Comparison of Vector Network Analyzer and IConnect® Generated S-Parameters

This technical note presents single-ended insertion loss ( SE IL) and return loss ( SE RL) data generated from two different methods: 1) vector network analyzer (VNA), and 2) TDA Systems IConnect®. The purpose of this note is to validate the use of the IConnect® software in generating these parameters as an alternative to the more widely accepted VNA generated data.

Was this helpful?
59 customers have rated this Document

  2011-08-09 19:30:00

Select Service

X

STAY INFORMED: Events & Seminars | Email Newsletter | Follow Tektronix on Twitter Follow Tektronix on Facebook Follow Tektronix on Google+ Follow Tektronix on Youtube

MEMBERSHIP: Create an account for exclusive membership privileges. Login