Time Domain Reflectometry (TDR) and
S-Parameter Measurements
With increasing speeds and lower voltages, the margin for Serial Data signal performance is becoming smaller. To ensure that margins are well understood; it's critical to know the extent of margin loss associated with your system interconnect. To gain more insight into the performance of your interconnect designs, Time Domain Reflectometry (TDR) and S-Parameter measurements are necessary. Tektronix simple integrated toolset combines the ultra fast acquisition of the Tektronix DSA8200 Sampling Oscilloscope to capture critical TDR edges with automated setup & calibration routines allowing you to efficiently perform measurements for cables, connectors, and backplanes.
Videos
- Overcoming Challenges in S-Parameter Measurements
In this webinar we will describe and demonstrate the latest tools available to perform serial data S-parameter measurements for more efficient signal integrity analysis. This versatile approach provides repeatable, accurate, cost-effective results.
View All Embedded Systems Videos
These videos will help you understand the tools and methodologies for solving embedded systems design challenges.
Application Notes
- Modeling of Gigabit Backplanes from Measurements
This application note presents the complete methodology for gigabit backplane modeling. - TDR and S-parameters Measurements -- How Much Performance Do You Need?
How TDR-based measurement tools can provide you a quicker way to making s-parameter measurements over the traditional VNA. - High-speed Interconnects: Characterization and Measurement-based Modeling
A primer that takes on the measurement issues of high-speed interconnects. - TDR Impedance Measurements: A Foundation for Signal Integrity
At today’s high operating frequencies, anything that affects your signal’s rise time, pulse width, timing, jitter or noise content can impact reliability at the system level. - Finding and Examining Pattern-dependent Failures with FrameScan™ Acquisition Technology
This application note explains how the FrameScan technology locates and examines pattern-dependent failures at 10 Gbps and beyond.
