Features & Benefits
- Comprehensive Set of Signal
Integrity Tools that Allow You to Quickly Isolate, Identify, and Debug
Complex Signal Integrity Issues
- Glitch Trigger and Storage
– Allows you to trigger on and highlight potential signal integrity
problems. Not only can the TLA6000 Series trigger on the problem,
but by highlighting suspected problems in red, you will be able to
easily determine which signals you need to investigate further
- iCapture – Route the suspected signal to the analog output of
the TLA6000 using the exclusive Tektronix iCapture feature. This eliminates
the need to double-probe with an oscilloscope probe, reducing time
to debug
- iView – Time-correlated view of both logic analyzer
and oscilloscope data to trace the SI problem across the digital and
analog domain
- Performance and Ease of Use to Debug,
Validate, and Optimize Digital Systems
- 125 ps Resolution
MagniVu™ Acquisition to Accurately See Signal Relationships in Your
System
- State Speed – Sample your fastest synchronous buses
with clock rates up to 800 MHz and data rates up to 1.25 Gb/s
- 15 in. Display, with Optional Touch Screen to See More of Your
Data and Navigate Efficiently through Your Data
- 3 Models
with 68/102/136 Channels and Up to 128 Mb Record Length offer Flexible
Solutions to Fit Any Budget
- Drag-and-Drop Triggering – Simply
drag any one of eight different trigger types from a table onto the
waveform and the TLA will automatically set up the trigger conditions.
Eliminates errors, improves repeatability, and saves time
- Drag-and-Drop Measurements – Simply drag an icon from the measurement
toolbar and drop it on your signal of interest and get a table of
results. Saves time, removes complexity, and reduces measurement uncertainty
- Analysis Tools for Debugging and Validating Today’s Digital
Systems
- FPGA
- DDR2
- A Broad Selection
of Microprocessor and Bus Support
- MIPI CSI and DSI Debug
Applications
- Digital Hardware Validation
and Debug
- Monitoring, Measurement, and Optimization of Digital
Hardware Performance
- Embedded Software Integration, Debug,
and Verification
Efficiently
Debug and Validate Your Digital System at a Price You Will Like!
The affordable TLA6000 Series of logic analyzers offer the performance
needed to debug, validate, and optimize the functionality of your
digital system. The TLA6000 Series also provides a comprehensive set
of signal integrity debug tools that allow you quickly isolate, identify,
and characterize elusive and hard-to-find problems. Add a broad range
of support for today’s applications, and you have the ideal tool to
help you meet all of the debug challenges of today’s digital designs.
The TLA6000 Series allows you to effectively validate and debug
the functionality of your digital designs:
- Use the patented
8 GHz MagniVu technology to accurately measure timing relationships.
The single, integrated acquisition architecture of the TLA6000 Series
eliminates the timing skew problems inherent in other logic analyzer
architectures
- Capture on buses with clock rates up to 800 MHz
and data rates up to 1.25 Gb/s
- Buy the capability you need
now and upgrade as your measurement needs grow
- Quickly isolate
events through a simple and intuitive drag-and-drop trigger setup
- Easily summarize your design’s performance with sophisticated
drag-and-drop measurements such as frequency, period, pulse width,
duty cycle, and edge count
- View data in a variety of time-correlated
formats including waveform, listing, graph, disassembly, source code,
or compare
Find Tough Signal Integrity Problems
Today’s logic analyzers not only need to help troubleshoot functional
issues in your design, but also need to help find signal integrity
problems caused by crosstalk, termination mismatches, ground bounce,
and other issues. To help debug these problems, the TLA6000 Series
includes a comprehensive suite of signal debug tools.
These
tools allow you to:
- Use glitch trigger to monitor selected
signals in your design and trigger when a signal integrity problem
is found on any one of these signals
- Automatically tag any
found signal integrity problems, allowing you to quickly identify
the signals of interest
- Gain more insight into the problem
using the exclusive iCapture functionality to view both digital and
analog data through a single probe
- Use iView to see time-correlated
digital and analog displays of your data, letting you track the signal
integrity problem across both analog and digital domains
DDR2 Protocol Debug and Validation
DDR2 memory systems
are used in many of today’s embedded designs – commonly implemented
as a bus on the microprocessor or as a block in an FPGA. The complexity
of the DDR2 protocol and the number of command/data/address signals
make it difficult to both visualize the operation of the bus and to
isolate any potential problems. In addition, designers need to ensure
that signal timing and interfaces comply with JEDEC standards. The
TLA6000 DDR2x8 and DDR2x16 options provide a complete, easy-to-use
DDR2 test solution for embedded DDR2 designs up to DDR2-800 using
x4, x8, and x16 data-width DDR2 devices.
These options consist
of set of tools designed to provide visibility to all address, data,
and control signals. The bundle includes:
Memory Chip
Interposer.
Protocol Decode Software.
DDR Analysis.
- Memory
chip interposers that provide a convenient way of probing embedded
DDR memory systems and eliminates the need to design in probe access
points. These memory chip interposers work with the unique iCapture™
Analog Mux feature of the TLA6000 to provide a single probing solution
for both the logic analyzer and oscilloscope, saving time and minimizing
setup complexity
- Protocol decode software that shows all
of the DDR2 transactions as well as providing triggering on DDR2 events
- Sample-point analysis software that automates the process of
correctly configuring the TLA6000 Series to accurately sample the
DDR2 signals
- Protocol violation software that finds and reports
violations of the JEDEC-defined DDR2 protocol
TLA6000
Selection Guide
|
Characteristic
|
TLA6202
|
TLA6203
|
TLA6204
|
|
Channels
|
68
|
102
|
136
|
|
High-speed Timing
|
8 GHz (125 ps) with 16 Kb record length
|
|
Maximum Timing Sample Rate (Quarter/Half/Full channel)
|
2 GHz / 1 GHz / 500 MHz
|
|
Maximum State Clock Rate (Quarter/Half/Full channel)
|
450 MHz / 450 MHz / 235 MHz (standard)
625 MHz / 800 MHz / 450 MHz (with Option 45)
|
|
Maximum State Data Rate (Quarter/Half/Full channel)
|
900 Mb/s / 470 Mb/s / 235 Mb/s (standard)
1.25 Gb/s / 900 Mb/s / 450 Mb/s (with Option 45)
|
|
Maximum Record Length
|
2 Mb (standard)
8 Mb with Option 1S
32 Mb with Option 2S
128 Mb with Option 3S
|
|
Analog Mux
|
4 fixed channels (standard)
Any signal
(user selectable) may be routed to 4 output BNCs with Option AM
|
|
Probing Options
|
P6810 General-purpose probe with Option 1P – supports
single-ended and differential signals
Mictor connections with
Option 2P
P6960 D-Max probe with Option 3P
|