Comparison of Vector Network Analyzer and IConnect® Generated S-Parameters

This technical note presents single-ended insertion loss ( SE IL) and return loss ( SE RL) data generated from two different methods: 1) vector network analyzer (VNA), and 2) TDA Systems IConnect®. The purpose of this note is to validate the use of the IConnect® software in generating these parameters as an alternative to the more widely accepted VNA generated data.

  2011-08-09 19:30:00

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