Features & Benefits
- Conduct Limit Test Pass/Fail
Testing against a “Golden” Waveform with Tolerances
- Perform
Mask Testing on ITU-T, ANSI T1.102, and USB Standards
- Perform
Mask Testing on Custom User-defined Masks
- Detailed Test Statistics
provide Insight into True Signal Behavior
- Customizable Tests
allow for Multiple Actions upon Violations or Test Failures
- High Waveform Capture Rates enable Thousands of Waveforms to be Tested
per Second
Automated
Pass/Fail Testing
Validating signal quality is an important
part of any embedded system design. One way to determine how well
your signals conform to expected signal quality is to use mask testing.
A mask defines a portion, or portions, of the oscilloscope display
that a signal must not enter. Whether you need to test to a well-defined
telecommunication or computer standard or are interested in validating
how your signals are performing compared to a known good condition,
the DPO4LMT Limit and Mask Test Application Module for the MDO4000,
MSO/DPO4000B, and MSO/DPO4000 Series provides instant automated statistical
analysis of signal quality. The Limit and Mask Test capability makes
testing against telecommunication and computer industry standards
easy by making mask definition quick and accurate, allowing flexible
testing configurations, and providing detailed statistical test results.
Limit Test
Limit Test finds infrequent
glitches and runt signals using a mask created by adding vertical
and horizontal tolerances around a golden waveform. Quickly test your
signals against a golden waveform and quickly gain insight into anomalous
behavior.
A common method for understanding
your signal quality is to test against a known good or “golden” waveform.
You can apply horizontal and vertical tolerances to the golden waveform
to create a mask that can be used for quick, accurate Pass/Fail testing.
This method is also a great way to perform go/no-go testing on a manufacturing
line by enabling repeatable, fast decisions on the quality of a component
or system. The DPO4LMT Limit and Mask Test Application Module allows
you to save your limit test mask for use later across multiple oscilloscopes
in a lab or on a production line.
Standard Mask Test
USB 2.0 high-speed standard mask showing results from a
mask test. A robust set of telecommunications and computer industry
standard masks make testing to standards quick and accurate.
More than 40 standard telecommunications and computer
industry standard masks are included with the DPO4LMT application
module. Each standard mask is easily loaded from the oscilloscope
internal memory and can be immediately used to conduct Pass/Fail testing.
Adherence to a standard is determined pixel-by-pixel throughout the
display. Masks for ITU-T up to 155 Mb/s data rates, ANSI T1.102 up
to 155 Mb/s data rates, and high-speed USB 2.0 are included.
Flexible Test Configuration
The DPO4LMT Limit and
Mask Test Application Module enables multiple actions upon a test
failure or the completion of a test, tailoring the test to your specific
needs.
The DPO4LMT Limit and Mask Test Application
Module provides flexible test definitions, enabling you to tailor
the test to your needs. You can run a test for a user-defined number
of waveforms (up to 1,000,000) or for a user-defined amount of time
(up to 48 hours), or set either criteria to infinity and run the test
until you manually stop it. The Repeat Test and Pretest Delay capability
enables swapping of test locations before proceeding with a test over
multiple cycles of the test. You can set the number of violations
that can occur before a test status is considered failed. The oscilloscope
can perform a number of actions when a test fails or completes. Actions
the oscilloscope can perform when a test fails include stopping the
acquisition, saving a screen image to file, saving a waveform to file,
printing a screen image, setting a trigger out pulse, and setting
a remote interface service request (SRQ). Actions the oscilloscope
can perform when a test completes include setting a trigger out pulse
and setting a remote interface service request (SRQ).
Detailed
Test Results
Detailed mask test results
show statistical information for the current test and accumulated
over all tests. The results include information on violations, test
duration, total number of hits, and the number of hits in each mask
segment.
The DPO4LMT Limit and Mask Test Application
Module provides statistical results from each test conducted. The
results include Pass/Fail status of the test, number of waveforms
tested, number of violations found, number of total tests run, number
of tests that failed, total elapsed time, and the total number of
hits within the mask. A detailed results table adds the number of
hits for each mask segment enabling you to tell exactly where your
signal may be operating out of intended parameters.