DCSIMG

Receiver Test for Serial Data Applications

As a designer specializing in receiver test, you seek easy signal generation of very complex serial data signals. Tektronix offers a solution that delivers the ultimate in signal and impairment generation.

Simple. Single instrument solution for signal and impairment generation up to 8Gb/s.
Flexible. Ability to generate very complex signals including an unlimited combination of jitter profiles, ISI, SSC, Out-of-band signals, embedded channel/fixture effects and more.
Repeatable. File-based solution enabling sharing and repeatable receiver tests under the same conditions.

Webinars

Application Notes

沪ICP备05012376号