solutions

Applications include R&D, Reliability, Off-line Analysis, and Functional Test of Semiconductors, Components / Subassemblies, and Displays

Fully custom, system solutions including safety / EMO, power distribution, and software
Scalable, instrumentation-based hardware architecture and flexible, user-defined software solutions
High density SMU-per-pin or matrix configurations available
Measure from kV to fA, including high-speed pulsing, capacitance, and more using Keithley’s most popular products, as well as other brands
Built-in analysis tools such as WLR available