Time Domain Reflectometry (TDR) and
S-Parameter Measurements
With increasing speeds and lower voltages, the margin for Serial Data signal performance is becoming smaller. To ensure that margins are well understood; it's critical to know the extent of margin loss associated with your system interconnect. To gain more insight into the performance of your interconnect designs, Time Domain Reflectometry (TDR) and S-Parameter measurements are necessary. Tektronix simple integrated toolset combines the ultra fast acquisition of the Tektronix DSA8200 Sampling Oscilloscope to capture critical TDR edges with automated setup & calibration routines allowing you to efficiently perform measurements for cables, connectors, and backplanes.
Webinars
Overcoming Challenges of Serial Data S-Parameter Measurements and Compliance
Learn how to quickly and accurately perform required S-Parameter measurements in a cost-effective manner.- View All
Application Notes
Modeling of Gigabit Backplanes from Measurements
This application note presents the complete methodology for gigabit backplane modeling.High Speed Interconnects: Characterization and Measurement-based Modeling
A primer that takes on the measurement issues of high speed interconnects.TDR and S-Parameters Measurements - How Much Performance Do You Need?
How TDR-based measurement tools can provide you a quicker way to making S-Parameter measurements over the traditional VNA.TDR Impedance Measurements: A Foundation for Signal Integrity
At today's high operating frequencies, anything that affects your signal's rise time, pulse width, timing, jitter or noise content can impact reliability at the system level.Time Domain Methods for Measuring Crosstalk for PCB Quality Verification
This application note discusses the elements of crosstalk and how you can measure it on a single-layer PCB using a sampling scope.- View All
