New semiconductor materials, such as SiC and GaN, often introduce unique challenges during development.
High speed digital interfaces necessitate faster PHY validation cycles. Speedier debugging, protocol decoding and identifying jitter & noise from sources such as crosstalk are critical requirements for designers.
So many electrical validation tests, so little time!
Our 16-page guide to the latest tools and techniques, including parametric analyzers, for characterization of semiconductors is packed with application notes, webinars, video demonstrations, and more!
This 24-page primer offers straightforward, practical techniques for making timing jitter measurements without the need for complex statistical calculations.