Radio/Satellite Communications
Measurement confidence for next-generation secure communications.
Whether you are moving into digital radio implementation or deploying mission-critical satellite systems, our innovative test solutions deliver the measurement confidence you need in your designs. Our signal generation and analysis tools provide the unique insight necessary for the development and debugging of modern communication systems.
Videos
- Challenges and Solutions for Testing Frequency Hopping Radios Webinar
This webinar provides an overview for the design and test topics of radios with frequency hopping techniques which have been gaining popularity in today’s crowded RF spectrum world. This includes typical test challenges for frequency hopping radio designs and how Tektronix solutions improve insight into your designs and speed time-to-market. - Introducing RTSA with DPX Technology Demo
This tutorial describes the DPX™ Spectrum display and how it addresses situations involving brief, intermittent, complex and coincident signals. Also covered are the methods for achieving its key performance specifications: 1 Detection and measurements on a signal as short as 24 ms and 2 48,828 spectral transforms per second, compressed into a display that is even easier to read than a conventional spectrum trace.
View All RF Videos
These videos range from fundamentals to the latest in advanced signal generation and analysis capabilities required to overcome the most challenging microwave and RF design challenges with confidence.
Application Notes
- Choose the Right Platform for Your Jitter Measurements
This document will explain some essential jitter terms, and then go on to discuss jitter measurements and the tools best suited for evaluating and quantifying jitter, when working with serial data communication architectures. - Testing Modern Radios
Radio Communications: Challenges and solutions for designing Software Defined Radios that employ frequency hopping techniques - Analyzing Jitter Using a Spectrum Approach
Use real time jitter analysis tools with Rj/Dj separation to predict system bit error ratio. - Characterization of IQ Modulators Counts On Flexible Signal Generator Stimulus
This application note describes several of the important measurements design engineers routinely make on an IQ modulator. It illustrates how modern arbitrary/function generators provide a stimulus to characterize high performance IQ modulators thoroughly, with more flexibility and saving considerable time over previously used methods. - Jitter Generation Techniques for Serializer-Deserializer Compliance Testing
New serial data standards and platforms are emerging continuously, and with them the requirement for effective compliance and characterization measurement tools. Of particular interest to digital designers are solutions for measuring jitter in Serializer-Deserializer (SerDes) and Clock and Data Recovery (CDR) circuits.
